Webinar

Extremely Rapid Sample Preparation for EBSD

Using a Femtosecond Laser in the ZEISS Crossbeam Laser

APR 08, 2020 · 23 watch
  • X-Ray Microscopy
  • Metals
  • FIB-SEM Crossbeam
Author

Andy Holwell

Solutions Manager, Steel and Other Metals
Carl Zeiss Microscopy GmbH

Author

Dr. Roger Barnett

Applications Development Engineer,
Steel and Other Metals
Carl Zeiss Microscopy GmbH

Author

Dr. Tim Schubert

Aalen University

Abstract

Extremely Rapid Sample Preparation for EBSD - Using a Femtosecond Laser in the ZEISS Crossbeam Laser

Electron backscatter diffraction (EBSD) is a powerful tool in providing the metals researcher with crystallographic information of the grains and precipitates in metal alloys, so critical in determining the performance and durability of a metal in service. The focused ion beam scanning electron microscope (FIB-SEM) allows three dimensional imaging of the tiniest features and ion milling is a fine operation capable of generating surfaces able to be analyzed by EBSD. The ZEISS Crossbeam Laser is able to rapidly ablate material from samples to access deeply buried features, and this webinar explains how recent research has determined how surfaces can now be prepared through laser ablation alone, and analyzed by EBSD without the need for time-consuming fine polishing. This technique enables rapid analysis of deeply buried features in streamlined workflows.


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