Serial Block Face Imaging of Biological Samples with Your FE-SEM
Combine your Sigma and GeminiSEM with 3View® from Gatan, Inc. to acquire high resolution 3D data from resin-embedded cell and tissue samples. 3View® is an ultramicrotome inside the SEM chamber. The sample is continuously cut and imaged, so you produce thousands of perfectly aligned serial images in a single day. The ZEISS FE-SEMs Sigma and GeminiSEM are ideally suited to support this application, delivering TEM-like image quality from large fields of view.
Your Complete Solution from ZEISS
Your FE-SEMs Sigma and GeminiSEM with integrated 3View® allow you to do block face imaging of even large samples with superb image quality. Use Sigma 3View® with variable pressure for charge neutralization to reduce imaging artifacts. Profit from GeminiSEM 3View® for best low-voltage performance. Enhance GeminiSEM with Focal Charge Compensation to eliminate charging effects. All systems run with excellent long-term stability without any user intervention.
Largest Field of View
ZEISS Gemini technology delivers up to 32,000 × 24,000 pixels in one scan at nanometer resolution. With minimized magnetic field at the sample surface, you image even large fields of view without blurring at the edges. You have to stitch 15 times less, compared to 8k × 8k images. You save time and avoid double exposures. For most applications you won’t need to stitch images at all.
Highest Imaging Speed
With 3View® you get 3D results in shortest time. Speed up your application with the unique high current mode of your Sigma. Even faster: the OnPoint BSE detector and your GeminiSEM deliver highest scan speeds without compromises in resolution. Depending on your application you get your results up to 10 times faster. Overnight instead of over the week!
Caption: 32k x 24k imaging in one scan. Save time stitching of fifteen 8k x 8k images. Avoid double exposures of overlapping stitching zones.
The Technology Behind 3View®
Block Face Imaging
With the ultramicrotome inside your SEM chamber, you cut and image thousands of block faces and reconstruct the data to a complete 3D volume.
Artifact-free Images with Focal Charge Compensation
When imaging resin-embedded samples, you often struggle with specimen charging, resulting in artifacts, degraded image quality and distortion. Using variable pressure SEM can prevent that, but at the expense of signal-to-noise and resolution. Focal Charge Compensation was developed to eliminate specimen charging without degrading quality. A tiny capillary needle guides Nitrogen gas directly onto the sample surface while the chamber maintains high vacuum. The needle retracts automatically during the cutting cycle and does not interfere with image acquisition. This allows you to perform serial block face imaging with high acquisition rates.