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ZEISS MultiSEM 706: The World’s Fastest Scanning Electron Microscope
Product

ZEISS MultiSEM 706

The World’s Fastest Scanning Electron Microscope

Unleash the acquisition speed of 91 parallel electron beams – to image samples in the centimeter scale at nanometer resolution. This unique scanning electron microscope is designed for continuous, reliable 24/7 operation. Simply set up your high-throughput data acquisition workflow and MultiSEM will acquire high-contrast images automatically.

  • Unprecedented imaging speed
  • Automated large-area image acquisition
  • Nanoscale details in the macroscopic context
  • High-contrast images at low noise levels

Explore What’s New with MultiSEM 706

  • Up to 4x Higher Acquisition Speed

    Get an ultra-fast 80 MHz scan system with pixel dwell time as short as 12.5 ns.

  • Improved Detection Homogeneity

    Enjoy the most homogeneous mosaic appearance with the new monocrystalline scintillator.

  • More Precise Pixel Placement

    Experience 10x better pixel placement with an advanced scan system.

  • Better System Stability

    Water-cooled scan electronics improve the system stability for long-term acquisition runs.

  • Broader Application Range

    Qualified imaging performance at very low landing energies paves the way for new use cases.

Mouse brain section, maximum acquisition speed of 1.22 gigapixels/second. Courtesy of J. Lichtman, Harvard University, Cambridge, MA, USA.

Blazing Fast. Nanometer Sharp.

Experience the fastest acquisition speeds ever achieved at nanometer resolution. The unique MultiSEM system uses 91 electron beams in parallel, significantly boosting your overall imaging speed. For example, capturing a 1 mm² area at 4 nm pixel size takes less than two minutes. With an incredible acquisition rate of over 3 TB per hour, you can image large volumes (> 1 mm³) while maintaining precise nanometer resolution.

Caption: Mouse brain section, maximum acquisition speed of 1.22 gigapixels/second. Courtesy of J. Lichtman, Harvard University, Cambridge, MA, USA.

Image Huge Samples at Nanometer Resolution

Image Large Samples with Nanometer Resolution

ZEISS MultiSEM makes imaging of very large samples a reality. It features a sample holder that accommodates an impressive 10 cm × 10 cm sample area. You no longer have to choose between sample size and nanometer resolution. Image your entire sample and uncover every detail needed to answer your scientific questions. With automated acquisition protocols specifically developed for large-area imaging, you'll get a detailed full picture without losing the crucial macroscopic context.

Electron Microscopy with ZEN Imaging Software

Effortless Electron Microscopy with ZEN Imaging Software

Experience electron microscopy like never before: We have brought ZEN, the intuitive standard software for ZEISS light microscopes, to the world of electron microscopy, making MultiSEM control straightforward and effortless. Quickly set up complex automated acquisition procedures, perfectly adapted to your specific sample needs. ZEN for MultiSEM is engineered to handle the high speeds required for continuous, parallel image acquisition. An API is available for customized application development.

The Technology Behind ZEISS MultiSEM​

  • Video animation visualizing the MultiSEM working principle​

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Multiple Electron Beams and Detectors in Parallel​
Multiple Electron Beams and Detectors in Parallel​

Multiple Electron Beams and Detectors in Parallel​

MultiSEM achieves high imaging speed by employing multiple electron beams and detectors in parallel. The key to this approach is a finely tuned detection path (red) collecting a large yield of secondary electrons used for imaging with a multiple detector array. Each beam carries out a synchronized scanning routine at one sample position, resulting in a single sub-image. The electron beams are arranged in a well-characterized hexagonal pattern. By merging all sub-images together, the final, full image is formed. A parallel computer setup is used for fast data acquisition ensuring a high total imaging speed. Experiment control and image acquisition are fully separated in the MultiSEM system to guarantee full performance.

