ZEISS GeminiSEM Family
Product

ZEISS GeminiSEM

FE-SEM For Highest Demands in Sub-nanometer Imaging, Analytics and Sample Flexibility

ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. Innovations in electron optics and a new chamber design let you benefit from better image quality, usability and flexibility. Take sub-nanometer images below 1 kV without an immersion lens. Discover three unique designs of the ZEISS Gemini electron optics.

  • Ideal for core facilities - ZEISS GeminiSEM 360
  • Enabling efficient analysis - ZEISS GeminiSEM 460
  • New standard for surface imaging – ZEISS GeminiSEM 560
  • GeminiSEM 360

    GeminiSEM 360

    GeminiSEM 360 is the ideal instrument for your core facility, delivering maximum versatility for materials & life science, and industry. With its Gemini 1 electron optical column it delivers high resolution imaging and analytics over the widest range of applications and sample types.

    • Your tool for sample flexibility
    • Unrivalled user experience
    • Exceptional capability extension
  • GeminiSEM 460 ​

    GeminiSEM 460 ​

    GeminiSEM 460 is made for your most exacting analytical tasks and enables efficient analysis and unattended workflows. Its Gemini 2 column serves the most challenging tasks in analytical microscopy. Switch seamlessly between imaging and analytical conditions.

    • Utilize high resolution and high current
    • Customized, automated workflows
    • Your pathway to even more possibilities
  • GeminiSEM 560

    GeminiSEM 560

    GeminiSEM 560 raises the bar for surface-sensitive, distortion-free, high resolution imaging and lets you image below 1 kV easily.​ Introducing Gemini 3, and its new electron optical engine Smart Autopilot it delivers the highest resolution in the family at all working conditions.​

    • The new standard in surface imaging
    • Expert knowledge integrated
    • Experience unique contrast
Ferrocerium particle, Inlens EsB image.

GeminiSEM 360

Benefit from surface sensitive imaging and gather information at low voltage or at high probe current. Discover the advantages of Inlens detection, NanoVP, contextual image viewing or AI-powered segmentation.​

Caption: Ferrocerium particle, Inlens EsB image.

ZEISS GeminiSEM 360
Your Tool for Sample Flexibility
Your Tool for Sample Flexibility

Leverage comprehensive sample characterization with two unique Inlens detectors configured in parallel.

Your Tool for Sample Flexibility

✔ GeminiSEM 360 is the ideal instrument for a core facility, delivering maximum versatility for materials & life science, and industry.

✔ The eponymous electron optical design Gemini 1 brings you the benefit of surface sensitive, high resolution images providing excellent resolution at low voltage and great speed at high probe current.

✔ Gather high resolution, surface- and compositional information, even on sensitive samples by using Inlens secondary and backscatter electron imaging simultaneously.

✔ When aiming to image non-conducting samples under lower vacuum, so-called variable pressure, there is no need to forgo Inlens contrast: NanoVP guarantees maximum versatility enabling Inlens imaging without charging.

Unrivalled User Experience
Unrivalled User Experience

Configure your instrument tailored to your needs thanks to the versatile chamber.

Unrivalled User Experience

✔ GeminiSEM 360 delivers exceptional user experience: With its wide field of view and new, highly configurable chamber, it’s easy to interrogate even very large samples.

✔ Enjoy seamless navigation with contextual image viewing and correlative microscopy via ZEISS ZEN Connect.

✔ Gain clear, crisp images easily by using autofunctions e.g. the autofocus and smart detectors.

✔ Perform both imaging and analytical workflows efficiently with diametrically opposite EDS ports and a coplanar EDS/EBSD geometry.

✔ Maximize system uptime with ZEISS Predictive Service and benefit from scheduled maintenance to take place when you are ready.

Particles of cathode material of a lithium ion battery, overlay of SEM and Raman
Particles of cathode material of a lithium ion battery, overlay of SEM and Raman

Perform multimodal experiments with ZEN Connect and understand your specimens completely. (Particles of cathode material of a lithium ion battery, overlay of SEM and Raman.)

