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ZEISS VersaXRM 5 Insight system displayed with blue and purple light trails on a dark background.
High-value hybrid XRM + microCT solution

ZEISS VersaXRM 5 Insight®

Stay in the flow from efficient sample overview to targeted high-resolution insight with a hybrid XRM + microCT solution engineered for performance.

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Research and analytical teams need both sample context and internal detail, but traditional imaging approaches often force trade-offs between speed, resolution, field of view, and flexibility. ZEISS VersaXRM 5 Insight™ is a high-value hybrid XRM + microCT solution for efficient, insight-driven workflows. It combines microCT-style overview imaging, VersaXRM high-resolution imaging, guided workflows based on human-centered design principles, and AI-assisted reconstruction in a single platform. The result is an efficient path from overview to detail that preserves sample integrity while delivering meaningful 3D insight.

  • Move efficiently from overview to detail

Hybrid XRM + CT capabilities help users start with the full sample, identify regions of interest, and transition to targeted high-resolution imaging while maintaining context.

  • Generate consistent results more efficiently

Guided workflows help users with different experience levels reduce manual steps, work with greater confidence, and accelerate time-to-information.

  • Access true XRM in a high-value package

Bring proven VersaXRM performance to routine and advanced applications with a value-optimized platform engineered for performance.

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Illustration of X-ray beams passing through an objective lens onto a detector, representing high-resolution XRM imaging.

ZEISS VersaXRM 5 Insight Engineered for performance. Optimized for value.

ZEISS VersaXRM 5 Insight provides an accessible entry into true XRM in a high-performance, value-optimized package engineered for performance. Its Insight detector architecture, flat panel overview imaging, Resolution at a Distance (RaaD™) objective-based high-resolution imaging, guided ZEN navx workflows, and deep-learning reconstruction work together to support efficient overview-to-detail imaging. Hybrid XRM + CT capabilities combine broad sample context with targeted high-resolution analysis in a single workflow.

Illustration of a semiconductor sample mounted in a detector, with blue and purple light effects illustrating hybrid XRM and CT imaging.

Hybrid XRM + CT capabilities. One seamless workflow.

VersaXRM 5 Insight combines hybrid XRM + CT capabilities for efficient overview-to-detail imaging across a wide range of sample types and sizes. Begin with a full-sample overview, identify regions of interest, and move into targeted high-resolution XRM imaging while preserving sample context. RaaD technology helps users investigate internal structures in larger or complex samples without unnecessary destructive preparation.

ZEISS imaging software displayed on a monitor, showing a guided scan workflow with scan progress, reconstruction status, and an X-ray image of a sample.

Guided workflows for consistent results across experience levels.

VersaXRM 5 Insight uses guided workflows to enable consistent results for users with different experience levels. ZEN navx® provides parameter guidance, tutorials, 3D navigation, and Volume Scout targeting, while FAST mode enables rapid overview imaging. deep-learning reconstruction improves image quality and throughput, helping users move efficiently from overview scans to targeted high-resolution analysis with greater confidence.

ZEISS imaging software interface showing an X-ray image of an electronic component alongside recommended scan parameters on a scalable imaging platform.

Proven VersaXRM performance on a trusted, scalable platform.

VersaXRM 5 Insight brings proven VersaXRM performance to a trusted, scalable platform engineered for performance and long-term value. It expands access to true XRM, supports routine and advanced applications on one system, improves utilization in shared labs, and provides an expandable path as imaging needs evolve.

Move from overview to high-resolution insight

VersaXRM 5 Insight combines hybrid XRM + CT capabilities with guided operation to support efficient, insight-driven workflows from full-sample overview to targeted high-resolution analysis.

  • Start with the full sample

    3D rendering of a pharmaceutical capsule with a highlighted region of interest alongside progressively higher-magnification X-ray images of individual particles inside the sample.

    Image: Correlate full-sample context with detailed internal structures by moving seamlessly from overview imaging to localized high-resolution analysis.

