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SEM- ECCI observation of nano indentation in a bulk TWIP steel sample

Controlled Electron Channeling Contrast Imaging (cECCI): In Scanning Electron Microscopy

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  • How to observe extended crystal lattice defects like dislocations and stacking faults in bulk samples with a SEM.
  • The basic principle of contrast formation, and how electrons channel into a crystal lattice when the incident beam hits the lattice along the Bragg angle.
  • What is required for a methodical workflow involving a suitable scanning electron microscope with optimal beam conditions coupled with a sophisticated crystallographic analysis software.

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