Exceptional Capability Extension

✔ Upgradability is essential for protecting your investment. That‘s why GeminiSEM 360 is plugged into the software ecosystem of ZEISS ZEN core.

✔ Draw on ZEN Connect to combine multimodal and multiscale data, ZEN Intellesis for advanced AI- powered segmentation, and ZEN’s analytical modules for reporting and analysis of segmented data. ZEN data storage lets you manage projects centrally by connecting data from different instruments in your lab.

✔ Access workflows and scripts created by other users who can help you solve challenges by being a member of the APEER community.

✔ Improve your system as new capabilities are released thanks to a clear upgrade ability path.

Steel, EBSD map

GeminiSEM 460

Switch seamlessly from low current-low kV work to high current-high kV work. Extend your possibilities with an in situ heating and tensile lab. Take advantage of a coplanar EDS/EBSD configuration, shadow-free mappings of EDS data and rapidly collecting EBSD maps with 4000 patterns/s.

Caption: Steel, EBSD map

ZEISS GeminiSEM 460
EBSD map of a metal sample
EBSD map of a metal sample

Conduct rapid analysis and achieve high current and high resolution simultaneously. (EBSD map of a metal sample.)

Utilize High Resolution and High Current

✔ GeminiSEM 460 is made for your most exacting analytical tasks and enables efficient analysis and unattended workflows.

✔ Perform high-resolution imaging and analytics rapidly: switch seamlessly from low current-low kV work to high current-high kV work, and back again utilizing the Gemini 2 column.

✔ Characterize any specimen comprehensively by using multiple detectors in parallel.

✔ For efficient analysis exploit the versatile chamber and choose appropriate analytical detectors.

✔ Use the new VP mode and turn up the current to obtain EBSD maps with indexing rates of 4000 patterns/s.

✔ Investigate chemical composition and crystal orientation with two diametrically opposite EDS ports and a coplanar EDS/EBSD configuration. Count on high speed, shadow-free mapping.

Customized, Automated Workflows
Customized, Automated Workflows

Configure your instrument tailored to your needs thanks to the versatile chamber.

Customized, Automated Workflows

✔ With such powerful analytics at hand workflow automation becomes key. Create and configure automated experiments of your own with the Python scripting API from ZEISS.

✔ Modify experiments and customize the outcome to your own requirements.

✔ Make the most of STEM tomography: combine automated tilting and rotation with feature tracking. Produce 3D tomograms with nanometer-scale resolution after all aligned images are then sent to a proprietary 3D reconstruction software.

✔ When you need to test materials to their engineering limits, ZEISS puts an automated in situ heating and tension experimental lab at your disposal: it lets you observe materials under heat and tension automatically while plotting stress-strain curves on the fly.

Your Pathway to Even More Possibilities
Your Pathway to Even More Possibilities

Turn your GeminiSEM 460 into an in situ lab.

Your Pathway to Even More Possibilities

✔ Expand your analytical capabilities across materials and life sciences with exceptionally high, tunable current density, even at low kV - based on the Gemini 2 design.

✔ Take advantage of being able to adapt the system with a wide variety of accessories. The versatile chamber can be configured not only with analytical equipment but also with devices for in situ experiments, cryo-imaging and nanoprobing. storage lets you manage projects centrally by connecting data from different instruments in your lab.

✔ This lets you benefit from the ability to accommodate many configurations and upgrades at any point during the lifetime of your instrument.

✔ All GeminiSEMs are plugged into the ZEISS ZEN core ecosystem giving you access to ZEN Connect, ZEN Intellesis and ZEN’s analytical modules providing reporting and GxP workflows.

Magnetic FeMn nanoparticles, edge length of a cube ca. 25 nm. GeminiSEM 560, 1 kV, Inlens SE, field of view 565 nm.​

GeminiSEM 560

Explore the new standard for surface imaging: magnetic field-free imaging with sub 1 nm resolution below 1kV without sample biasing or monochromation, Gemini 3 with its new electron optical engine Smart Autopilot, finding the sweet spot in your working conditions – and much more.

