Quality Control and Process Control Microscope
Axio Imager 2

Axio Imager 2 for Materials Research

Your motorized microscope platform for materials

Your Microscope System for Advanced Materials Research

Introduce ease of operation into your microscopy workflow - Axio Imager 2 ensures accurate and reproducible results from quality control and process control.

Axio Imager 2 features brilliant optics and homogeneous illumination. The contrast manager and light manager ensure defined conditions and reproducible results at all times. Use ACR to automatically detect and configure objectives and contrast modules for Axio Imager.Z2m.

Choose your system out of four different stand versions and expand your applications with dedicated solutions: Particle Analyzer, Correlative Microscopy or LSM 700.

Highlights

Axio Imager 2– Product Highlights
  • Profit from brilliant optics for superb contrast and resolution
  • Gain enhanced flexibility with the modular design concept with a range of motorized and encoded components for enhanced flexibility
  • Obtain reproducible results with its stable stand design and vibration-free working condition
  • Upgrade your Axio Imager 2 with ZEISS LSM 700 confocal laser scanning module
  • Use Axio Imager 2 for correlative microscopy workflows and particle analysis
  • Achieve accurate reproduction in quality control and process control with its automated functions

Contrasts

Axio Imager 2 – versatile in use

A Choice of Contrasts

Take charge of your research and examine a diverse range of materials. Analyze metallic structures, composites, glass, wood and ceramics. Examine polymers, liquid crystals.
 
Choose from a wide variety of contrasting techniques to gain additional information. Use reflected light and observe your samples in brightfield, darkfield, differential interference contrast (DIC), circular differential interference contrast (C-DIC), polarization or fluorescence. Use transmitted light and examine your samples in brightfield, darkfield, differential interference contrast (DIC), polarization or circular polarization.
 
The contrast manager ensures reproducible illumination settings for your Axio Imager 2.

Ergonomics

Axio Imager 2 – focus on the essentials

As Multifaceted as Your Surfaces

Axio Imager.Z2m or Axio Imager.M2m display key operating functions on a touch screen, giving you fingertip control of all motorized components.
 
Additional control buttons are positioned ergonomically around the focus drive, with tactile surfaces that make them easy to distinguish.

 

Axio Imager.D2m has five pre-programmed buttons while Axio Imager.Z2m has ten user-definable buttons.

Thermomicroscopy

Linkam Heating Stage - Flexible Documentation of Temperature Changes

Do you want to examine how temperature influences the behavior of metals, crystals, ceramics or plastics?

With AxioVision and Linkam heating stages you define heating or cooling experiments. Document the temperature pattern in a time lapse series. The result you obtain is a log of the temperature and vacuum data in each time lapse image. Observe sample changes during the heating or cooling process for example in the field of quality control. 

Downloads

ZEISS Axio Imager 2

Your Open Microscope System for Automated Material Analysis

Pages: 23
Filesize: 10,447 kB

White Paper: Analysis and Quantification of Non-metallic Inclusions in Steel

Shuttle & Find

Pages: 6
Filesize: 1,951 kB

White Paper: Optical Analysis of Shape and Roughness of a Gear Wheel

Pages: 6
Filesize: 1,193 kB

Applications of Microscopy in Additive Manufacturing

Utilizing ZEISS Light and Electron Microscope Systems

Pages: 7
Filesize: 2,975 kB

White Paper: Light Microscopic Analysis of the Intrinsic Properties of Magnetically Hard Phases from the Domain Structure

Pages: 7
Filesize: 2,442 kB

White Paper: Topography and Refractive Index Measurement

of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscop

Pages: 6
Filesize: 1,755 kB

Application Note

Graphene Characterization by Correlation of Scanning Electron, Atomic Force and Interference Contrast Microscopy

Pages: 5
Filesize: 1,245 kB

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