ART Reconstructor Client with ZEISS User Interface (ZUI) showcasing DeepRecon Pro workflow, showing a preview of the final reconstruction.

Software

ZEISS Advanced Reconstruction Toolbox

Name: ZEISS Advanced Reconstruction Toolbox
Brand: ZEISS

Maximize your X-ray results

The Advanced Reconstruction Toolbox (ART) by ZEISS is a unique platform designed to tackle complex imaging challenges in X-ray computed tomography (CT). Leveraging the ZEISS team's deep expertise in X-ray physics and customer applications, ART combines advanced AI capabilities with innovative workflows. These solutions, available both in the cloud and on workstations, provide you with enhanced access, flexibility, and effective data management, ensuring that you can meet your specific imaging needs.

Built on a foundation of proven algorithms, ART fosters trust through transparency and reliability, allowing you to confidently rely on its outputs.

Resolution / contrast / image quality
Throughput
Diverse sample types, sizes, and shapes
Ease-of-use
Artifact reduction

Modules

ZEISS DeepRecon Pro

Increased throughput, better image quality

This FDK image, with labels, demonstrates significant noise in comparison to the DeepRecon Pro image

Ceramic matrix composite imaged with VersaXRM. On the left, a standard (FDK) reconstruction took 9 hours with 3001 projections. With DeepRecon Pro TPT, the reconstruction took <1 hour with 301 projections, a 10X improvement in throughput.

ZEISS DeepRecon Pro brings superior throughput and image quality benefits across a wide range of applications. It uniquely harvests the hidden opportunities in big data generated by your XRM or microCT and provides significant AI-driven speed or image quality improvements. Three one-click workflows‒Throughput (TPT), ImageClarity, and Image Quality (IQ)‒eliminate the need for a machine learning expert.

Use ZEISS DeepRecon Pro TPT to increase throughput by up to 10x without sacrificing novel resolution at a distance (RaaD) or microCT image quality. Alternatively, keep the same number of projections and enhance the image quality further. ZEISS DeepRecon Pro ImageClarity, your default, offers dramatic noise reduction without small feature loss, providing superior image quality. DeepRecon Pro IQ provides best-in-class noise reduction.

ZEISS DeepRecon Pro is included as standard with a high-performance workstation on ZEISS VersaXRM 615 and 730 platforms. It is also available on ZEISS Ultra nanoscale X-ray microscopes. For other ZEISS Versa or microCT systems, it is offered as part of the AI Supercharger or Premium ART packages, or as a standalone module, available via the cloud or workstation. DeepRecon Pro is also available for our customers for certain third-party microCT, ZEISS METROTOM, and select synchrotron data formats via the ZEISS Data Converter.

DeepRecon Pro more examples

Less noise, more features. Trust your results.

Pharmaceutical powder particles

With DeepRecon Pro ImageClarity, less noise and better image quality for high resolution scans of materials like particle powders reveal particle morphology for easier segmentation.
Metal matrix syntactic foam

In this type of sample, porosity in the metal matrix is filled with hollow spheres of Aluminum oxide, reducing the weight over a conventional metal of the same size and shape. It is crucial to observe fine features such as porosity to predict or assess the sample's quality and mechanical strength. DeepRecon Pro ImageClarity enables researchers to see more of these features than traditional FDK reconstruction. Sample courtesy of N.Gupta, New York University Tandon School of Engineering, USA.
Sandstone

With DeepRecon Pro ImageClarity, researchers are able to clearly distinguish details in the clays, visualize small pores, and even discern fine cracks in this sandstone sample.
Zebrafish

In this imaging of a zebrafish with a suspected brain tumor, DeepRecon Pro ImageClarity reconstruction eliminates the noise that obscures informative features in the sample. Courtesy of D. Ayyappa Raja and Jan Stundl, California Institute of Technology, USA.
C4 bumps on semiconductor package

Visualization of this C4 bump sample with DeepRecon Pro ImageClarity reveals hidden particles on the metal trace that cannot be clearly seen in the standard (FDK) reconstruction.
Commercial smartwatch pouch cell battery image acquired by ZEISS VersaXRM

Left: standard FDK reconstruction.
Right: DeepRecon Pro IQ reconstruction showing superior image quality.
Courtesy: Prof. Dr. Bert Müller, University of Basel, Switzerland

