ZEISS On Your Campus@Fraunhofer IST

Multi Modal Microscopy for New Energy Research

Joint Fraunhofer IST & ZEISS Workshop

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Microscopic Workflow Solutions for Your Applications

Join us for an exciting collaboration between the  Fraunhofer IST Braunschweig and ZEISS as we present a comprehensive workshop on the latest advancements in microscope techniques for materials research. This event promises at the first day a starting point for all material researchers in the field of new energy research. It will give an overview on all relevant microscopic and measurement techniques. The second day will be a deep dive into cutting-edge technologies, especially in electron microscopy, the correlative workflows between the instruments and AI and deep learning-based image analysis, fostering a collaborative space for experts and enthusiasts alike. If you would like to analyze yor own data, there will be a chance to do so on Wednesday afternoon. Just mark it during registration.

 

Key Learnings:

  • Uncover insights into non-destructive imaging techniques that provide a three-dimensional view of your samples by CT and XRM technology.
  • Gain valuable insights into the structural and chemical composition of materials with the help of Light and electron microscopy.
  • Explore the advantages of correlating microscopic tools to achieve best results without limiting yourself at the boundary of the scale bar
  • Understand how nower days Image analsyis tools can enhance data interpretation, streamline workflows, and uncover hidden patterns in your research.

This workshop presents a unique opportunity to advance your research and optimize your imaging capabilities with expert guidance.

Agenda

  • 9 AM

    Registration

    9.15 AM

    Welcome

    9.25 AM

    ZEISS On Your Campus workshops - An established tradition in a new context
    Frank Josten, ZEISS Microscopy

    10 AM

    Light Microscopy in Materials Research
    Robert Stoessel, ZEISS Microscopy

    10.30 AM

    CT-Technology in Materials Research
    Hendrik Roennfeld, ZEISS IQS

    11.15 AM

    Coffee Break

    11.30 AM

    Electron Microscopy in Materials Research
    Johannes Kaindl, ZEISS Microscopy

    12.15 PM

    Lunch

    1 PM

    Connected Microscopy in Materials Research
    Ilona Wimmer, ZEISS Microscopy

    1.30 PM

    Image Analysis with ZEISS
    Oliver Tress, ZEISS Microscopy

    2.15 PM

    Coffee Break

    3.15 PM

    Test & Measure - 3D Measurement Technology for Geometry and Deformation Analysis
    Michael Müller, ZEISS GOM Metrology

    2.30 PM

    Machine Learning and Artificial Intelligence in Image Analysis with Live Demonstration
    Matthias Gaenge, ZEISS Microscopy

    3.45 PM

    End

  • 9.30 AM

    Machine Learning and Artificial Intelligence in Image Analysis Training

    12 PM

    Lunch in the ZEISS GOM canteen, followed by a tour of the factory

    3 PM

    End

Location

Carl Zeiss GOM Metrology GmbH

Carl Zeiss GOM Metrology GmbH Schmitzstraße 2, Meetingroom 1.1.4 38122 Braunschweig Germany

Registration

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