Dr. Sina Shahbazmohamadi

Implantable medical devices like pacemakers and neurostimulators use specialized coatings that safely facilitate transfer of electrical charges. Since reliability is paramount, verifying the integrity of the coating microstructure is crucial.

Dr. Sina Shahbazmohamadi and team have designed a process where the use of non destructive 3D X-ray tomography, in conjunction with a Focused Ion Beam Scanning Electron Microscope (FIB SEM), work together to target and tomographically image a specific region of a device at the nanoscale.

The ZEISS Crossbeam provides a detailed 3D map of coating cracks or defects. The testing is crucial to mitigating the dire outcomes from failure of these devices.

Failure in vital microelectronic components creates huge challenges. Microscopic characterization methods are critical to understanding the root cause of failures in order to design better materials andmanufacturing processes.

Dr. Shahbazmohamadi is developing enhanced microscopy techniques to understand these material breakdowns. Recently, his lab established the use of X-ray microcopy to capture bond wire geometries, perform image processing and then computer simulation.

The lab developed an in situ testing device within the FIB SEM to observe mechanical deformation at the micro and nanoscale. By combining in situ testing with multiscale microscopy techniques, he is better able to identify potential device failures.

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