Webinaire
La microscopie électronique à balayage au service des applications industrielles
28 février 2020
· 36 MIN VISIONNAGE
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/insights-hub-france/materials-sciences/deniz_akman.jpg/_jcr_content/renditions/original.image_file.100.100.file/deniz_akman.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/insights-hub-france/materials-sciences/deniz_akman.jpg/_jcr_content/renditions/original.image_file.360.360.file/deniz_akman.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/insights-hub-france/materials-sciences/deniz_akman.jpg/_jcr_content/renditions/original./deniz_akman.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/insights-hub-france/materials-sciences/deniz_akman.jpg/_jcr_content/renditions/original./deniz_akman.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/insights-hub-france/materials-sciences/deniz_akman.jpg/_jcr_content/renditions/original./deniz_akman.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/insights-hub-france/materials-sciences/deniz_akman.jpg/_jcr_content/renditions/original./deniz_akman.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/insights-hub-france/materials-sciences/deniz_akman.jpg/_jcr_content/renditions/original./deniz_akman.jpg"})
Author
Deniz AKMAN
Product & Application Sales Specialist - ZEISS Research Microscopy Solutions
Résumé
La microscopie électronique à balayage au service des applications industrielles
Dans ce webinaire, vous apprendrez :
- Le portfolio ZEISS en microscopie
- L'interaction électron matière : principe de fonctionnement d’un MEB
- L'imagerie topographie / imagerie contrastée / analyse EDS
- Les applications rencontrées en industrie : analyse de défaillance (fracture ductile / fragile – les stries de fatigues), la microstructure (fonte et aciers), les alliages, les céramiques, le traitement de surface, la corrosion (composition chimique)
- La microscopie corrélative
![Photo du FIB-SEM ZEISS Crossbeam 750]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.1024.1024.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.1280.1280.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg"})
![ZEISS EVO - La plateforme MEB modulaire au fonctionnement intuitif, pour les contrôles de routine et les applications de recherche]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/evo_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original./evo_stage.jpg"} "ZEISS EVO")
![Gamme ZEISS GeminiSEM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.100.100.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.360.360.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.768.768.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1353.1353.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1353.1353.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg"} "Gamme ZEISS GeminiSEM")
![ZEISS MultiSEM 706 : Le microscope électronique à balayage le plus rapide au monde]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-706-stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/multisem-706-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-706-stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/multisem-706-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-706-stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/multisem-706-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-706-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/multisem-706-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-706-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-706-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-706-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-706-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-706-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-706-stage.jpg"} "ZEISS MultiSEM 706 : Le microscope électronique à balayage le plus rapide au monde")
![ZEISS Sigma]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/sigma360-stage.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/sigma360-stage.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/sigma360-stage.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/sigma360-stage.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png"} "ZEISS Sigma")
![ZEISS Volutome]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/volutome/zeiss-volutome.jpg/_jcr_content/renditions/original.image_file.100.100.52,96,859,903.file/zeiss-volutome.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/volutome/zeiss-volutome.jpg/_jcr_content/renditions/original.image_file.360.360.52,96,859,903.file/zeiss-volutome.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/volutome/zeiss-volutome.jpg/_jcr_content/renditions/original.image_file.768.768.52,96,859,903.file/zeiss-volutome.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/volutome/zeiss-volutome.jpg/_jcr_content/renditions/original.image_file.807.807.52,96,859,903.file/zeiss-volutome.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/volutome/zeiss-volutome.jpg/_jcr_content/renditions/original.image_file.807.807.52,96,859,903.file/zeiss-volutome.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/volutome/zeiss-volutome.jpg/_jcr_content/renditions/original.image_file.807.807.52,96,859,903.file/zeiss-volutome.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/volutome/zeiss-volutome.jpg/_jcr_content/renditions/original.image_file.807.807.52,96,859,903.file/zeiss-volutome.jpg"} "ZEISS Volutome")