Zebrafish sample imaged with ZEISS VersaXRM

Left shows standard FDK reconstruction.
Right is reconstructed with DeepRecon Pro IQ, showing significantly less noise.
Mouse lung imaged with ZEISS VersaXRM

Sample is iodine stained and captured with 3001 projections. Reconstruction done using DeepRecon Pro IQ. Compare with the equivalent image reconstructed using FDK (left). Less noise, clearer view of features.

fcBGA flip chip imaged with ZEISS UltraXRM

fcBGA flip chip DeepRecon Pro Ultra reconstruction

ZEISS DeepRecon Pro with ZEISS Ultra

fcBGA flip chip imaged with ZEISS UltraXRM

Left: Standard reconstruction, 1000 projections, 18-hour scan
Right: DeepRecon Pro Ultra reconstruction, 250 projections, 4.5 hour scan, a 4x improvement

Standard reconstruction on the left. On the right, DeepScout shows significantly more cellular information. Sample courtesy of Keith Duncan, Donald Danforth Plant Science Center

ZEISS DeepScout

Resolution at field of view, throughput at field of view

ZEISS DeepScout harnesses high-resolution 3D XRM datasets to enhance lower resolution, larger field of view datasets through advanced convolutional neural network models. Using the unique XRM Scout-and-Zoom capability, DeepScout can connect resolution and contrast across scales to train powerful super resolution image restoration deep learning models.

Take your large overview scan
Feed it through the ZEISS DeepScout reconstruction algorithm
Get resolution that approaches the resolution of a Zoom scan, but over a much larger field of view.

At its core, ZEISS DeepScout relies on the ability to generate multiscale, spatially registered datasets and uses that ability to train neural networks to improve the reconstruction. New capabilities, fueled by deep learning, mitigate the traditional trade-off between field of view and resolution.

DeepScout is available in the AI Supercharger and Premium ART packages, or as a standalone module, available via the cloud or workstation.

Application of DeepScout to a polymer electrolyte fuel cell sample.

DeepScout

How it works

Now, your volume scout includes the full field of view for your sample. A selected high-resolution scan trains the whole model to provide you with high resolution at field of view (FOV). This is game-changing AI, uniquely enabling visualization of fine structure across large fields of view at unprecedented speeds.

Smartphone Package Acquired Using DeepScout For a large field of view scan, a high res scan to train the model, and high resolution reconstruction to LFOV.

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Biomedical metal implant in bone. Without MARS, left. With MARS, right.

Materials Aware Reconstruction Solution (MARS)

Superior image quality for highly attenuating samples

MARS is a reconstruction algorithm that is aware of the constituents within a reconstruction. A challenge in X-ray reconstruction in a lab setting is that imaging with a polychromatic source creates different X-ray energies to generate a phenomenon called beam hardening. This effect is particularly challenging when your material is very dense and embedded in relatively less dense material. MARS tells the reconstruction system how to compensate for the effect of extreme beam hardening in the regions between very dense objects. This is important in applications like biomaterials, where you might be looking at implants next to bone or tissue. Or electronics where extremely dense solder balls appear next to other less dense materials on a printed circuit board, generating strong artifacts. MARS reconstructs your images to compensate for these effects.

MARS is available in the Artifact Reduction package.

Pharmaceutical sample consisting of large lactose carrier particles and smaller (< 1 um) API particles. Image on the left is standard FDK; image on the right is with PhaseEvolve processing. Histograms show the distribution of intensities in the images. Left, all phases are convoluted, making it difficult to segment the image. Right, the histogram shows well-differentiated phases with PhaseEvolve in the two peaks. Sample courtesy University of Manchester, UK

PhaseEvolve

Enhanced image contrast and improved segmentation

ZEISS PhaseEvolve is a patented (US11645792B2) postprocessing reconstruction algorithm that enhances the image contrast by revealing material contrast uniquely inherent to X-ray, which can often be obscured by phase effects in low-medium density samples or high-resolution datasets. Perform more accurate quantitative analysis with improved contrast and segmentation of your results.

PhaseEvolve is available in the Artifact Reduction package, as a stand-alone module, in the cloud, and is offered with the ZEISS Data Converter for third-party platforms, ZEISS METROTOM, and select synchrotron data formats.

Camera module: 1200 projections in 90 minutes using standard FDK, left, vs. 300 projections in 22 minutes with OptiRecon, right. Comparable image quality in a fraction of the time.

