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ZEISS VersaXRM multi-scale 3D X-ray microscopes shown against a black background.
Non-destructive 3D X-ray imaging

ZEISS VersaXRM multi-scale 3D X-ray microscopy

Explore intact samples across scales, locate regions of interest, and move from broad structural understanding to targeted insight while preserving context.

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  • Smart watch battery: ZEISS VersaXRM 615 scans the intact battery to identify areas of interest and zoom-in for high resolution imaging.

See inside your sample without losing the bigger picture

Researchers and industrial teams often face a difficult trade-off: capture the full structure of a sample and miss critical details or focus on a small region of interest and lose the surrounding context needed to interpret results. ZEISS VersaXRM® is a portfolio of non-destructive 3D X-ray microscopy systems designed to bridge this gap.

With Resolution at a Distance™ (RaaD™), VersaXRM enables higher-resolution imaging of regions of interest while maintaining sample context and preserving sample integrity. User-centered workflows powered by ZEN navx provide guided setup, tailored parameter optimization, and source-and-sample protection features that help users work more efficiently and confidently. VersaXRM also supports correlative microscopy workflows, allowing teams to begin with non-destructive imaging of intact samples before moving to higher-resolution or destructive techniques when needed. 

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Why choose VersaXRM

Explore broadly. Investigate precisely. Preserve context.

ZEISS VersaXRM systems help connect whole-sample understanding with targeted internal analysis. Move efficiently from overview to detail, preserve the context of your sample, and generate 3D data you can interpret with confidence.

  • Move from overview to detail

Connect whole-sample overview imaging with targeted high-resolution imaging for detailed analysis in a single workflow, so users can understand where features are and how they relate to the surrounding structure.

  • Target regions of interest efficiently

Scout-and-zoom workflows, 3D navigation, and guided setup help locate buried defects, interfaces, and internal features with greater certainty.

  • Preserve sample integrity

Investigate intact samples non-destructively before destructive preparation, supporting repeated analysis, correlative workflows, and better-informed downstream decisions.

  • Adapt across applications and sample types

Support diverse imaging needs across materials and industrial research, electronics, batteries, life sciences, geology, and other complex fields.

  • Extend visibility with advanced reconstruction

Leverage reconstruction technologies that improve image quality, increase throughput, enhance contrast, and reduce artifacts in challenging datasets.

  • Turn 3D data into confident interpretation

Combine ZEISS optics, stable imaging platforms, guided workflows, and visualization tools to generate reliable datasets that support meaningful analysis.

The VersaXRM portfolio

Choose the right ZEISS X-ray microscope for your workflow

  • ZEISS VersaXRM 730

    Ultimate VersaXRM performance for demanding samples and advanced imaging
    Product image of VersaXRM 730

    ZEISS VersaXRM 730 delivers ultimate VersaXRM performance for the most demanding samples and applications. It combines highest-resolution performance, maximum throughput, automation, and flexibility with advanced techniques for rigorous, multi-step imaging environments.

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    Product features

    • Highest-resolution performance for the most demanding samples and applications
    • Maximum throughput, automation, and flexibility for the widest range of samples and advanced workflows
    • Breakthrough capabilities with advanced techniques such as laboratory-based diffraction contrast tomography and high aspect ratio tomography
    • End-to-end performance for rigorous, multi-step imaging environments
    • Choose VersaXRM 730, the flagship system, when you need ultimate performance

  • ZEISS VersaXRM 615

    High-power XRM for routine and advanced 3D imaging
    Product image of VersaXRM 615

    ZEISS VersaXRM 615 is a high-performance workhorse for routine and advanced non-destructive 3D imaging. Its high-power source, RaaD, automation, robotics, and advanced reconstruction support high-throughput imaging across diverse samples, including in situ and multi-modal studies.