Caption: Magnetic FeMn nanoparticles, edge length of a cube ca. 25 nm. GeminiSEM 560, 1 kV, Inlens SE, field of view 565 nm.​

ZEISS GeminiSEM 560
Details on the surface of a non-conducting mineral particle at​ low kV: GeminiSEM 560 at 800 V, Inlens SE.​
Details on the surface of a non-conducting mineral particle at​ low kV: GeminiSEM 560 at 800 V, Inlens SE.​

Details on the surface of a non-conducting mineral particle at​ low kV: GeminiSEM 560 at 800 V, Inlens SE.​

Your Tool for Sample Flexibility

✔ GeminiSEM 360 is the ideal instrument for a core facility, delivering maximum versatility for materials & life science, and industry.

✔ The eponymous electron optical design Gemini 1 brings you the benefit of surface sensitive, high resolution images providing excellent resolution at low voltage and great speed at high probe current.

✔ Gather high resolution, surface- and compositional information, even on sensitive samples by using Inlens secondary and backscatter electron imaging simultaneously.

✔ When aiming to image non-conducting samples under lower vacuum, so-called variable pressure, there is no need to forgo Inlens contrast: NanoVP guarantees maximum versatility enabling Inlens imaging without charging.

3D STEM tomography on a CeO2 nanoparticle. GeminiSEM 560, aSTEM, bright field, 30 kV.
3D STEM tomography on a CeO2 nanoparticle. GeminiSEM 560, aSTEM, bright field, 30 kV.

3D STEM tomography on a CeO2 nanoparticle. GeminiSEM 560, aSTEM, bright field, 30 kV.

Unrivalled User Experience

✔ GeminiSEM 360 delivers exceptional user experience: With its wide field of view and new, highly configurable chamber, it’s easy to interrogate even very large samples.

✔ Enjoy seamless navigation with contextual image viewing and correlative microscopy via ZEISS ZEN Connect.

✔ Gain clear, crisp images easily by using autofunctions e.g. the autofocus and smart detectors.

✔ Perform both imaging and analytical workflows efficiently with diametrically opposite EDS ports and a coplanar EDS/EBSD geometry.

✔ Maximize system uptime with ZEISS Predictive Service and benefit from scheduled maintenance to take place when you are ready.

A sweet spot: Magnetic contrast on a NdFeB magnet
A sweet spot: Magnetic contrast on a NdFeB magnet

A sweet spot: Magnetic contrast on a NdFeB magnet

Exceptional Capability Extension

✔ Upgradability is essential for protecting your investment. That‘s why GeminiSEM 360 is plugged into the software ecosystem of ZEISS ZEN core.

✔ Draw on ZEN Connect to combine multimodal and multiscale data, ZEN Intellesis for advanced AI- powered segmentation, and ZEN’s analytical modules for reporting and analysis of segmented data. ZEN data storage lets you manage projects centrally by connecting data from different instruments in your lab.

✔ Access workflows and scripts created by other users who can help you solve challenges by being a member of the APEER community.

✔ Improve your system as new capabilities are released thanks to a clear upgrade ability path.

Interview​ with Dr. Mario Hentschel

Dr. Mario Hentschel​

Dr. Mario Hentschel​

Optical Sensors Research at the University Stuttgart, 4th Physics Institute and Center for Applied Quantum Technology, Germany.

Dr. Mario Hentschel​
Testimonial

Dr. Mario Hentschel

Head of Cleanroom and Nanostructuring Facilities, first user of GeminiSEM 560.

"We are dealing with micro- and nanostructures for optical sensing. Consequently, it is important to characterize devices on a nanometer scale. These applications require a large flexibility of the electron microscope. ZEISS GeminiSEM 560 is offering us an astonishing degree of freedom and flexibility. We obtain highest quality images even from very challenging samples, such as highly insulating polymers, showing minimal effects due to charging. The GeminiSEM 560 will thus definitely be an enabling technology for our research which we feel that this instrument can provide it in a very flexible way.​​"

The Technology Behind Gemini Electron Optics

  • What You Always Wanted to Know About the Fundamentals

    Field emission SEMs are designed for high resolution imaging. Key to the performance of a field emission SEM is its electron optical column. Gemini is tailored for excellent resolution on any sample, especially at low accelerating voltages, for complete and efficient detection, and ease-of-use.