ZEISS MultiSEM at Work​

  • Mouse brain section (50 nm thick), seven hexagonal multi-beam fields of view acquired in less than 20 seconds with a MultiSEM 706 covering an area more than 400 μm in diameter. Sample courtesy of B. Kasthuri, University of Chicago, IL, USA.
  • Deprocessed and polished integrated circuit, image acquired in 1.5 s with a MultiSEM 706 covering a hexagonal field of view of 132 μm × 114 μm. Sample courtesy of C. Pawlowicz, TechInsights, Ontario, Canada.
  • Human temporal cortex imaged with ZEISS MultiSEM and reconstructed in ultrastructural detail. The image shows a subset of reconstructed pyramidal neurons from an ultrathin section of approximately 2 mm × 3 mm in size.
  • Separator foil of a cycled battery with precipitates from the anode side. Image acquired at low landing energy of 1 keV and 4 nm pixel size, covering a field of view of 108 μm × 94 μm.
  • Femoral neck sample, selectively etched to carve out osteocytes, hidden within the bone matrix before. Sample courtesy of M. Knothe Tate, University of New South Wales, Australia, and U. Knothe, Cleveland, OH, USA.
  • High maturity shale rock sample with broad ion beam milled surface. Sample: courtesy of L. Hathon, University of Houston, TX, USA.
  • Mouse brain section (50 nm thick), seven hexagonal multi-beam fields of view acquired in less than 20 seconds with a MultiSEM 706 covering an area more than 400 μm in diameter. Sample courtesy of B. Kasthuri, University of Chicago, IL, USA.

    Mouse brain section (50 nm thick), seven hexagonal multi-beam fields of view acquired in less than 20 seconds with a MultiSEM 706 covering an area more than 400 μm in diameter. Sample courtesy of B. Kasthuri, University of Chicago, IL, USA.
  • Deprocessed and polished integrated circuit, image acquired in 1.5 s with a MultiSEM 706 covering a hexagonal field of view of 132 μm × 114 μm. Sample courtesy of C. Pawlowicz, TechInsights, Ontario, Canada.

    Deprocessed and polished integrated circuit, image acquired in 1.5 s with a MultiSEM 706 covering a hexagonal field of view of 132 μm × 114 μm. Sample courtesy of C. Pawlowicz, TechInsights, Ontario, Canada.
  • Human temporal cortex imaged with ZEISS MultiSEM and reconstructed in ultrastructural detail. The image shows a subset of reconstructed pyramidal neurons from an ultrathin section of approximately 2 mm × 3 mm in size.

    Human temporal cortex imaged with ZEISS MultiSEM and reconstructed in ultrastructural detail. The image shows a subset of reconstructed pyramidal neurons from an ultrathin section of approximately 2 mm × 3 mm in size.
  • Separator foil of a cycled battery with precipitates from the anode side. Image acquired at low landing energy of 1 keV and 4 nm pixel size, covering a field of view of 108 μm × 94 μm.

    Separator foil of a cycled battery with precipitates from the anode side. Image acquired at low landing energy of 1 keV and 4 nm pixel size, covering a field of view of 108 μm × 94 μm.
  • Femoral neck sample, selectively etched to carve out osteocytes, hidden within the bone matrix before. Sample courtesy of M. Knothe Tate, University of New South Wales, Australia, and U. Knothe, Cleveland, OH, USA.

    Femoral neck sample, selectively etched to carve out osteocytes, hidden within the bone matrix before. Sample courtesy of M. Knothe Tate, University of New South Wales, Australia, and U. Knothe, Cleveland, OH, USA.
  • High maturity shale rock sample with broad ion beam milled surface. Sample: courtesy of L. Hathon, University of Houston, TX, USA.

    High maturity shale rock sample with broad ion beam milled surface. Sample: courtesy of L. Hathon, University of Houston, TX, USA.

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    ZEISS MultiSEM

    The World’s Fastest Scanning Electron Microscope

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