Skip to main content
Research Microscopy Solutions
back
High-value hybrid 3D XRM + microCT solution

ZEISS VersaXRM 5 Insight

Stay in the flow from overview to insight.

Download your white paper

Detailed, multi-scale 3D imaging for a wide range of sample types

The flexibility of microCT, the detail of X-ray microscopy, and the value of guided workflows in a single platform

Third-party Content Blocked

The video player is blocked due to your cookie preferences. To change the settings and play the video, please click the button below and consent to use of "Functional" tracking technologies.

ZEISS VersaXRM 5 Insight Value optimized. Built for performance.

From rapid overview scans to targeted high-resolution analysis, VersaXRM 5 Insight keeps you in the flow with seamless multi-scale imaging on a single platform. Its Insight detector architecture, flat panel overview imaging, Resolution at a Distance™ (RaaD™) objective-based high-resolution imaging, guided ZEN navx® workflows, and deep-learning reconstruction work support efficient over-to-detail imaging.​

Hybrid 3D XRM + CT capabilities. One connected workflow.

Start with a full-sample 3D overview, identify regions of interest, and seamlessly transition into targeted high-resolution XRM imaging. VersaXRM 5 Insight brings microCT and X-ray microscopy together in one connected workflow, helping you move from broad context to precise detail while preserving sample integrity and accelerating insight.

Screenshot of the ZEISS ZEN navx software interface showing Volume Scout workflow on an insulin pump. Multiple X-ray views identify and target a region of interest within the device, with a 3D rendering displayed alongside orthogonal slice views for guided navigation and volume selection.

High-resolution imaging across sample sizes.

RaaD enables high-resolution imaging of small features and internal defects within larger samples. Users can spend less time modifying samples and more time analyzing them, while helping preserve sample integrity.

Guided operation for faster, more reliable results.

ZEN navx provides intelligent guidance and sample-aware navigation to speed setup, improve operator variability, and simplify workflow decisions, yielding greater productivity in one pass.


FAST mode delivers rapid imaging feedback for navigation, 3D inspection, and targeted analysis. It speeds decision-making, improves screening throughput, supports in situ experiments, and reduces time to results.

Download the white paper

Learn how VersaXRM 5 Insight FAST mode enables sharp, undisturbed imaging and analysis​.

Download the white paper to gain insights into

  • The limitations of traditional STEP tomography for loose powders and how FAST continuous-motion scanning overcomes them.​
  • How FAST mode improves image sharpness, particle segmentation, and reliable quantitative analysis without embedding powders.​
  • Practical application across pharma, geoscience, and materials science, with high-resolution capabilities and multi-scale imaging.​

Form is loading...

If you want to have more information on data processing at ZEISS please refer to our data privacy notice.