    Explore VersaXRM 615

    Product features

    • High throughput imaging for routine and advanced workflows
    • Reliable, 24/7 operation with automation and robotics
    • A powerful balance of high power, productivity, and value
    • Versatile multi-scale imaging across diverse samples
    • Choose VersaXRM 615, a high-performance workhorse, when you need everyday non-destructive 3D imaging

  • ZEISS VersaXRM 5 Insight

    High-value hybrid XRM + microCT for efficient overview-to-detail imaging
    Product image of VersaXRM 5 Insight

    ZEISS VersaXRM 5 Insight delivers true XRM in a value-optimized package built for performance. Hybrid XRM + CT capabilities, guided workflows, and advanced reconstruction support efficient, insight-driven imaging while enabling consistent results for users with different experience levels.

    Explore VersaXRM 5 Insight

    Product features

    • True XRM in a value-optimized package built for performance
    • Hybrid XRM + CT capabilities for efficient overview-to-detail imaging
    • Guided workflows that enable consistent results for users with different experience levels
    • Proven VersaXRM performance built on a trusted, scalable platform
    • Choose VersaXRM 5 Insight, a high-value hybrid VersaXRM + microCT solution, when you need efficient, insight-driven workflows

Supporting 3D X-ray microscopy across scales

VersaXRM systems support diverse applications by connecting whole-sample context with targeted, non-destructive 3D insight across scales.
Select a category Materials research in 3D X-ray microscopy
Materials research in 3D X-ray microscopy
Semiconductor & electronics failure analysis
Industrial research with non-destructive 3D imaging
Life science 3D imaging with preserved context
Geological and mining 3D X-ray microscopy
Three-dimensional rendering of recycled battery black mass with individual material phases segmented and color coded for analysis.

Materials research in 3D X-ray microscopy

Three-dimensional rendering of recycled battery black mass with individual material phases segmented and color coded for analysis.

Three-dimensional rendering of recycled battery black mass with individual material phases segmented and color coded for analysis.

Materials research in 3D X-ray microscopy

Characterize microstructures, defects, and degradation in metals, composites, and battery materials non-destructively, connecting internal structure to performance through in situ, correlative, and large-volume 3D imaging.

3D X-ray microscopy rendering of a smartphone system-on-chip package, with a green inset highlighting the central chip region.

Semiconductor & electronics failure analysis

3D X-ray microscopy rendering of a smartphone system-on-chip package, with a green inset highlighting the central chip region.

3D X-ray microscopy rendering of a smartphone system-on-chip package, with a green inset highlighting the central chip region.

Semiconductor & electronics failure analysis

Inspect complex packages and assemblies in 3D, localize buried defects, and preserve critical evidence before destructive downstream workflows in failure analysis and package development.

Three-dimensional X-ray rendering of a metal additively manufactured manifold revealing complex internal channels and lattice structures.

Industrial research with non-destructive 3D imaging

Three-dimensional X-ray rendering of a metal additively manufactured manifold revealing complex internal channels and lattice structures.
Sample courtesy of Penn United Technologies Inc

Three-dimensional X-ray rendering of a metal additively manufactured manifold revealing complex internal channels and lattice structures.
Sample courtesy of Penn United Technologies Inc.

Industrial research with non-destructive 3D imaging

Evaluate internal structures, defects, and failure mechanisms without destructive preparation, linking 3D sample information to product performance, process development, and validation workflows.

Three-dimensional rendering of an antihistamine tablet showing segmented internal particles and ingredient distribution.

Life science 3D imaging with preserved context

Three-dimensional rendering of an antihistamine tablet showing segmented internal particles and ingredient distribution.

Three-dimensional rendering of an antihistamine tablet showing segmented internal particles and ingredient distribution.

Life science 3D imaging with preserved context

Explore intact biological structures in 3D, preserve spatial context across scales, and locate regions of interest for downstream correlative microscopy workflows.

High-resolution X-ray cross-section of a sandstone sample showing pores, mineral grains, and internal microstructure.

Geological and mining 3D X-ray microscopy

High-resolution X-ray cross-section of a sandstone sample showing pores, mineral grains, and internal microstructure.

