Scanning Electron Microscopes (SEM)

Scanning Electron Microscopes (SEM)

For Applications in Academia and Industry

Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.

CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.

        ● High resolution surface sensitive information and materials contrast.
        ● Widely used in nanotechnology, materials research, life sciences, semiconductor, raw materials and industry.

Contact ZEISS Microscopy


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