    Rapidly scan the full sample to establish context, understand internal architecture, and identify structures of interest before moving into high resolution imaging for detailed analysis.

    Use this to:
    • Orient quickly within the sample
    • Understand large-volume internal structure
    • Identify potential defects, interfaces, inclusions, pores, cracks, or regions of interest
    • Establish imaging context before targeted high-resolution investigation

  • Target regions of interest precisely

    ZEN navx software interface displaying a 3D X-ray dataset with multiple orthogonal views, highlighted regions of interest, and Volume Scout navigation tools.

    Image: Navigate within the 3D dataset and target internal regions of interest using ZEN navx and Volume Scout before acquiring higher-resolution images.

    Navigate within 3D datasets and target internal features more efficiently with ZEN navx and Volume Scout.

    Use this to:
    • Select regions of interest directly within 3D data
    • Localize buried structures without destructive sectioning
    • Reduce time spent manually searching for features
    • Improve confidence before higher-resolution imaging

  • Increase detail where it matters

    Aluminum component shown alongside an X-ray overview scan with progressively smaller regions of interest illustrating multiscale imaging using RaaD technology.

    Image: RaaD technology reveals fine internal features while preserving the surrounding sample context, enabling targeted high-resolution imaging without destructive sectioning.

    RaaD technology supports the transition from broad sample understanding to targeted high-resolution imaging while preserving sample context.

    Use this to:
    • Visualize internal structures non-destructively
    • Maintain working distance to accommodate larger or complex samples
    • Reduce the need for trimming, refixturing, or physical cross-sectioning
    • Investigate defects and structural variations in context

  • Generate usable insight efficiently

    Side-by-side comparison of a virtual mouse embryo scan acquired using FAST Mode and a conventional acquisition, demonstrating comparable image quality with reduced scan time.

    Image: deep-learning-assisted reconstruction shortens acquisition time while maintaining image quality, helping researchers generate usable data more efficiently.

    Streamline acquisition and reconstruction with guided workflows and deep-learning-assisted reconstruction tools designed to improve image quality and reduce manual steps.

    Use this to:
    • Improve image usability
    • Reduce acquisition and reconstruction bottlenecks
    • Support higher throughput in shared labs
    • Move from scan setup to interpretation more efficiently

Related applications

ZEISS VersaXRM 5 Insight supports diverse characterization, inspection, and research workflows where non-destructive 3D imaging helps users understand internal structures without losing sample context.
Select a category Materials research
Materials research
Industrial research
Semiconductors & electronics
Life sciences research
Geological research and natural resources
3D rendering of a coin cell battery with a highlighted region of interest and sequential virtual slices showing the internal electrode structure.

Materials research, energy materials & batteries

3D rendering of a coin cell battery with a highlighted region of interest and sequential virtual slices showing the internal electrode structure.

3D rendering of a coin cell battery with a highlighted region of interest and sequential virtual slices showing the internal electrode structure.

Materials research, energy materials & batteries

Understanding how materials evolve, fail, and perform requires insight into internal structures across scales. ZEISS VersaXRM 5 Insight supports non-destructive 3D imaging that helps researchers visualize microstructures, characterize defects, and connect internal architecture to material behavior. From advanced materials development to battery and energy materials research, users can investigate electrodes, particle morphology, cracks, pores, degradation pathways, and material evolution while preserving sample context.

Explore materials research workflows
3D rendering and X-ray overview of an insulin pump demonstrating multiscale imaging from the complete device to targeted internal regions of interest.

Industrial research

3D rendering and X-ray overview of an insulin pump demonstrating multiscale imaging from the complete device to targeted internal regions of interest.

3D rendering and X-ray overview of an insulin pump demonstrating multiscale imaging from the complete device to targeted internal regions of interest.

