Discover the TEM Prep Automation Workflow for Research

TEM lamella preparation is vital for every FIB-SEM user in materials research. To fully understand your samples, you need the highest quality TEM samples possible. Your final TEM lamella must enable a comprehensive characterization of the material’s properties. Only then can analysis under transmitted light provide detailed insights into its nanometer- or even atomic–scaled structure.

Discover this TEM Prep Automation workflow enabled by ZEISS Crossbeam. The TEM Prep toolkits are hosted in one single software interface. The streamlined workflow allows you to fully automate individual or all steps in TEM lamella preparation.  

From chunk preparation to lift out to lamella thinning

Explore the workflow’s details

The power of automation combined with manual flexibility

Benefit from efficiency

Gain efficiency

Automate TEM lamella preparation

Your choice

Perform the steps manually if needed

Stay flexible

Prepare multiple material

Download the Flyer ⤓

ZEISS Crossbeam for TEM Prep Automation
Cover page preview of the white paper 'Comparing Segmentation Methods for Particle Analysis of Lithium Ion Battery Materials using ZEN core'

Automate Your TEM Lamella Preparation

  • Find out how to use the completely automated workflow.
  • Learn which offerings enable you to execute chunking, lift out and thinning.
  • Discover an image gallery showcasing TEM lamellas prepared from materials research samples e.g., steel, thin film

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