    The Gemini 1 optical column consist of a beam booster, Inlens detectors and a Gemini objective.

    Gemini optics are characterized by three main components:

    ● The Gemini objective lens design combines electrostatic and magnetic fields to maximize optical performance while reducing field influences at the sample to a minimum. This enables excellent imaging, even on challenging samples such as magnetic materials.
    ● Gemini beam booster technology, an integrated beam deceleration, guarantees small probe sizes and high signal-to-noise ratios.
    ● The Gemini Inlens detection concept ensures efficient signal detection by detecting secondary (SE) and backscattered (BSE) electrons in parallel minimizing time-to-image.

    Flint particle, left: Inlens EsB, right Inlens SE image.

    For your applications benefit from:

    ✔ Long-term stability of the SEM alignment and the effortless way it adjusts all system parameters such as probe current and acceleration voltage.
    ✔ Achieve distortion-free, high resolution imaging with the help of the near magnetic-field free optics.
    ✔ Get information solely from the top-most layer of your samples with the Inlens SE detector that produces images out of the truly surface sensitive SE 1 electrons.
    ✔ Obtain true material contrast at very low voltages with the detection concept of the Inlens EsB detector.

  • Capitalize on Fast Analytics

    A comprehensive characterization of any sample calls for performance in imaging and in analytics. Plus, today’s users expect the set up and handling of the instrument to be easy. The Gemini 2 optics answers these demands.

    Gemini technology. Schematic cross-section of Gemini 2 optical column with a double condenser, beam booster, Inlens detectors and Gemini objective.

    Switch seamlessly between high resolution imaging and analytics​

    ● GeminiSEM 460 comes with Gemini 2 optics featuring a double condenser.​
    ● Adjust the beam current continuously while the spot size stays optimized simultaneously.​
    ● Switch seamlessly between high resolution imaging – at low beam currents – and analytical modes – at high beam currents.​
    ● You save time and effort because there’s no need to realign the beam after changing imaging parameters.

    ​​EBSD map of steel.

    Stay flexible and work efficiently​

    ✔ Stay flexible: use the highest beam current density for high resolution imaging and analysis at both low and high beam current, independently of which beam energy you select​.
    ✔ Your specimen won’t be exposed to a magnetic field: achieve distortion-free EBSD patterns and high resolution imaging over a large field of view​.
    ✔ Tilt the specimen without influencing the electron optical performance. Image even magnetic samples easily.​
    ✔ Choose a charge reduction mode that suits your sample best: local charge compensation, variable pressure in the chamber or NanoVP.

  • Imaging below 1 kV - Expert Knowledge Integrated​

    The Gemini 3 optics are optimized for resolutions at low and very low voltages, and for contrast enhancement. They ensure maximum resolution at all working conditions from 1 kV to 30 kV and consists of two components which work synergistically: the Nano-twin lens and Smart Autopilot, a new electron optical engine. Additional technological characteristics are the high gun resolution mode and the optional Tandem decel.

    Resolution Modes – Enabling You to See More Details​

    More details and more detection signal for your SEM images, enabled by two modes. In high resolution gun mode, the reduced energy spread of the primary beam minimizes the effect of chromatic aberration to allow even smaller probe sizes. In Tandem decel mode, a deceleration voltage is applied to the sample. Use this to further improve resolution below 1 kV and boost the detection efficiency of backscattered diode detectors.

    Novel optical design of the Gemini 3 column. Schematic cross-section of GeminiSEM 560. Nano-twin lens (red), Smart Autopilot (blue).

    The Nano-twin lens delivers:

    ● Sub-nanometer resolution at low and ultra-low voltages with excellent signal detection efficiency.​
    ● Three times lower lens aberrations at low kV compared to the standard Gemini objective lens - resulting in a three times lower magnetic field on the sample, of the order of 1 mT​.
    ● Optimized geometry and the electrostatic and magnetic field distributions​.
    ● An enhanced Inlens detector signal under low voltage imaging conditions​.
    ● These characteristics provide the ability for sub-nanometer imaging below 1 kV without immersing the sample in an electro-magnetic field.

