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ZEISS EVO - Modular SEM Platform for Intuitive Operation, Routine Investigations and Research Applications
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ZEISS EVO Family Modular SEM Platform for Intuitive Operation, Routine Investigations and Research Applications

The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience that appeals to both trained microscopists and new users. With its comprehensive range of available options, EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis.

  • Versatile solution for central microscopy facilities or industrial quality assurance laboratories
  • Excellent images from any real-world sample
  • Maximum image quality with the lanthanum hexaboride (LaB6) emitter
  • Imaging and analytical excellence on non-conductive and uncoated samples
  • Workflow automation and data integrity

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SmartSEM Touch user interface supports industrial operators who require automated workflows for repeatable inspection tasks.

Class-Leading Usability

SmartSEM Touch puts interactive workflow control directly at your fingertips. It is quick and easy to learn, dramatically reducing training effort and costs. Within minutes, even new users will begin capturing stunning images. This user interface also supports industrial operators who require automated workflows for repeatable inspection tasks.

Flint, ferrocerium particle from a firelighter, imaged with ZEISS EVO, HDBSD detector.

Excellent Image Quality

EVO excels at extracting the maximum data quality from uncoated and unaltered samples. EVO also safeguards data quality on hydrated and heavily contaminated samples, by allowing these samples to remain in their native state. Additionally, the LaB6 emitter will give that extra bit of resolution, contrast and signal-to-noise that is important when imaging and microanalysis get challenging.

Caption:  Flint, ferrocerium particle from a firelighter, imaged with ZEISS EVO, HDBSD detector.

    EVO can be configured to be part of a semi-automated multi-modal workflow, with tools for seamless relocation of regions of interest and integrity of data collected from multiple modalities.

    EVO Plays Well with Others

    EVO can be configured to be part of a semi-automated multi-modal workflow, with tools for seamless relocation of regions of interest and integrity of data collected from multiple modalities. Combine light and electron microscope data for material characterization or parts inspection. Or combine EVO with ZEISS light microscopes for correlative particle analysis.

        Get More Hands on Deck

        Depending on the actual laboratory environment, operation of the SEM can be the exclusive domain of expert electron microscopists. But this situation is challenged by the very common necessity that non-expert users, such as students, trainees, or quality engineers, also require data from the SEM. EVO takes both requirements into account, with user interface options that cater to the operational needs of experienced microscopists as well as non-microscopists.

        Expert users have access to advanced imaging parameters and analysis functions.
        Expert users have access to advanced imaging parameters and analysis functions.
        Novice users have access to predefined workflows and the most frequently used parameters – perfect for a beginner.
        Novice users have access to predefined workflows and the most frequently used parameters – perfect for a beginner.

        Intelligent Navigation and Imaging

        Improve Your Sample Throughput, Productivity and Performance
        • ZEISS Navigation Camera

          ZEISS Navigation Camera

          A camera can be mounted either to the chamber to monitor the position of the samples relative to the pole piece mounted backscattered detector (chamberscope); or on the vacuum chamber door (navigation camera) to enable a helicopter view of the arrangement of samples or parts on the sample holder. This view can then be used to set up predefined locations of interest identified from a light microscope image, and for easy navigation during the entire sample investigation process.

        • ZEISS Automated Intelligent Imaging

          Automated Intelligent Imaging

          EVO enables automated, unattended acquisition of images across sample batches. ZEISS Automated Intelligent Imaging is perfectly suited to routine inspection. It enables the user to define a boundary region, automatically generate regions of interest determined by the required field of view or magnification, and begin automated acquisition. Automated Intelligent Imaging will improve your sample throughput, boosting productivity and performance.

        Take Your Investigation to the Next Level

        Better Data with a Lanthanum Hexaboride (LaB6) Electron Emitter

        Electron emission from a lanthanum hexaboride cathode, rather than a traditional tungsten hairpin filament, provides the reassurance that every extra bit of image quality is there when you need it. And that is a benefit you can put into action in two ways:

        • At equivalent electron probe sizes (i.e. resolution), there is more probe current to work with, which makes image navigation and optimization much easier.
        • At equivalent probe currents (signal-to-noise), the beam diameter is much smaller, resulting in enhanced image resolution.

        EVO Plays Well with Others

        Benefit from Workflow Automation and Correlative Microscopy
        EVO and the ecosystem of ZEN core
        EVO and the ecosystem of ZEN core

        1. post-acquisition analysis, 2. contextual analysis, 3. integrated reporting, 4. automated segmentation

        EVO and the ecosystem of ZEN core: exchange samples and data between, visualize and organize data across scales and modalities, perform metals applications and image analysis based on deep learning.

