
Multi Modal Microscopy for New Energy Research
Joint Fraunhofer IST & ZEISS Workshop
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Agenda
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9 AM
Registration
9.15 AM
Welcome
9.25 AM
ZEISS On Your Campus workshops - An established tradition in a new context
Frank Josten, ZEISS Microscopy
10 AM
Light Microscopy in Materials Research
Robert Stoessel, ZEISS Microscopy
10.30 AM
CT-Technology in Materials Research
Hendrik Roennfeld, ZEISS IQS11.15 AM
Coffee Break
11.30 AM
Electron Microscopy in Materials Research
Johannes Kaindl, ZEISS Microscopy12.15 PM
Lunch
1 PM
Connected Microscopy in Materials Research
Ilona Wimmer, ZEISS Microscopy1.30 PM
Image Analysis with ZEISS
Oliver Tress, ZEISS Microscopy2.15 PM
Coffee Break
3.15 PM
Test & Measure - 3D Measurement Technology for Geometry and Deformation Analysis
Michael Müller, ZEISS GOM Metrology2.30 PM
Machine Learning and Artificial Intelligence in Image Analysis with Live Demonstration
Matthias Gaenge, ZEISS Microscopy3.45 PM
End
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9.30 AM
Machine Learning and Artificial Intelligence in Image Analysis Training
12 PM
Lunch in the ZEISS GOM canteen, followed by a tour of the factory
3 PM
End