Industrial research

Accelerate materials development and failure analysis with non-destructive multi-scale imaging. Industrial research teams often need higher-resolution internal information than conventional CT can provide, while still maintaining practical throughput, usability, and return on investment. VersaXRM 5 Insight supports efficient 3D analysis for advanced materials, coatings, catalysts, pharmaceuticals, polymers, metals, and other engineered systems.

Side-by-side 3D rendering and virtual cross-section showing C4 bumps and microbump structures in a smartphone 5G modem package.

Semiconductors & electronics

Side-by-side 3D rendering and virtual cross-section showing C4 bumps and microbump structures in a smartphone 5G modem package.

Side-by-side 3D rendering and virtual cross-section showing C4 bumps and microbump structures in a smartphone 5G modem package.

Semiconductors & electronics

Rapidly localize buried package interconnectors, defects, and reliability risks in complex electronic assemblies. Advanced electronics and semiconductor packaging failure analysis often requires fast, high-resolution, non-destructive imaging of internal structures before destructive cross-sectioning or downstream analysis. VersaXRM 5 Insight helps teams inspect circuit interconnectors, identify buried defects and reliability risks, and move toward root-cause analysis and determination with confidence.

3D reconstruction of a mouse embryo generated from X-ray microscopy data, demonstrating high-quality volumetric imaging with FAST Mode acquisition. Sample courtesy of Dr. Chih-Wei Logan Hsu, Baylor College of Medicine, Houston, TX, USA.

Life sciences research

3D reconstruction of a mouse embryo generated from X-ray microscopy data, demonstrating high-quality volumetric imaging with FAST Mode acquisition.
Sample courtesy of Dr. Chih-Wei Logan Hsu, Baylor College of Medicine, Houston, TX, USA.

3D reconstruction of a mouse embryo generated from X-ray microscopy data, demonstrating high-quality volumetric imaging with FAST Mode acquisition.
Sample courtesy of Dr. Chih-Wei Logan Hsu, Baylor College of Medicine, Houston, TX, USA.

Life sciences research

Preserve biological context while exploring structures across scales. VersaXRM 5 Insight enables non-destructive 3D imaging of biological samples, preserving spatial context and revealing features of interest for subsequent correlative microscopy and volume electron microscopy (vEM) investigations. Together with dedicated acquisition, reconstruction, and visualization software, VersaXRM 5 Insight provides a scalable workflow for imaging core facilities and research labs studying diverse biological samples.

3D rendering of a cylindrical sandstone sample showing the internal distribution of mineral phases and pore structure.

Geological research and natural resources

3D rendering of a cylindrical sandstone sample showing the internal distribution of mineral phases and pore structure.

3D rendering of a cylindrical sandstone sample showing the internal distribution of mineral phases and pore structure.

Geological research and natural resources

Characterize natural materials in 3D while preserving valuable samples. Geoscience, mining, and oil and gas workflows often require internal information about rock fabric, mineral phases, pore networks, inclusions, and fluid pathways. VersaXRM 5 Insight supports non-destructive 3D analysis that can complement established 2D workflows and help users target downstream analysis more efficiently.

Software designed for confident operation

ZEN navx software interface displaying Parameter Guidance with recommended scan settings for image quality, balanced acquisition, and faster scan options.
ZEN navx software interface displaying Parameter Guidance with recommended scan settings for image quality, balanced acquisition, and faster scan options.

Parameter Guidance recommends optimized scan settings based on the sample and imaging objectives, helping users balance image quality, scan time, and throughput.

Parameter Guidance recommends optimized scan settings based on the sample and imaging objectives, helping users balance image quality, scan time, and throughput.

Guided imaging with ZEN navx

ZEN navx supports efficient X-ray microscopy workflows by guiding users through scan setup, parameter selection, sample navigation, and region-of-interest targeting. Built-in guidance helps enable consistent results for users with different experience levels, while experienced users retain access to advanced workflow control.