    The precision of the fine autofocus after 1 sec. focusing

    How it works:

    ● Smart Autopilot optimizes electron trajectories through the column thus ensuring the highest possible resolution at each acceleration voltage.
    ● The autofunctions enable a seamless alignment free transition across the entire magnification range from 1× to 2,000,000× and a 10× increase in the field of view allowing a 13 cm object to be imaged in a single frame.
    ● The image framestore of 32k × 24k in combination with the new overview mode ensure a stitching free pixel density over an unparalleled field of view

How-to Videos on Gemini Technology

  • Gemini 1

    Offering high sample flexibility

  • Gemini 2

    For fast analytics

  • Gemini 3

    Setting a new standard for surface-sensitive imaging

Structured gold platelets, research on plasmonic effects, GeminiSEM 560, BSD.

Applications in Materials Science

Typical Tasks and Applications

  • Image and analyze any real-world sample effortlessly, over large areas or at sub-nanometer resolution.
  • Explore examples from nanoscience, engineering and energy materials, or bio-inspired materials, polymers & catalysts.
  • See how GeminiSEM helps you to characterize your specimen comprehensively.

Caption: Structured gold platelets, research on plasmonic effects, GeminiSEM 560, BSD. Image: courtesy of University Stuttgart, Germany.

Applications in Materials Science

Nanoscience & Nanomaterials

Edge length of a cube ca. 25 nm. GeminiSEM 560, 1 kV, Inlens SE, field of view 565 nm.
Magnetic FeMn nanoparticles. Edge length of a cube ca. 25 nm. GeminiSEM 560, 1 kV, Inlens SE, field of view 565 nm.
As part of fundamental research on plasmonic effects. GeminiSEM 560. Sci Adv 3, e1700721, 2017.
Structured gold platelets. As part of fundamental research on plasmonic effects. GeminiSEM 560. Sci Adv 3, e1700721, 2017.
Overview mode, extremely large field of view, three Euro coins. GeminiSEM 560.
Overview mode, extremely large field of view, three Euro coins. GeminiSEM 560.
A fractured surface of a demagnetized NdFeB sample, EDS map. The fine distribution of boron (green) is easy to resolve against neodymium (pink). GeminiSEM 460, annular Backscatter Detector at 3 kV without bias.
A fractured surface of a demagnetized NdFeB sample, EDS map. The fine distribution of boron (green) is easy to resolve against neodymium (pink). GeminiSEM 460, annular Backscatter Detector at 3 kV without bias.

Energy Materials

After 500 charge cycles, 1 kV, Inlens SE detector.
NCM622 cathode particles. After 500 charge cycles, 1 kV, Inlens SE detector.
Surface of an uncoated polymer electrolyte fuel cell, microporous layer with carbon nanoparticles agglomerated with binder and platinum nanoparticles with a diameter <10 nm.
Surface of an uncoated polymer electrolyte fuel cell, microporous layer with carbon nanoparticles agglomerated with binder and platinum nanoparticles with a diameter <10 nm.
On an alumina substrate imaged at 1.8 kV using the Inlens SE detector to highlight the surface topography.
CIGS solar cell. On an alumina substrate imaged at 1.8 kV using the Inlens SE detector to highlight the surface topography.

Engineering Materials

A stainless-steel sample imaged under in situ tensile load test. Using the AsB detector, images have extremely high contrast and capture the slip bands formation during in situ loading as shown in the images of before (left) and after loading (right).
A stainless-steel sample imaged under in situ tensile load test. Using the AsB detector, images have extremely high contrast and capture the slip bands formation during in situ loading as shown in the images of before (left) and after loading (right).

Stainless Steel - in situ tensile load test

A stainless-steel sample imaged under in situ tensile load test. Using the AsB detector, images have extremely high contrast and capture the slip bands formation during in situ loading as shown in the images of before (left) and after loading (right).

