![ZEISS MultiSEM: Das schnellste Rasterelektronenmikroskop der Welt]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/multisem-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/multisem-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/multisem-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/multisem-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg"} "ZEISS MultiSEM: Das schnellste Rasterelektronenmikroskop der Welt")
ZEISS MultiSEM 505/506
Die schnellsten Rasterelektronenmikroskope der Welt
Entfesseln Sie eine Aufnahmegeschwindigkeit von 91 parallelen Elektronenstrahlen – und bilden Sie Proben im Zentimetermaßstab mit Nanometerauflösung ab. Dieses einmalige Rasterelektronenmikroskop ist für den verlässlichen Dauerbetrieb rund um die Uhr ausgelegt. Richten Sie einfach Ihren durchsatzstarken Datenerfassungs-Workflow ein und MultiSEM nimmt automatisch kontrastreiche Bilder auf.
![Schnitt durch ein Mäusehirn, maximale Aufnahmegeschwindigkeit 1,22 Gigapixel/Sekunde. Mit freundlicher Genehmigung von J. Lichtman, Harvard University, Cambridge, Massachusetts, USA.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original./multisem-benefit1.jpg"} "Schnitt durch ein Mäusehirn")
Revolutionieren Sie die Geschwindigkeit der Elektronenmikroskopie
Mehrere parallel arbeitende Elektronenstrahlen sorgen für eine bislang unerreichte Imaging-Bruttogeschwindigkeit. Die Aufnahme eines Bereichs von 1 mm2 mit 4 nm Pixelgröße dauert nur wenige Minuten. Die konkurrenzlose Aufnahmegeschwindigkeit von mehr als 1 TB pro Stunde ermöglicht die Abbildung großer Volumina (> 1 mm3)in Nanometerauflösung. Optimierte Detektoren erfassen hocheffizient die sekundären Elektronensignale, sodass Sie Bilder mit hohem Kontrast und niedrigem Rauschen erhalten.
Bildbeschreibung: Schnitt durch ein Mäusehirn, maximale Aufnahmegeschwindigkeit 1,22 Gigapixel/Sekunde. Mit freundlicher Genehmigung von J. Lichtman, Harvard University, Cambridge, Massachusetts, USA.
![Abbildung sehr großer Proben in Nanometerauflösung]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original./multisem-benefit2.jpg"} "Abbildung sehr großer Proben in Nanometerauflösung")
Abbildung sehr großer Proben in Nanometerauflösung
Machen Sie keine Abstriche mehr bei der Probengröße, um die Nanometerauflösung zu erzielen. MultiSEM ist mit einem Probenhalter ausgestattet, der einen Bereich von 10 cm × 10 cm abdeckt und für den Dauerbetrieb rund um die Uhr ausgelegt ist. Endlich können Sie die gesamte Probe Abbilden und alles entdecken, was Sie zur Beantwortung Ihrer wissenschaftlichen Fragen benötigen. Sie erhalten das detaillierte Bild, ohne den makroskopischen Kontext zu verlieren.
![Elektronenmikroskopie mit der ZEN Imaging Software]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit3.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit3.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit3.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit3.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit3.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit3.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original./multisem-benefit3.jpg"} "Elektronenmikroskopie mit der ZEN Imaging Software")
Elektronenmikroskopie mit der ZEN Imaging Software
Durch die Einbindung von ZEN in MultiSEM bringen wir die Standardsoftware für ZEISS Lichtmikroskope in die Welt der Elektronenmikroskopie. Sie steuern MultiSEM direkt und intuitiv: Intelligente automatische Abstimmungsroutinen unterstützen Sie beim Erfassen optimaler Bilder in hoher Auflösung und Qualität. So erstellen Sie schnell und einfach selbst komplexe, automatisierte Aufnahmeverfahren, die an die Bildgebung Ihrer Proben angepasst und auf sie abgestimmt sind.