ZEISS OptiRecon

Fast and efficient iterative reconstruction solution

A fast and efficient algorithm-based technology that delivers iterative reconstruction from your desktop, allowing you to achieve up to 4× faster scan times or enhanced image quality with equivalent throughput. ZEISS OptiRecon is an economical solution offering superior interior tomography or throughput on a broad class of samples.

OptiRecon is available in the Recon package and Premium ART packages, and as a standalone module.

Architecture

Flexibility meets accessibility

The ZEISS Advanced Reconstruction Toolbox is designed to both optimize your X-ray reconstruction results and to be easy to use.

(a) Standard reconstruction; (b) DeepRecon Pro ImageClarity reconstruction; (c) test: noise removed with correct model; (d) features removed: incorrect model was selected.

Image Difference feature

With ZEISS Image Difference, you can see exactly what the models are doing with respect to your reconstructed images. By enabling you to check your model, you can trust that the training model is removing noise and not erasing features.

ROI training

ROI training for ZEISS DeepRecon Pro and ZEISS DeepScout focuses the training of your model on the most important data you select, removing bias from the scanned volume and resulting in better performance. ROI training is useful for enhancing contrast and removing artifacts and can significantly reduce the training time for your models.

Model Database User Interface. Searchable, sortable information for every model

Easily manage your efforts

Model data management
As the number of models you develop can accumulate quickly over time, the Model Database tool helps manage your stored models. It displays a list of all available models in a way that can be easily sorted and searched. The models can be exported to and imported from a zip file, making it easier to share trained models between different ART clients.

Recon server status
This feature enables you to easily manage the recon server job queue status across multiple connected clients, preventing traffic jams and disrupted runs.

Meeting you where you are

ZEISS Data Converter

Extending advanced reconstruction to all your CT data

Extending the capabilities of the ZEISS Advanced Reconstruction Toolbox to a wider range of computed tomography platforms means more users can benefit from faster, higher-quality imaging, helping scientists and engineers across industries make better decisions, accelerate innovation, and improve quality control. By bridging the gap between cutting-edge algorithms and everyday imaging tools, ZEISS ART Data Converter supports more reliable analysis and opens new possibilities for research and manufacturing. ZEISS X-ray customers (Versa XRM, Ultra XRM, microCT or METROTOM) can use Data Converter seamlessly with select ART modules on datasets from other X-ray CT systems, via time-based licenses.

ZEISS Data Converter enables DeepRecon Pro and PhaseEvolve for

ZEISS METROTOM (.zip and MOS format)
Nikon CT data format (.xtekct)
Waygate CT data format (.pca)

Data Converter is also available for select synchrotron data formats.

How to access ART

Unique ART architecture provides you with options and flexibility that suit your working conditions.

Workstation
Access ART on a robust high-performance workstation, dedicated hardware. This is your choice when you need always-on reliability and the fastest processing of data for the full ART suite of capabilities.

Licenses
Leveraging ART Recon Server and Cloud Support architecture, you can select licenses that provide up to three users per license with access to the high performance workstation, to another workstation, or to a laptop, enabling remote work. Time-based licenses are ideal when you have project-based work for which you may not need a perpetual license. Or, you can easily upgrade your time-based license to a perpetual license if you determine this is the best structure for your requirements.

Cloud
You can also access several ART modules via the cloud. Cloud access includes multi-seat setups with multiple access points, without the need to make a capital investment. This provides access to the widest range of users with time to data based on your own IT infrastructure.

ZEISS Data Converter
ZEISS Data Converter is part of the ART Recon Client installer, automatically installed when the client is installed. License nodes are valid for 365 days after activation of the first node. Each seat is node-locked, bound to the specific workstation on which it is installed.

Work with your ZEISS representative to meet you where you are today and to determine the best solution, or combination of solutions, for your short and long-term needs.

	DeepRecon Pro	DeepScout	PhaseEvolve	MARS	OptiRecon
Systems
Versa	■	■	■	■	■
Context, Crystal CT	■	■	■	■	■
Ultra	■
Data Converter formats .MOS, .zip, .xtekct, .pca	■		■
High performance workstation with perpetual licenses and/or time-based licenses	■	■	■	■	■
Cloud with one-year licenses only	■	■	■
Packages
AI supercharger	■	■
Artifact reduction			■	■
Recon package	■				■
Premium ART	■	■	■	■	■

*DeepRecon Pro with a 2-year license is automatically included with VersaXRM 730 and 615, or upgrade to perpetual license

Diagram describing data transfere from ART client to ART cloud server

Stateless process for maximum data security

Your data, powering your experiences, is controlled by you. You, the user, have full control over sharing your data, results, and training models with your peers and collaborators. Your data is secured during processing and while in transit. The ZEISS core privacy principle is that you own your data. All data uploaded belong to you and your organization, only, and the confidentiality of your data is our top priority. You can feel confident about where your data is sent and how it is processed.