Imaged with the BSE detector at 1 kV landing energy with no bias (left) and at 1 kV landing energy with 5 kV bias (right), providing enhanced material contrast and sharpness.​
Imaged with the BSE detector at 1 kV landing energy with no bias (left) and at 1 kV landing energy with 5 kV bias (right), providing enhanced material contrast and sharpness.​

Nanocomposite Powder

Imaged with the BSE detector at 1 kV landing energy with no bias (left) and at 1 kV landing energy with 5 kV bias (right), providing enhanced material contrast and sharpness.​

After surface preparation using sand blasting. The crushed SiO2 shows positive charging on the left image. Contrast visible only at large working distance of 5 mm (left) versus a closer working distance of 1 mm (right).
After surface preparation using sand blasting. The crushed SiO2 shows positive charging on the left image. Contrast visible only at large working distance of 5 mm (left) versus a closer working distance of 1 mm (right).

Stainless-Steel Surface

After surface preparation using sand blasting. The crushed SiO2 shows positive charging on the left image. Contrast visible only at large working distance of 5 mm (left) versus a closer working distance of 1 mm (right).

Bio-inspired Materials, Polymers & Catalysts

The gelatin mat is stabilized in a formaldehyde-rich atmosphere resulting in chemical cross-linking of the fibers. Sample: courtesy of Fraunhofer IMWS, DE
The gelatin mat is stabilized in a formaldehyde-rich atmosphere resulting in chemical cross-linking of the fibers. Sample: courtesy of Fraunhofer IMWS, DE
Its surface structure strongly influences the wetting behavior towards superhydrophobic properties. Sample: courtesy of Fraunhofer IGB Stuttgart, DE.
Polyurethan film. Its surface structure strongly influences the wetting behavior towards superhydrophobic properties. Sample: courtesy of Fraunhofer IGB Stuttgart, DE.
Failure analysis of a polymer welding process: a ruptured surface imaged under Variable Pressure giving insight into adhesion of two attached polymers.
Failure analysis of a polymer welding process: a ruptured surface imaged under Variable Pressure giving insight into adhesion of two attached polymers.1
Cross-section of lithium ion battery.

Microscopy Solutions for Industry

Typical Tasks and Applications

  • Failure analysis on mechanical, optical or electronic components
  • Fracture analysis and metallography
  • Surface, microstructure and device characterization
  • Compositional and phase distribution
  • Impurity and inclusion determination

Caption: Cross-section of lithium ion battery.​

Microscopy Solutions for Industry

Steel and Batteries

Fracture surface – brittle failure of a steel sample in tension
Fracture surface – brittle failure of a steel sample in tension

Fracture surface – brittle failure of a steel sample in tension

Fracture surface – brittle failure of a steel sample in tension

Inclusions in steel, Inlens SE detector, 500 V
Inclusions in steel, Inlens SE detector, 500 V

Inclusions in steel, Inlens SE detector, 500 V

Inclusions in steel, Inlens SE detector, 500 V

Lithium ion battery cathode
Lithium ion battery cathode

EDS compositional mapping shows main constituents of the different oxides. Sample: courtesy of Aalen University, Germany.

Lithium ion battery cathode

The aBSD detector at high EHT (here at 30 kV ) shows deeply-buried structures such as FinFET gates, tungsten plugs, and tin liner (inset) with exceptional resolution and contrast.

Applications in Electronics & Semiconductor

Typical Tasks and Applications

  • Construction analysis and benchmarking
  • Passive voltage contrast
  • Subsurface analysis
  • Electronic property measurement with probing
  • TEM site selection

Caption: The aBSD detector at high EHT (here at 30 kV ) shows deeply-buried structures such as FinFET gates, tungsten plugs, and tin liner (inset) with exceptional resolution and contrast.

Applications in Electronics & Semiconductor

Electron Beam Absorbed Current (EBAC)

Probing during imaging can give further insight into function. Here, electron beam absorbed current (EBAC) shows the connectivity of a circuit with a probe tip landed at one node.

Connectivity of a  circuit with a probe tip landed at one node: 2 kV
 EBAC at 2 kV.
 EBAC at 5 kV.
 EBAC at 8 kV.
Backscatter images show deeply-buried structures such as FinFET gates, tungsten plugs, and tin liner (inset) and thus guide failure analysis for the TEM workflow, aBSD detector at 30 kV.
Backscatter images show deeply-buried structures such as FinFET gates, tungsten plugs, and tin liner (inset) and thus guide failure analysis for the TEM workflow, aBSD detector at 30 kV.

