Les microscopes électroniques à balayage (MEB) scannent un échantillon à l'aide d'un faisceau d'électrons focalisés et permettent d'obtenir des images contenant des informations sur la topographie et la composition de l'échantillon.
Les CSEM (MEB conventionnels utilisant une source d'électrons thermique) et les FE-SEM (MEB à émission de champ utilisant une source d'électrons à émission de champ) ZEISS garantissent une imagerie en haute résolution et un contraste supérieur des matières.
● Informations en haute résolution sensible à la surface et contraste des matières.
● Largement utilisés pour la nanotechnologie, la recherche sur les matériaux, les sciences de la vie, les semi-conducteurs, les matières premières et l'industrie.
![Scanning Electron Microscopes (SEM)]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.100.33.file/sem-wallpaper-80.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.360.120.file/sem-wallpaper-80.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.768.256.file/sem-wallpaper-80.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.1024.341.file/sem-wallpaper-80.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.1280.427.file/sem-wallpaper-80.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.1440.480.file/sem-wallpaper-80.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original./sem-wallpaper-80.jpg"} "Scanning Electron Microscopes (SEM)")
![ZEISS SmartSEM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo-smartsem-controller.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo-smartsem-controller.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo-smartsem-controller.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg"} "ZEISS SmartSEM")