Downloads

Download this complimentary collection of papers

Applications and solutions for X-ray microscopy

Deep learning based X-Ray microscopy enables fast, accurate in situ mechanical characterization of nickel-based superalloys

In situ X-ray microscopy (XRM) is crucial for understanding the mechanical behavior of materials under stress, particularly for additive manufacturing-produced structural alloys, but is hindered by long acquisition times for high-resolution 3D imaging.
Enabling ai-based reconstruction for your ZEISS X-Ray microscope

ZEISS Advanced Reconstruction Toolbox (ART) for ZEISS X-ray microscopes (XRM) enables you to accelerate productivity in ways never before possible.
Seeing is believing: Artificial intelligence and the ZEISS Advanced Reconstruction Toolbox (ART)

At ZEISS, we focus on ongoing innovations in both X-ray microscopy (XRM) and artificial intelligence (AI) to optimize your X-ray imaging results.
Faster throughput, superior image clarity for your 3D X-ray microscopy

X-ray microscopy can provide unique insights non-destructively into the micro-structure that defines the properties and performance of your devices or materials. Accelerating research by dramatically reducing acquisition times leads to new and far-reaching discoveries and capabilities.

Further materials

Flyer: ZEISS DeepRecon Pro for Electronics and Failure Analysis

Faster 3D X-ray data acquisition and superior imaging quality for electronics failure analysis

1 MB

Download
ZEISS Data Converter for advanced X-ray reconstruction

Maximizing the precision and efficiency of your X-ray imaging

809 KB

Download
ZEISS OptiRecon for semiconductor packages

Improve 3D X-ray image quality and increase scan speed by 2X

1 MB

Download
ZEISS PhaseEvolve

Reveal contrast that has never been seen before

1 MB

Download
ZEISS Advanced Reconstruction Toolbox

Technology to Enhance your ZEISS 3D X-ray Microscope

2 MB

Download

Visit the ZEISS Download Center for available translations and further manuals.

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Information protection and cyber security. Modern safety digital Background

Cybersecurity at ZEISS Microscopy

As digitalization advances in microscopy, so do the complexities of cybersecurity. ZEISS Microscopy is committed to proactively securing our technologies and protecting our customers. Our Cybersecurity and Data Privacy Governance Program goes beyond traditional security—it also encompasses Responsible AI and Open Source Software (FOSS) governance.

Learn more

ZEISS Advanced Reconstruction Toolbox

Modules

ZEISS DeepRecon Pro

DeepRecon Pro more examples

ZEISS DeepRecon Pro with ZEISS Ultra

ZEISS DeepScout​

Third-party Content Blocked

DeepScout

Third-party Content Blocked

Materials Aware Reconstruction Solution (MARS)

PhaseEvolve​

ZEISS OptiRecon​

Architecture

Flexibility meets accessibility

Image Difference feature

ROI training

Easily manage your efforts

Meeting you where you are

Extending advanced reconstruction to all your CT data

How to access ART

Stateless process for maximum data security

Downloads

Download this complimentary collection of papers

Deep learning based X-Ray microscopy enables fast, accurate in situ mechanical characterization of nickel-based superalloys

Enabling ai-based reconstruction for your ZEISS X-Ray microscope

Seeing is believing: Artificial intelligence and the ZEISS Advanced Reconstruction Toolbox (ART)

Faster throughput, superior image clarity for your 3D X-ray microscopy

Further materials

Flyer: ZEISS DeepRecon Pro for Electronics and Failure Analysis

Faster 3D X-ray data acquisition and superior imaging quality for electronics failure analysis

ZEISS Data Converter for advanced X-ray reconstruction

Maximizing the precision and efficiency of your X-ray imaging

ZEISS OptiRecon for semiconductor packages

Improve 3D X-ray image quality and increase scan speed by 2X

ZEISS PhaseEvolve

Reveal contrast that has never been seen before