![ZEISS SmartPI – Smart Particle Investigator]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.100.33.file/nanoscale-correlative-analysis_wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.360.120.file/nanoscale-correlative-analysis_wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.768.256.file/nanoscale-correlative-analysis_wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.341.file/nanoscale-correlative-analysis_wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.427.file/nanoscale-correlative-analysis_wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.480.file/nanoscale-correlative-analysis_wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original./nanoscale-correlative-analysis_wallpaper.jpg"} "ZEISS SmartPI – Smart Particle Investigator")
Korrelative Analyse im Nanobereich
Speziell auf Ihre Anforderungen abgestimmte Lösungen für die Partikelanalyse
ZEISS Systeme analysieren Partikel auf Ihren Filtern und liefern Ihnen Informationen über die chemische Zusammensetzung des Materials. Verwenden Sie ein Elektronenmikroskop und SmartPI, um Ihre Analyse für bis zu 200.000 Partikel vollständig zu automatisieren. Das korrelative Partikelanalysesystem ist die optimale Lösung für die Verbindung von licht- und elektronenmikroskopischen Analysen. Natürlich unterstützt das System ISO 16232 und VDA 19.
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Schnelle chemische und korrelative Partikelanalyse im Nanobereich
Sie überwachen die technische Sauberkeit Ihrer Komponenten und den Produktionsprozess. Damit sorgen Sie dafür, dass mechanische Komponenten reibungslos funktionieren. Dabei liegt Ihr Augenmerk auf der Vermeidung von Undichtigkeiten durch Risse, der Reduzierung von Verstopfungen von Düsen und Filtern sowie der Vorbeugung von Funktionsstörungen bei Pumpen und Ventilen.
Minimieren Sie Ihre Wartungskosten und maximieren Sie Ihre Betriebszeit.
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ZEISS SmartPI für die vollautomatisierte Partikelanalyse im Nanobereich
Analysieren Sie mit einem Elektronenmikroskop bis zu 200.000 Partikel auf einem Filter und erfahren Sie optional alles, was Sie über die chemische Zusammensetzung des vorliegenden Materials wissen müssen – vollautomatisiert mit SmartPI.
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ZEISS Correlative Particle Analysis
Messen und analysieren Sie in kurzer Zeit bis zu 200 kritische Partikel durch Charakterisierung mit dem Licht- und dem Elektronenmikroskop – schnell und höchst effektiv. Dieses korrelative Partikelanalysesystem für die EDX-Analyse Ihrer Partikel entspricht ISO 16232 und VDA 19.
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg"})
SmartPI
![SmartPI: Automatisierte Partikelanalyse]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.100.100.48,116,1315,1383.file/evo_system_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.360.360.48,116,1315,1383.file/evo_system_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.768.768.48,116,1315,1383.file/evo_system_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1024.1024.48,116,1315,1383.file/evo_system_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg"} "SmartPI: Automatisierte Partikelanalyse")
SmartPI: Automatisierte Partikelanalyse
SmartPI ist ein automatisiertes Partikelanalysewerkzeug für Partikelgrößen im Nanometerbereich, mit dem Sie auch EDX-Analysen durchführen und Daten zur chemischen Zusammensetzung sammeln können. Selbst am Rand liegende Partikel werden richtig gezählt. EDX und SEM lassen sich über ein und dieselbe Benutzeroberfläche bedienen. Mit den verschiedenen Evaluierungsmethoden, Offline-Analysen und dem Ausschluss von Partikeln aus Messungen oder Statistiken können Sie die gewünschten Analyseebenen einstellen und aussagekräftige, gut dokumentierte Berichte erstellen. Rüsten Sie Ihr System mit Correlative Particle Analysis (CAPA) auf.
SmartPI für die automatisierte Partikelanalyse im Nanobereich umfasst:
- Ein Elektronenmikroskop wie EVO, Sigma, MERLIN, ParticleSCAN, JetSCAN
- Die SmartPI Software
CAPA
![Correlative Particle Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.100.56.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.360.203.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.768.432.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1024.576.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1280.720.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1440.810.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1639.922.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg"} "Correlative Particle Analyzer")
Correlative Particle Analyzer
Schnelle Partikelanalyse
- Wählen Sie für die chemische Partikelanalyse ein ZEISS Paket, das hohe Auflösung ermöglicht.