High-resolution X-ray cross-section of a sandstone sample showing pores, mineral grains, and internal microstructure.

Geological and mining 3D X-ray microscopy

Analyze pore networks, mineral distributions, and internal structures in intact geological samples while preserving rare specimens and supporting in situ or fluid-flow studies.

Advanced Reconstruction Technologies

Three-dimensional X-ray rendering of a pharmaceutical inhaler showing internal components and powder reservoir without disassembly.

Extend what you can see, measure, and interpret

The ZEISS Advanced Reconstruction Toolbox (ART) improves image quality, throughput, and data interpretation across VersaXRM workflows. DeepRecon Pro uses AI-assisted reconstruction for faster, high-quality results, DeepScout enhances large-volume reconstruction, and MARS reduces artifacts in complex multi-material samples.

PhaseEvolve improves contrast in low- and medium-density materials, while OptiRecon helps balance image quality and throughput for different workflow needs.

Add-ons

ZEISS VersaXRM accessories help adapt imaging workflows to different sample types, research questions, and operational needs. From sample handling to in situ imaging and workflow automation, accessories can extend how VersaXRM systems support routine imaging, advanced experiments, and multi-user environments.

Multi-position sample autoloader inside a ZEISS VersaXRM holding several mounted samples for automated X-ray microscopy imaging.

Autoloader

Multi-position sample autoloader inside a ZEISS VersaXRM holding several mounted samples for automated X-ray microscopy imaging.

Autoloader compatibility enables unattended imaging of multiple mounted samples, improving throughput and supporting consistent, repeatable workflows in high-utilization laboratories.

Autoloader

Support multi-sample studies and higher system utilization with handling options designed to reduce manual intervention and help users position, stabilize, and image samples more effectively.

In situ mechanical testing stage mounted inside a ZEISS VersaXRM for non-destructive imaging during loading experiments.
In situ mechanical testing stage mounted inside a ZEISS VersaXRM for non-destructive imaging during loading experiments.

In situ imaging

Study samples under changing conditions while preserving the ability to return to the same region of interest. In situ workflows help teams investigate how structures evolve during heating, cooling, compression, corrosion, wetting, fluid flow, or other environmental conditions.

Researcher using customized imaging software on a computer connected to a ZEISS X-ray microscopy system.
Researcher using customized imaging software on a computer connected to a ZEISS X-ray microscopy system.

ZEISS Solutions Lab

Extend the capabilities of your VersaXRM system with customized workflows developed by the ZEISS Solutions Lab. From automated acquisition routines to application-specific analysis and software tools, our experts help streamline imaging processes, reduce manual intervention, and improve reproducibility for unique research and industrial workflows.

Reconstruction and analysis

Extend acquisition workflows with advanced reconstruction and analysis tools that support visualization, segmentation, interpretation, and multi-modal data workflows.
X-ray microscopy image of a ceramic matrix composite sample showing conventional FDK reconstruction

FDK reconstruction 1x

Sample courtesy of Dr. David Marshall, Colorado University Boulder, USA.

X-ray microscopy image of a ceramic matrix composite sample showing conventional FDK reconstruction.
FDK reconstruction 1x
X-ray microscopy image of a ceramic matrix composite sample showing conventional FDK reconstruction at 10x magnification.

FDK reconstruction 10x

Sample courtesy of Dr. David Marshall, Colorado University Boulder, USA

X-ray microscopy image of a ceramic matrix composite sample showing conventional FDK reconstruction at 10x magnification.
FDK reconstruction 10x
X-ray microscopy image of a ceramic matrix composite sample showing DeepRecon Pro reconstruction, highlighting reduced artifacts and improved visibility of internal pores and microstructural features.

