Supporting your research
Connected Microscopy for intelligent analysis
ZEISS solutions can help you extract information from metals samples on scales from the millimeter to the nanometer, whether imaging and measuring features, chemical and crystallographic analysis of inclusions, grains and phases, or textural and structural information in three imensions, in turn meeting the needs of your customers and our world.
By advancing the microscopy spectrum, ZEISS can help you advance metals with a full multiscale portfolio of light, electron, X-ray and ion beam microscopes for routine and research applications, with an industry-leading suite of software solutions. These will unlock your information in light, electrons, and materials.
Microstructural analysis of metals
bringing deep physical & chemical understanding of properties and performance
Download this collection of papers
ZEISS Microscopy Solutions for Metallography research
Multi-modal characterization & advanced analysis options
For industry and research
Learn how ZEISS can help you advance metals with a full multiscale portfolio of light, electron, X-ray and ion beam microscopes for routine and research applications.
Rapid Sample Preparation
enabled by the LaserFIB
Read here how the new femtosecond laser for ZEISS Crossbeam is used to rapidly prepare cross-sections in sheets of different metals and EBSD is performed on the laser-polished surfaces.
Premium 3D Crystallographic Imaging
in Your Laboratory Laboratory-based Diffraction Contrast Tomography
Learn more about the latest capabilities of laboratory-based DCT on 3D X-ray imaging systems, and new research and 3D characterization capabilities this enables.