        Expand Your Possibilities with ZEISS ZEN core

        Your Software Suite for Connected Microscopy and Image Analysis

        With ZEISS being the supplier of microscopy and metrology systems, you can expect EVO to play extremely well with other ZEISS solutions. Establish a highly-productive multi-modal workflow between (digital) light microscopes and EVO. Combine the unique optical contrast methods of your light microscope with the equally unique imaging and analytical methods of your SEM to obtain complementary data, and hence more meaningful information about the material, quality or failure mechanism of your sample.

        Take advantage of ZEN core as your hub for connected microscopy. Customize its functions to your specific applications and define workflows that consider the experience level of the  microscopists in your multi-user environment.

        Enjoy its highlights:

        • Correlative Microscopy: Sample and data exchange between light, digital, and electron microscopes
        • Contextual Data Representation: Data visualization and organization across scales and imaging modalities
        • Metallographic Applications incl. Microsoft Word-based Reporting: Integrated reporting across connected images and datasets
        • Automated Image Analysis: based on deep learning: Image segmentation based on machine learning algorithms.

        EDX Solutions for Microanalysis Applications

        If SEM imaging alone isn’t enough to gain a complete understanding of parts or samples, investigators will turn to Energy Dispersive Spectroscopy (EDS) to acquire spatially resolved elemental chemistry information.
        • ZEISS SmartEDX - Optimized for routine microanalysis applications

          Optimized for Routine Microanalysis Applications

          SEM and EDS have to be paired with careful consideration. SmartEDX on EVO is ideally suited for routine microanalysis applications, particularly for customers with high standards for data reproducibility. It provides highest throughput at 129 eV energy resolution and 1-5 nA probe current – typical EVO operating condition. SmartEDX is optimized to detect low energy X-rays from light elements thanks to superior transmissivity of the silicon nitride window.

          Workflow-guided graphical user interface
          Workflow-guided graphical user interface

          Workflow-guided graphical user interface

          Workflow-Guided Graphical User Interface

          SmartEDX is developed to improve both ease of use and workflow repeatability in multi-user environments. Like other ZEISS workflow-guided software solutions, such as SmartSEM Touch or ZEN core,   for EVO, the SmartEDX software is easy to learn and intuitive to use. It helps ensure repeatable execution of analytical tasks on the SEM, particularly in environments where more than one operator will be using the system. SmartEDX is available either as the best price-performance EDS detector in a fixed configuration, or as the flexible and still convenient slider version.

        • Simplify Operation and collect EDS data more efficiently
          Simplify Operation and collect EDS data more efficiently

          Simplify Operation and collect EDS data more efficiently

          Simplify Operation and Collect EDS Data More Efficiently

          Control both EDS and SEM in parallel using one single PC. This integration improves usability. At the same time, you will enjoy dedicated user interfaces for your microscope and your EDS system. Reduce your EDS acquisition time by leveraging the optimized detector integration that boosts the EDS signal inputs by at least 17%.

          Choose between different EDX detector configurations
          Choose between different EDX detector configurations

          Choose between different EDX detector configurations

          Choose between Different EDX Detector Configurations

          The single PC solution offers you various EDS configurations: the Xplore 15, 30 and the Ultim Max 40 detectors from Oxford Instruments can be ordered.  

        • Streamline the Service of Your SEM and EDS System

          Total ZEISS Service and System Support

          Because SmartEDX is supported entirely by ZEISS, this EDS solution is ideal for customers with a vested interest in streamlining their number of analytical equipment suppliers. All installation, preventive maintenance, warranty, diagnostics and repair, spare part logistics, and inclusion in total system service contracts are fully handled by ZEISS, making support of your analytical SEM solution easy.

        The EVO Family

        ZEISS EVO 10
        ZEISS EVO 15
        ZEISS EVO 25

        Choose EVO 10 with its optional backscatter detector and Element EDS system to be your entry point to scanning electron microscopy, at a remarkable affordable price. Your investment in EVO now assures that you are ready for applications that require more space and ports than you anticipate today.

        EVO 15 excels in analytical applications. Opt for the larger vacuum chamber and benefit from a versatile, multi-purpose solution for central microscopy facilities or industrial quality assurance laboratories.

        EVO 25 is your solution for large samples. Expand its capabilities further adding an optional 80 mm Z travel stage that can handle weights up to 2 kg even with tilt. Additionally, the large chamber will accommodate multiple analytical detectore for the most demanding microanalysis applications.