DeepRecon Pro reconstruction 10x

Sample courtesy of Dr. David Marshall, Colorado University Boulder, USA

X-ray microscopy image of a ceramic matrix composite sample showing DeepRecon Pro reconstruction, highlighting reduced artifacts and improved visibility of internal pores and microstructural features.
DeepRecon Pro reconstruction 10x

Comparison of reconstruction methods in a ceramic matrix composite (CMC) sample. Left: conventional FDK reconstruction at 1× magnification. Center: conventional FDK reconstruction at 10× magnification. Right: DeepRecon Pro reconstruction at 10× magnification, demonstrating reduced reconstruction artifacts and improved visualization of internal features. 
© Sample courtesy of Dr. David Marshall, Colorado University Boulder, USA

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    Driving future innovation with the ZEISS X-ray source

    Exclusively on ZEISS VersaXRM 730 systems

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  • Preview image of Extend the Limits of Your Exploration with Advanced 3D X-ray Microscopy

    Extend the Limits of Your Exploration with Advanced 3D X-ray Microscopy

    ZEISS VersaXRM 615

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    LabDCT Pro on ZEISS VersaXRM 730

    Product Accessories

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    Perfect Tomographies. Every sample. Every user. Every time.

    ZEISS VersaXRM 730

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    ZEISS VersaXRM 5 Insight

    Stay in the flow from overview to insight

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    ZEN navx Intuitive Software for ZEISS 3D X-ray Microscopes

    Naturally Taking You through Setting up an X-ray Scan.

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Services and support

Every ZEISS VersaXRM system is supported by ZEISS service, application, and training expertise. From installation and onboarding to workflow optimization and long-term maintenance, ZEISS helps labs build confidence, improve productivity, and keep systems performing reliably.

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FAQ

  • X-ray microscopy is useful when internal sample structures need to be visualized in 3D while preserving the intact sample and its surrounding context. ZEISS X-ray microscopy (XRM) systems are especially valuable for understanding hidden defects, interfaces, pores, cracks, or buried regions of interest that may be missed or altered by destructive preparation, while providing high-resolution, non-destructive imaging across a wide range of sample types.

  • Resolution at a Distance™, or RaaD™, enables high-resolution imaging while maintaining working distance between the source and sample. This allows users to image fine details at high resolution even in larger or more complex samples, investigate regions of interest inside intact samples without trimming or refixturing, and supports in situ setups.

  • Yes. VersaXRM systems support workflows that begin with broad sample exploration and move toward targeted investigation of selected regions of interest. This helps users identify where meaningful features are located, then efficiently investigate those features at higher resolution while maintaining the surrounding sample context.

  • The right VersaXRM system depends on the application, sample types, throughput needs, and performance requirements. Choose VersaXRM 730 for ultimate performance across the most demanding samples and advanced workflows. VersaXRM 615 is a high-performance workhorse for routine and advanced non-destructive 3D imaging. VersaXRM 5 Insight is a high-value hybrid VersaXRM + microCT solution for efficient, insight-driven workflows.

  • VersaXRM systems support a wide range of samples across materials and industrial research, semiconductor and electronics, battery and energy materials, life sciences, geology, and mining. Example samples may include metals, composites, batteries, electronic packages, industrial components, biological tissues, geological specimens, and other complex materials or devices.

  • VersaXRM can be used to image intact samples non-destructively before downstream preparation or higher-resolution analysis. This helps users locate regions of interest, preserve spatial context, and make more informed decisions before moving to techniques such as light microscopy, electron microscopy, FIB-SEM, or other destructive workflows.

  • Advanced reconstruction technologies can improve throughput, image quality, contrast, artifact reduction, and visualization of challenging samples. Tools such as DeepRecon Pro, DeepScout, MARS, PhaseEvolve, and OptiRecon help users get more value from VersaXRM datasets and adapt reconstruction workflows to different sample and application needs.

  • Yes. VersaXRM workflows can support in situ and 4D imaging studies where users repeatedly image the same sample over time or under changing conditions. This is useful for studying material evolution, deformation, heating, cooling, corrosion, wetting, compression, fluid flow, and other dynamic processes while preserving sample context.