Die ZEISS MultiSEM Produktfamilie
|
MultiSEM 505
|
MultiSEM 506
|
|
|---|---|---|
|
Anzahl der Strahlen |
61 |
91 |
|
Scananordnung |
Bildkachel aus 61 Unterbildern in einem hexagonalen Muster |
Bildkachel aus 91 Unterbildern in einem hexagonalen Muster |
|
Sehfeld mit 12 μm Teilungsgröße |
108 µm |
132 µm |
|
Sehfeld mit 15 μm Teilungsgröße (optional) |
135 µm |
165 µm |
Die Technologie hinter ZEISS MultiSEM
![Mehrere parallele Elektronenstrahlen und Detektoren]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.100.100.file/multisem-beampath.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.360.360.file/multisem-beampath.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.768.768.file/multisem-beampath.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1024.1024.file/multisem-beampath.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1280.1280.file/multisem-beampath.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1440.1440.file/multisem-beampath.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original./multisem-beampath.png"} "Mehrere parallele Elektronenstrahlen und Detektoren")
Mehrere parallele Elektronenstrahlen und Detektoren
MultiSEM arbeitet parallel mit einer großen Zahl von Elektronenstrahlen (grün: Beleuchtungspfad) und Detektoren. Ein fein abgestimmter Detektionspfad (rot) erfasst große Mengen von Sekundärelektronen (SE) für das Imaging. Jeder Strahl führt eine synchronisierte Scanning-Routine an einer Probenposition aus, wodurch sich ein einzelnes Unterbild ergibt. Die Elektronenstrahlen sind in einem hexagonalen Muster angeordnet. Das vollständige Bild wird gebildet, indem alle Bildkacheln miteinander verbunden werden. Für eine schnelle Datenaufzeichnung wird eine parallele Computerkonfiguration verwendet, was für eine hohe Imaging-Gesamtgeschwindigkeit sorgt. Bildaufnahme und Workflow-Kontrolle sind bei MultiSEM vollständig getrennt.
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Automatisierte Schnitte
Schnitte Ihrer in Harz eingebetteten biologischen Gewebe können Sie mit ATUMtome automatisch herstellen. Bis zu 1.000 Serienschnitte sind an einem einzigen Tag möglich.
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Probenbefestigung
Das Schnittband auf einem Siliziumwafer fixieren und die Probe mit einem Lichtmikroskop aufnehmen. Den Wafer zum MultiSEM bringen und anhand der Übersicht durch die Probe navigieren – und Ihr Experiment planen.
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Versuchsaufbau
Sie können Ihr gesamtes Experiment mit einem einzigen Software-Interface einrichten. Sparen Sie Zeit mit der effizienten automatisierten Sektionserkennung, um interessante Probenstellen zu erkennen und anzusteuern.
![Automatisierte Schnitte]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.100.56.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.360.203.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.768.432.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1024.576.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1280.720.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1440.810.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg"} "Automatisierte Schnitte")
![Probenbefestigung]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.100.56.file/multisem-wafer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.360.203.file/multisem-wafer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.768.432.file/multisem-wafer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1024.576.file/multisem-wafer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1280.720.file/multisem-wafer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1440.810.file/multisem-wafer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original./multisem-wafer.jpg"} "Probenbefestigung")
![Versuchsaufbau]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.100.56.431,151,1215,593.file/multisem-software-screenshot.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.360.203.431,151,1215,593.file/multisem-software-screenshot.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.768.432.431,151,1215,593.file/multisem-software-screenshot.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg"} "Versuchsaufbau")
![Probe eines Femurhalses, selektiv geätzt für die Darstellung zuvor in der Knochenmatrix versteckter Osteozyten. Probe mit freundlicher Genehmigung von M. Knothe Tate, University of New South Wales, Australien, und Ulf Knothe, Cleveland, Ohio, USA.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-human-bone.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-human-bone.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-human-bone.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-human-bone.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg"} "Schenkelhals")
![Schnitt durch ein Mäusehirn, maximale Aufnahmegeschwindigkeit 1,22 Gigapixel/Sekunde. Mit freundlicher Genehmigung von J. Lichtman, Harvard University, Cambridge, Massachusetts, USA.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-mouse-brain.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-mouse-brain.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-mouse-brain.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-mouse-brain.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg"} "Schnitt durch ein Mäusehirn")
![Probe von Schiefergestein mit hoher thermischer Reife, Oberfläche mit breitem Ionenstrahl gefräst. Probe mit freundlicher Genehmigung von L. Hathon, University of Houston, Texas, USA.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-shale-rock.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-shale-rock.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-shale-rock.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-shale-rock.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg"} "Probe von Schiefergestein mit hoher thermischer Reife")
![Separatorfolie eines entladenen Akkus mit Ausfällungen, Anodenseite. Bild aufgenommen bei geringer Landeenergie (1 keV) und einer Pixelgröße von 4 nm über ein Sehfeld von 108 μm × 94 μm.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-battery.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-battery.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-battery.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-battery.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg"} "Separatorfolie eines entladenen Akkus mit Ausfällungen, Anodenseite.")