        Maximum specimen heights

        100 mm

        145 mm

        210 mm

        Maximum specimen diameter

        230 mm

        250 mm

        300 mm

        Motorized stage travel XYZ

        80 x 100 x 35 mm

        125 x 125 x 50 mm

        130 x 130 x 50 (or 80) mm

        Accessories

        An uncoated Radiolaria alga was imaged at 1 keV landing energy. Imaging without beam deceleration shows charging artifacts.
        An uncoated Radiolaria alga was imaged at 1 keV landing energy. After applying beam deceleration, surface details and contrast are improved and charging artifacts are reduced.
        An uncoated Radiolaria alga was imaged at 1 keV landing energy. Imaging without beam deceleration shows charging artifacts (left). After applying beam deceleration, surface details and contrast are improved and charging artifacts are reduced (right).

        Beam Deceleration Imaging

        Use beam deceleration imaging to investigate especially delicate specimens. Gain improved image quality and minimize sample damage. Image non-conducting specimens with higher resolution, more surface sensitivity, and more contrast. A bias voltage is applied to your sample. This reduces the effective landing energy on your sample while the primary energy is kept high.

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        ZEN core for EM

        New SEM Control Software and Entry to Connected Microscopy

        Benefit from this software that is more than just a system control: ZEN core is your single, standardized user interface for basic control of ZEISS SEMs and FIB-SEMs. It introduces intuitive, streamlined imaging, and analytics, and lets you perform correlative, multimodal workflows.

        Your key features are:

        • Easy SEM operation
        • Integration of SEM imaging and EDS analysis
        • Unique entry point to the ZEN core ecosystem
        • Control of basic FIB-SEM workflows including automated multi-site TEM lamella preparation

        Applications

        • Zinc-phosphate E-coating, imaged with SE detector in high vacuum.
        • Car seat cushion foam, imaged uncoated in Variable Pressure mode with the BSE detector.
        • Stainless steel fracture surface, imaged with secondary electrons in high vacuum.
        • Zinc-phosphate E-coating, imaged with SE detector in high vacuum.
          Zinc-phosphate E-coating, imaged with SE detector in high vacuum.

          Zinc-phosphate E-coating, imaged with SE detector in high vacuum.

          Zinc-phosphate E-coating, imaged with SE detector in high vacuum.
        • Car seat cushion foam, imaged uncoated in Variable Pressure mode with the BSE detector.
          Car seat cushion foam, imaged uncoated in Variable Pressure mode with the BSE detector.

          Car seat cushion foam, imaged uncoated in Variable Pressure mode with the BSE detector.

          Car seat cushion foam, imaged uncoated in Variable Pressure mode with the BSE detector.
        • Stainless steel fracture surface, imaged with secondary electrons in high vacuum.
          Stainless steel fracture surface, imaged with secondary electrons in high vacuum.

          Stainless steel fracture surface, imaged with secondary electrons in high vacuum.

          Stainless steel fracture surface, imaged with secondary electrons in high vacuum.

        Manufacturing & Assembly Industries

        • Quality analysis / quality control
        • Failure analysis / metallography
        • Cleanliness inspection
        • Morphological and chemical analysis of particles to meet ISO 16232 and VDA 19 part 1 & 2 standards
        • Analysis of non-metallic inclusions
        • Wire bond inspection using secondary electron imaging in high vacuum or variable pressure mode.
        • Corroded Nickel layer imaged with secondary electrons.
        • SE image revealing whisker growth on an electronic device.
        • Wire bond inspection using secondary electron imaging in high vacuum or variable pressure mode.
          Wire bond inspection using secondary electron imaging in high vacuum or variable pressure mode.

          Wire bond inspection using secondary electron imaging in high vacuum or variable pressure mode.

          Wire bond inspection using secondary electron imaging in high vacuum or variable pressure mode.
        • Corroded Nickel layer imaged with secondary electrons.
          Corroded Nickel layer imaged with secondary electrons.

          Corroded Nickel layer imaged with secondary electrons.

          Corroded Nickel layer imaged with secondary electrons.
        • SE image revealing whisker growth on an electronic device.
          SE image revealing whisker growth on an electronic device.

          SE image revealing whisker growth on an electronic device.

          SE image revealing whisker growth on an electronic device.

        Semiconductors & Electronics

        • Visual inspection of electronic components, integrated circuits, MEMS devices and solar cells
        • Copper wire surface and crystal structure investigation
        • Metal corrosion investigations
        • Cross-sectional failure analysis
        • Bonding foot inspections
        • Capacitor surface imaging
        • Cross section of galvanized mild steel, imaged using the SE detector on EVO 15.
        • Surface of S355 steel after grit blasting with F80 grit alumina.
        • Surface of titanium alloy (Ti-6Al-4V) additively manufactured using selective laser melting showing fully melted regions alongside unmelted Ti-6Al-4V particles and other material.
        • Cross section of galvanized mild steel, imaged using the SE detector on EVO 15.
          Cross section of galvanized mild steel, imaged using the SE detector on EVO 15.

