Courtesy of Chih-Wei Logan Hsu, Baylor College of Medicine, Houston, Texas, USA
RWTH Aachen University CARL | October 21 -22, 2026

X-ray Tomography insight symposium

Imaging across scales

Explore Next-Gen 3D X-ray Microscopy, AI Imaging & Connect with the XRM Community

 

Join researchers, imaging experts, and industry professionals at the ZEISS X-ray Tomography Insight Symposium to discover the latest developments in 3D X-ray microscopy, AI-powered image analysis, and correlative workflows.

In collaboration with CARL at RWTH Aachen University, the event brings together scientific presentations, user talks, live demonstrations, and networking opportunities—providing practical insights into cutting-edge applications in Life Sciences and Materials Research.

Poster Slam – Share Your Research

Present your scientific work and exchange ideas with the XRM community. In a short two-minute pitch, showcase your key findings, gain valuable feedback, and expand your professional network. Simply bring your printed poster—no specific format requirements apply.

 

Participation

Participation in the symposium and evening networking event is free of charge. Accommodation and travel arrangements are the responsibility of each participant.

 

  • ◉➤ What to Expect
    • Scientific talks on the latest applications in Life Sciences and Materials Research
    • Live demonstrations on ZEISS X-ray tomography systems
    • Remote insights from the ZEISS Microscopy Customer Center Europe
    • AI-powered image analysis workflows
    • Networking with researchers and imaging experts
    • User presentations and application highlights
  • 🔬 Featured Technologies
    • New 3D X-ray microscopy solutions
    • ZEN navx workflows
    • nanoCT and microCT imaging
    • AI-supported image analysis
    • Next-generation FIB-SEM for structural and correlative workflows
  • 💡Key learnings
    • Understand the latest innovations in ZEISS X-ray microscopy
    • Gain application insights from Life Science and Materials Science case studies
    • Experience ZEISS AI image analysis solutions in live demos and hands-on sessions

Agenda

  • 11 AM

    Welcome

    11.15 AM

    From whole-cell screening and operando experiments to targeted NanoCT and FIB-SEM follow-up
    Dr. Adrian Mikitisin, CARL – Center for Ageing, Reliability and Lifetime Prediction of Electrochemical and Power Electronic Systems, Gemeinschaftslabor für Elektronenmikroskopie, RWTH Aachen

    12 PM

    Lunch

    12.45 PM

    ZEISS VersaXRM 5 Insight – A new Hybrid XRM/CT
    Ian Belding, ZEISS

    1.30 PM

    Applications of a Hybrid XRM/CT in Zoology
    Dr. Karolin Engelkes, Scientific Head of Morphology Laboratory, Leibniz Institute for the Analysis of Biodiversity Change (LIB), Hamburg

    2 PM

    Coffee break

    2.30 PM

    Correlative X-ray CT metrology for 2PP-printed inertial fusion energy targets
    Dr. Fabian Christ M.Sc., Targetry R&D, Focused Energy GmbH, Darmstadt

    3.15 PM

    XRM Service Germany
    Protect, optimize & extend: maximizing the lifetime of your system

    4.15 PM

    Coffee break

    4.45 PM

    ZEISS Crossbeam 750 - FIB-SEM for high throughput sample preparation and 3D analysis
    Remote system demonstration

    5.45 PM

    Poster slam – Short pitches
    Present, connect, inspire your research in a two minute pitch - optional

    6.45 PM

    End day 1

    7 PM

    Social evening & Poster slam
    at CARL, RWTH Aachen University

  • 8.30 AM

    Guided tour of the CARL microscopy and imaging facilities
    Dr. Adrian Mikitisin, CARL – Center for Ageing, Reliability and Lifetime Prediction of Electrochemical and Power Electronic Systems, Gemeinschaftslabor für Elektronenmikroskopie, RWTH Aachen

    9.30 AM

    Experience the workflow in practice - One hour live system demonstrations on-site in groups

    • ZEISS METROTOM 800
      High-precision inspection and metrology of dense materials
    • ZEISS Versa 620
      3D X-ray Imaging at Submicron Resolution
    • ZEISS Crossbeam 350
      Flexible FIB-SEM for multi-user lab applications
    • ZEISS Xradia 810 Ultra
      Synchrotron-quality Nanoscale 3D X-ray Microscope

    Refreshments & networking opportunities included

    10:00 AM – 10:30 AM Coffee break
    12:35 PM – 1:30 PM Lunch 

    3.35 AM

    Farewell

    3.45 PM

    End of symposium

  • ZEISS VersaXRM 5 Insight

    Unlocking deeper insights across scales

    ZEISS Xradia 810 Ultra

    Synchrotron-quality Nanoscale 3D X-ray Microscope

    ZEISS METROTOM 800

    High-precision inspection and metrology of dense materials

    ZEISS Crossbeam 750

    FIB-SEM for high throughput sample preparation and 3D analysis

    Image Analysis

    Extract more from your data

Location

RWTH Aachen University

Center for Ageing, Reliability and Lifetime Prediction of Electrochemical and Power Electronic Systems (CARL) Campus-Boulevard 89 52074 Aachen

Registration

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