![Integrierter Schaltkreis eines Grafikprozessors (65-nm-Technologieknoten), der durch HF-Ätzung bis auf sein Siliziumsubstrat zerlegt ist.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-processor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-processor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-processor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-processor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg"} "Integrierter Schaltkreis eines Grafikprozessors (65-nm-Technologieknoten)")
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Femoral neck sample, selectively etched to carve out osteocytes, hidden within the bone matrix before. Sample courtesy of M. Knothe Tate, University of New South Wales, Australia, and U. Knothe, Cleveland, OH, USA.
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Schnitt durch ein Mäusehirn, maximale Aufnahmegeschwindigkeit 1,22 Gigapixel/Sekunde. Mit freundlicher Genehmigung von J. Lichtman, Harvard University, Cambridge, Massachusetts, USA.
-
Probe von Schiefergestein mit hoher thermischer Reife, Oberfläche mit breitem Ionenstrahl gefräst. Probe mit freundlicher Genehmigung von L. Hathon, University of Houston, Texas, USA.
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Separatorfolie eines entladenen Akkus mit Ausfällungen, Anodenseite. Bild aufgenommen bei geringer Landeenergie (1 keV) und einer Pixelgröße von 4 nm über ein Sehfeld von 108 μm × 94 μm.
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Integrierter Schaltkreis eines Grafikprozessors (65-nm-Technologieknoten), der durch HF-Ätzung bis auf sein Siliziumsubstrat zerlegt ist.
![Femoral neck sample, selectively etched to carve out osteocytes, hidden within the bone matrix before. Sample courtesy of M. Knothe Tate, University of New South Wales, Australia, and U. Knothe, Cleveland, OH, USA.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.100.67.file/multisem-human-bone.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.360.240.file/multisem-human-bone.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.768.512.file/multisem-human-bone.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1024.683.file/multisem-human-bone.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.853.file/multisem-human-bone.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original./multisem-human-bone.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original./multisem-human-bone.jpg"} "Femoral neck sample")
![Schnitt durch ein Mäusehirn, maximale Aufnahmegeschwindigkeit 1,22 Gigapixel/Sekunde. Mit freundlicher Genehmigung von J. Lichtman, Harvard University, Cambridge, Massachusetts, USA.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-mouse-brain.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-mouse-brain.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-mouse-brain.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg"} "Schnitt durch ein Mäusehirn")
![Probe von Schiefergestein mit hoher thermischer Reife, Oberfläche mit breitem Ionenstrahl gefräst. Probe mit freundlicher Genehmigung von L. Hathon, University of Houston, Texas, USA.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-shale-rock.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-shale-rock.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-shale-rock.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg"} "Probe von Schiefergestein mit hoher thermischer Reife")
![Separatorfolie eines entladenen Akkus mit Ausfällungen, Anodenseite. Bild aufgenommen bei geringer Landeenergie (1 keV) und einer Pixelgröße von 4 nm über ein Sehfeld von 108 μm × 94 μm.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-battery.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-battery.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-battery.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg"} "Separatorfolie eines entladenen Akkus mit Ausfällungen, Anodenseite.")
![Integrierter Schaltkreis eines Grafikprozessors (65-nm-Technologieknoten), der durch HF-Ätzung bis auf sein Siliziumsubstrat zerlegt ist.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-processor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-processor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-processor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg"} "Integrierter Schaltkreis eines Grafikprozessors (65-nm-Technologieknoten)")
Externe Publikationen
- Brain mapping in high resolution (nature.com)
- Connectomics (Cell Press Nucleus)
- High throughput data acquisition with a multi-beam SEM
- Mission (im)possible – mapping the brain becomes a reality
- High-resolution, high-throughput imaging with MultiSEM 505
- Multiple-Beam Scanning Electron Microscopy (Microscopy Today)
- Further advancing the throughput of a multi-beam SEM
Verwandte Anwendungen
Downloads
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ZEISS MultiSEM
The World’s Fastest Scanning Electron Microscopes
Dateigröße: 1 MB
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![Vorschaubild von ZEISS MultiSEM]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/97f06d9c-84d6-4069-ab50-25678d7a1d60/EN_product-info_MultiSEM.pdf.jpg"} "Download ZEISS MultiSEM")
![ZEISS Crossbeam – FIB-SEM für 3D-Analysen und Probenpräparation mit hohem Durchsatz]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original./crossbeam-550-system.jpg"} "ZEISS Crossbeam")
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