  • User-centered parameter guidance
  • Built-in tutorials for onboarding and training
  • Volume Scout for 3D region-of-interest targeting
  • SmartShield for sample and system protection
  • Guided and manual workflow options
  • Support for consistent results across users with different experience levels
Virtual slice of a coin cell battery reconstructed using conventional FDK, showing electrode layers, material interfaces, and internal structures with visible image noise and lower contrast.
Virtual slice of a coin cell battery reconstructed using ZEISS DeepRecon Pro, showing electrode layers, material interfaces, and fine internal features with improved contrast, reduced noise, and sharper edge definition.
Virtual slices of a coin cell battery reconstructed using conventional FDK (left) and ZEISS DeepRecon Pro (right). Acquired with a 4x objective at 1.1 µm voxel size, DeepRecon Pro enhances contrast, reduces noise, and improves edge definition, enabling clearer visualization of electrode layers, material interfaces, and fine internal features critical for battery characterization and failure analysis.

Advanced reconstruction for faster, clearer results

Deep-learning-assisted and algorithm-based reconstruction tools help improve image quality, reduce scan time, increase throughput, and address challenging samples without adding unnecessary manual steps. DeepRecon Pro uses deep-learning reconstruction to generate clearer data faster, while DeepScout improves effective resolution across larger overview scans for efficient multi-scale imaging. Materials Aware Reconstruction Solution (MARS) reduces artifacts in complex multi-material samples, PhaseEvolve enhances contrast in low- and medium-density materials, and OptiRecon helps balance image quality and throughput. Together, these technologies help labs adapt reconstruction to the sample, application, and imaging requirements.

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    Stay in the flow from overview to insight

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Services and support

ZEISS service and application support help labs adopt advanced 3D X-ray microscopy with confidence. From onboarding and workflow training to technical support and service plans, ZEISS helps users get value from the system across daily operation, shared lab environments, and evolving application needs.

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Download the VersaXRM 5 Insight technology note

Get an overview of the workflows, imaging approaches, and capabilities used to analyze samples across multiple length scales.

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FAQ

  • ZEISS VersaXRM 5 Insight combines hybrid XRM + CT capabilities for efficient overview-to-detail imaging. Users can begin with a broad microCT-style view of the sample, identify internal regions of interest, and move into targeted high-resolution XRM analysis while maintaining sample context.

  • VersaXRM 5 Insight is a high-value hybrid XRM + microCT solution that combines fast overview imaging with targeted high-resolution XRM analysis in one workflow. Flat panel imaging, RaaD objective-based imaging, guided workflows, and deep-learning-assisted reconstruction help users move efficiently from broad sample context to the internal detail conventional microCT alone may not provide.

  • ZEISS VersaXRM 5 Insight supports a wide range of sample types, including materials, industrial components, batteries, electronics, semiconductor packages, biological samples, geological samples, and other complex structures where internal 3D information is needed without destructive preparation.

  • Users can first scan the full sample to understand internal structure and locate regions of interest. With ZEN navx and Volume Scout, users can navigate within 3D data, select an internal target, and move into higher-resolution imaging without losing the broader sample context.

  • Resolution at a Distance, or RaaD, maintains high-resolution imaging performance while preserving working distance. This helps users image internal structures in larger or more complex samples without unnecessary trimming, refixturing, or destructive preparation.

  • Deep-learning-assisted reconstruction tools such as DeepRecon Pro help improve image quality while reducing scan time. This supports faster time-to-information, higher throughput, and more efficient use of the system in multi-user labs or high-demand imaging environments.

  • Choose ZEISS VersaXRM 5 Insight when you need a high-value hybrid XRM + microCT solution for efficient, insight-driven workflows. It is designed for labs that need accessible entry into true XRM, efficient overview-to-detail imaging, guided workflows for users with different experience levels, and proven VersaXRM performance on a trusted, scalable platform.

  • The system supports non-destructive imaging of intact samples, allowing users to visualize internal structures before destructive preparation or downstream analysis. This helps maintain spatial relationships, reduce preparation-related changes, and support more confident targeting of regions of interest.