- Erhalten Sie Ihre Ergebnisse bis zu 10× schneller.
- Klassifizieren Sie reflektierende (d. h. metallische) und nicht reflektierende Partikel nach Größe und identifizieren Sie Fasern in Ihrem Lichtmikroskop.
- Steuern Sie dieselben Partikel dann problemlos in Ihrem Elektronenmikroskop an und lassen Sie eine vollautomatisierte EDX-Analyse durchlaufen.
- Fassen Sie die Ergebnisse der Analysen mit dem Licht- und Elektronenmikroskop in einem Bericht zusammen.
- Erfüllen Sie die Normen ISO 16232 und VDA 19 für die Partikelanalyse.
![Correlative Particle Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1820.1365.114,0,1934,1365.file/corrmic_particle-analyzer.jpg"} "Correlative Particle Analyzer")
Der Correlative Particle Analyzer für die Partikelanalyse umfasst:
- Das Elektronenmikroskop EVO MA 10
- Das vollmotorisierte Zoom-Mikroskop Axio Zoom.V16
- Für die Korrelation geeignete Probenträger
- Die AxioVision Correlative Particle Analyzer Software
Produkt-Trailer ansehen
Downloads
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Korrelative Partikelanalyse
Sparen Sie Zeit: Charakterisieren und klassifizieren Sie Partikel nach ISO 16232 mit Licht- und Elektronenmikroskopie
Seiten: 17Dateigröße: 2 MB -
Particle Analyzer
Analysieren Sie kleinste Partikel: Genau und reproduzierbar
Seiten: 19Dateigröße: 5 MB
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Mikroskop- und Messsysteme für Qualitätssicherung und -kontrolle
Erfassen Sie das Wesen Ihres Bauteils: Schnell. Einfach. Übergreifend.
Seiten: 41Dateigröße: 5 MB
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Análise Correlativa de Partículas ZEISS (Portuguese Version)
Caracterize rapidamente e classiique partículas de acordo com ISO 16232 por meio de Microscopia Eletrônica e de Luz
Seiten: 17Dateigröße: 2 MB -
Análisis correlativo de partículas de ZEISS (Spanish Version)
Caracterice y clasifique partículas rápidamente de conformidad con la norma ISO 16232 mediante microscopía óptica y electrónica
Seiten: 17Dateigröße: 3 MB
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![Vorschaubild von Korrelative Partikelanalyse]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/fafe7448-34c7-482b-8e50-072535d49aec/DE_product-info_Correlative-Particle-Analysis_rel-1.1.pdf.jpg"} "Download Korrelative Partikelanalyse")
![Vorschaubild von Particle Analyzer]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/bba1df58-0365-4232-bca0-1226cf55e0a6/DE_product-info_Particle-Analyzer_rel-3-3.pdf.jpg"} "Download Particle Analyzer")
![Vorschaubild von Mikroskop- und Messsysteme für Qualitätssicherung und -kontrolle]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/d9f010e6-a364-45b5-9a1e-8fde0f3c3dbf/DE_solutions-brochure_QAQC-industrial-routine_2.0.pdf.jpg"} "Download Mikroskop- und Messsysteme für Qualitätssicherung und -kontrolle")
![Vorschaubild von Análise Correlativa de Partículas ZEISS (Portuguese Version)]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/2d19f001-4445-410a-8f71-7c578f936662/PT_product-info_Correlative-Particle-Analysis_rel-1.1.pdf.jpg"} "Download Análise Correlativa de Partículas ZEISS (Portuguese Version)")
![Vorschaubild von Análisis correlativo de partículas de ZEISS (Spanish Version)]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/3ccb6b1f-e0fb-436b-806d-7cfaf5aaa945/ES_product-info_Correlative-Particle-Analysis_rel-1.1.pdf.jpg"} "Download Análisis correlativo de partículas de ZEISS (Spanish Version)")