![解锁废弃电子设备、电池和太阳能面板的隐藏潜力]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/mining_e-waste.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/mining_e-waste.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/mining_e-waste.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/mining_e-waste.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/mining_e-waste.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/mining_e-waste.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/mining_e-waste.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/mining_e-waste.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/mining_e-waste.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mining_e-waste.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/mining_e-waste.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mining_e-waste.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/mining_e-waste.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mining_e-waste.jpg"} "城市采矿")
用于自然资源的显微镜解决方案
城市采矿
利用先进的显微技术改善资源回收
通过先进的显微技术，研究人员和行业专家可以深入研究复杂的城市采矿，解锁废弃电子设备、电池和太阳能面板的隐藏潜力。显微分析可表征电子废弃物（如印制电路板、半导体和其他电子元器件）中的各种成分，它们都是贵金属和稀土元素的宝贵来源。在对这些材料进行研究后，研究人员和回收商可以确定有效的提炼和回收方式。此外，显微技术还有助于识别和分析城市采矿残留物（如建筑和拆卸废弃物、市政固体废料和工业副产品）中的颗粒和矿物。这有助于发现有价值或潜在危险的矿物并评估粒度分布和解离特征，从而为分离和加工技术的优化提供支持。
![电子废弃物材料的高分辨率成像]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.100.56.510,17,1421,530.file/urban_mining_phone_mineralogic.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.360.203.510,17,1421,530.file/urban_mining_phone_mineralogic.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.768.432.510,17,1421,530.file/urban_mining_phone_mineralogic.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.911.512.510,17,1421,530.file/urban_mining_phone_mineralogic.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.911.512.510,17,1421,530.file/urban_mining_phone_mineralogic.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.911.512.510,17,1421,530.file/urban_mining_phone_mineralogic.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.911.512.510,17,1421,530.file/urban_mining_phone_mineralogic.jpg"} "电子废弃物材料的高分辨率成像")
![电子废弃物材料的高分辨率成像]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.100.28.file/urban_mining_phone_mineralogic.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.360.100.file/urban_mining_phone_mineralogic.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.768.212.file/urban_mining_phone_mineralogic.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.1024.283.file/urban_mining_phone_mineralogic.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.1280.354.file/urban_mining_phone_mineralogic.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original.image_file.1440.398.file/urban_mining_phone_mineralogic.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/urban_mining_phone_mineralogic.jpg/_jcr_content/renditions/original./urban_mining_phone_mineralogic.jpg"} "电子废弃物材料的高分辨率成像")
电子废弃物表征
扫描电子显微镜（SEM）可对电子废弃物材料进行高分辨率成像，揭示各组分的表面形态和化学元素的分布情况。与能量色散X射线谱（EDS）组合使用时，可为电子废弃物样品中特定组分的识别提供元素分析。此外，蔡司Mineralogic也有其独到之处，其采用全量化EDS分析，并对获取的每个EDS光谱应用内置基质校正和峰值去卷积。随后对这些光谱进行定量处理，以提供每个分析点的测量化学组分，从而可以根据直接测得的存在元素重量百分率进行相分类。之后还可利用蔡司microCT技术实现三维成像，为复杂结构及其空间关系的可视化提供支持。通过这些显微方法，研究人员和环境科学家可以深入了解电子废弃物的复杂性，就回收利用与废弃处置做出明智的决策。
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![蔡司EVO——操作直观的模块化扫描电子显微镜平台，适用于日常检测与研究应用]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/evo_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original./evo_stage.jpg"} "蔡司EVO")
![蔡司GeminiSEM系列]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.100.100.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.360.360.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.768.768.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1353.1353.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1353.1353.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg"} "蔡司GeminiSEM系列")
![蔡司Sigma]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/sigma360-stage.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/sigma360-stage.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/sigma360-stage.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/sigma360-stage.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png"} "蔡司Sigma")
![蔡司Xradia Ultra]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.100.100.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.360.360.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.768.768.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1617.1617.125,114,1742,1731.file/xradia-810-ultra_stage.jpg"} "蔡司Xradia Ultra")
![蔡司VersaXRM 730]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.100.100.26,26,916,916.file/versaxrm_730_zen-navx.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.360.360.26,26,916,916.file/versaxrm_730_zen-navx.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.768.768.26,26,916,916.file/versaxrm_730_zen-navx.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg"} "蔡司VersaXRM 730")
![e-waste Characterization的预览图像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/92961412-06ea-45eb-b922-721dd8025533/EN_wp_Mineralogic_e_waste.pdf.jpg"} "下载e-waste Characterization")