Overview of upright and inverted light microscopes

Scanning Electron & Ion Microscopes

For scientific and routine research

Scanning Electron Microscopes

Scanning Electron Microscopes (SEM) by Carl Zeiss deliver high resolution surface information and superior materials contrast. They are widely used in electron microscopy sciences and application fields such as nanotechnology, materials analysis, semiconductor failure analysis, life sciences and quality assurance

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Focused Ion Beam Scanning Electron Microscopes

With ZEISS Crossbeam FIB-SEMs you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples

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Multiple Ion Beam Microscopes

With ZEISS ORION NanoFab you profit from the only system in the world that covers the complete range of micromachining to nanomachining applications using gallium, neon and helium ion beams integrated in a single instrument

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