FinFET Gates

Backscatter images show deeply-buried structures such as FinFET gates, tungsten plugs, and tin liner (inset) and thus guide failure analysis for the TEM workflow, aBSD detector at 30 kV.

SARS-CoV-2  virus, culture, inactivated, negatively stained, GeminiSEM 560, aSTEM, HAADF/BF. Sample: courtesy of M. Hannah, Public Health England, UK.

Applications in Life Sciences

Typical Tasks and Applications

  • Characterization of topology
  • Imaging sensitive, non-conductive, outgassing, or low contrast samples
  • Visualizing the ultrastructure of cells, tissues etc. at high resolutions
  • Imaging very large areas such as serial sections or block faces

Caption: SARS-CoV-2 virus, culture, inactivated, negatively stained, GeminiSEM 560, aSTEM, HAADF/BF. Sample: courtesy of M. Hannah, Public Health England, UK.

Applications in Life Sciences

SARS-CoV-2  virus

SARS-CoV-2  virus, culture, inactivated, negatively stained, GeminiSEM 560, aSTEM, HAADF/BF. Sample: courtesy of M. Hannah, Public Health England, UK.

Mouse Brain

Applying Tandem decel increases contrast to such an extent that cell organelles are clearly visible at high resolution, mouse brain. Sample: courtesy of C. Genoud, FMI, Basel, CH.

Root Nodules of Fabaceae Beans

Investigate large areas with array tomography, serial section & block face Imaging. Root nodules of Fabaceae beans, imaged with ZEISS Atlas 5, 78 sections.

Accessories

ZnO nanoparticles on carbon film, back-projection reconstruction showing the 3D morphology of the nanoparticles.

3D STEM Tomography

Automated STEM tomography on an FE-SEM is now put at your disposal. A script for automated acquisition of a STEM tilt series uses the API and performs compucentric, rotation and tilt stage movements as well as autofocus and image acquisition. Feature tracking compensates for shifts throughout the entire tilt series and keeps the drift between two images to a minimum of around 50 nm. The STEM sample holder allows to tilt the stage to 60° and to perform a 180° rotation, and the aSTEM detector covers all requirements. From the advanced reconstruction toolkit (ART) development team, 3D reconstruction software then takes this output and renders a 3D model of your sample.

Mouse lung tissue, block-face images, acquired with Focal Charge Compensation.
Mouse lung tissue, block-face images, acquired with Focal Charge Compensation.

Mouse lung tissue, block-face images, acquired with Focal Charge Compensation. Sample courtesy of M. Ellisman, NCMIR, San Diego, CA, US.​

Mouse lung tissue, block-face images, acquired with Focal Charge Compensation. Sample courtesy of M. Ellisman, NCMIR, San Diego, CA, US.​

Block Face 3D Imaging of Biological Samples

Benefit from a super-quick high resolution 3D imaging system with 3View® technology from Gatan, Inc. 3View® is an ultramicrotome inside the SEM chamber that lets you acquire high resolution 3D data from resin-embedded samples.

Link Materials Performance to Microstructure with the {_In Situ} Lab for ZEISS FE-SEMs

Link Materials Performance to Microstructure with the In Situ Lab for ZEISS FE-SEMs

Benefit from an Integrated Solution​

Extend your ZEISS FE-SEM with an in situ solution for heating and tensile experiments. Investigate materials like metals, alloys, polymers, plastics, composites, and ceramics. Combine a mechanical tensile or compression stage, a heating unit and dedicated high-temperature detectors with analytics. Control all system components from a single PC with a unified software environment that enables unattended automated materials testing. ​

Visualization and Analysis Software: ZEISS Recommends Dragonfly Pro

Visualization and Analysis Software

ZEISS Recommends Dragonfly Pro

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.​ Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.

Downloads

    • ZEISS GeminiSEM

      Your Field Emission SEMs for the Highest Demands in Imaging and Analytics from Any Sample

      Pages: 47
      File size: 10 MB
    • ZEISS Sense BSD

      Backscatter Electron Detector for Fast and Gentle Ultrastructural Imaging

      Pages: 6
      File size: 6 MB
    • In Situ Lab for ZEISS FE-SEM (Flyer)

      Pages: 5
      File size: 4 MB
    • ZEISS GeminiSEM 360 - Field Emission SEM (Flyer)

      Informative Imaging and Fast Understanding in Core Facilities.

      Pages: 4
      File size: 2 MB
    • ZEISS GeminiSEM 460 - Field Emission SEM (Flyer)

      Efficient Analysis and Unattended Workflows

      Pages: 4
      File size: 1 MB
    • ZEISS GeminiSEM 560 - Field Emission SEM (Flyer)

      Imaging Below 1 kV. Expert Knowledge Integrated.

      Pages: 4
      File size: 962 KB
    • Evolution of Gemini Electron Optics

      The Next Chapter in Sub-nanometer Imaging Below 1 kV

      Pages: 5
      File size: 2 MB
    • ZEISS GeminiSEM FE-SEM Family

      Perform versatile, high-resolution semiconductor imaging and characterization.

      Pages: 2
      File size: 1 MB
    • Investigating Sweet Spot Imaging of Perovskite Catalysts Bearing Exsolved Active Nanoparticles

      Pages: 6
      File size: 5 MB
    • ZEISS Gemini Optics - Poster

      High Resolution Images On Real World Samples

      Pages: 1
      File size: 2 MB
    • Charge Compensator for GeminiSEM

      Instruction Manual (Russian)

      Pages: 36
      File size: 767 KB
    • Charge Compensator for GeminiSEM

      Instruction Manual (Swedish)

      Pages: 36
      File size: 8 MB
    • Charge Compensator for GeminiSEM

      Instruction Manual (Italian)

      Pages: 36
      File size: 2 MB
    • Charge Compensator for GeminiSEM

      Instruction Manual (English)

      Pages: 36
      File size: 829 KB
    • ZEISS Cryo Trap

      Instruction Manual (English)

      Pages: 20
      File size: 415 KB
    • ZEISS Focal CC

      Instruction Manual (English)

      Pages: 34
      File size: 5 MB
    • ZEISS GeminiSEM

      Instructiehandleiding (Dutch)

      Pages: 172
      File size: 3 MB
    • ZEISS GeminiSEM

      Kullanım Kılavuzu (Turkish)

      Pages: 170
      File size: 3 MB
    • ZEISS GeminiSEM

      Návod k použití (Czech)

      Pages: 170
      File size: 6 MB
    • ZEISS GeminiSEM Series

      Installation Requirements (English)

      Pages: 38
      File size: 1 MB
    • ZEISS GeminiSEM series x60

      Instruction Manual (English)

      Pages: 164
      File size: 5 MB
    • ZEISS GeminiSEM series x60

      Instruction Manual (Korean)

      Pages: 166
      File size: 3 MB
    • ZEISS GeminiSEM series x60

      Instruction Manual (Norwegian)

      Pages: 162
      File size: 5 MB
    • ZEISS GeminiSEM series x60

      Instruction Manual (Italian)

      Pages: 174
      File size: 3 MB
    • ZEISS GeminiSEM series x60

      Instruction Manual (Spanish)

      Pages: 174
      File size: 3 MB
    • ZEISS GeminiSEM series x60

      Instruction Manual (Russian)

      Pages: 180
      File size: 3 MB
    • ZEISS GeminiSEM Ailesi (Turkish Version)

      Nanometre Altı Görüntüleme, Analiz ve Numune Esnekliğine Yönelik İleri Düzey Talepleri Karşılayan Alan Emisyonlu Taramalı Elektron Mikroskoplarınız (SEM)

      Pages: 47
      File size: 5 MB
    • Серия ZEISS GeminiSEM (Russian Version)

      Автоэмиссионные сканирующие электронные микроскопы для высокопроизводительной визуализации в субнанометровом разрешении, аналитики и гибкой работы с образцами

      Pages: 47
      File size: 5 MB

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