          Cross section of galvanized mild steel, imaged using the SE detector on EVO 15.

          Cross section of galvanized mild steel, imaged using the SE detector on EVO 15.
        • Surface of S355 steel after grit blasting with F80 grit alumina.
          Surface of S355 steel after grit blasting with F80 grit alumina.

          Surface of S355 steel after grit blasting with F80 grit alumina.

          Surface of S355 steel after grit blasting with F80 grit alumina.
        • Surface of titanium alloy (Ti-6Al-4V) additively manufactured using selective laser melting showing fully melted regions alongside unmelted Ti-6Al-4V particles and other material.
          Surface of titanium alloy (Ti-6Al-4V) additively manufactured using selective laser melting showing fully melted regions alongside unmelted Ti-6Al-4V particles and other material.

          Surface of titanium alloy (Ti-6Al-4V) additively manufactured using selective laser melting showing fully melted regions alongside unmelted Ti-6Al-4V particles and other material.

          Surface of titanium alloy (Ti-6Al-4V) additively manufactured using selective laser melting showing fully melted regions alongside unmelted Ti-6Al-4V particles and other material.

        Steel and Other Metals

        • Imaging and analysis of the structure, chemistry and crystallography of metallic samples and inclusions
        • Phase, particle, weld and failure analysis
        • Mineralogic mineral map of blueschist. Sample: courtesy of S. Owen.
        • Residual copper slag particle from large Zambian copper smelter. Sample: courtesy of Petrolab, UK.
        • Peralkaline Granite, Northern Quebec, Canada, containing rare earth elements, including a fluorite vein that crosscuts the sample and zoned zircons.
        • Mineralogic mineral map of blueschist. Sample: courtesy of S. Owen.
          Mineralogic mineral map of blueschist. Sample: courtesy of S. Owen.

          Mineralogic mineral map of blueschist. Sample: courtesy of S. Owen.

          Mineralogic mineral map of blueschist. Sample: courtesy of S. Owen.
        • Residual copper slag particle from large Zambian copper smelter. Sample: courtesy of Petrolab, UK.
          Residual copper slag particle from large Zambian copper smelter. Sample: courtesy of Petrolab, UK.

          Residual copper slag particle from large Zambian copper smelter. Sample: courtesy of Petrolab, UK.

          Residual copper slag particle from large Zambian copper smelter. Sample: courtesy of Petrolab, UK.
        • Peralkaline Granite, Northern Quebec, Canada, containing rare earth elements, including a fluorite vein that crosscuts the sample and zoned zircons.
          Peralkaline Granite, Northern Quebec, Canada, containing rare earth elements, including a fluorite vein that crosscuts the sample and zoned zircons.

          Peralkaline Granite, Northern Quebec, Canada, containing rare earth elements, including a fluorite vein that crosscuts the sample and zoned zircons.

          Peralkaline Granite, Northern Quebec, Canada, containing rare earth elements, including a fluorite vein that crosscuts the sample and zoned zircons.

        Raw Materials

        • Morphology, mineralogy and compositional analysis of geological samples
        • Imaging and analysis of the structure of metals, fractures, and nonmetallic inclusions
        • Morphological and compositional analysis of raw chemicals and active ingredients during micronization and granulation processes
        • Expansion and crack bridging network of self-healing minerals, imaged using SE detector at 12 kV shows flower-like hydro-magnesite structures is formed.
        • Graphene foam structure from a battery assembly, imaged in high vacuum with SE detector.
        • Aerospace composite material imaged with the C2D detector at 10 kV in Variable Pressure mode.
        • Expansion and crack bridging network of self-healing minerals, imaged using SE detector at 12 kV shows flower-like hydro-magnesite structures is formed.
          Expansion and crack bridging network of self-healing minerals, imaged using SE detector at 12 kV shows flower-like hydro-magnesite structures is formed.

          Expansion and crack bridging network of self-healing minerals, imaged using SE detector at 12 kV shows flower-like hydro-magnesite structures is formed.

          Expansion and crack bridging network of self-healing minerals, imaged using SE detector at 12 kV shows flower-like hydro-magnesite structures is formed.
        • Graphene foam structure from a battery assembly, imaged in high vacuum with SE detector.
          Graphene foam structure from a battery assembly, imaged in high vacuum with SE detector.

          Graphene foam structure from a battery assembly, imaged in high vacuum with SE detector.

          Graphene foam structure from a battery assembly, imaged in high vacuum with SE detector.
        • Aerospace composite material imaged with the C2D detector at 10 kV in Variable Pressure mode.
          Aerospace composite material imaged with the C2D detector at 10 kV in Variable Pressure mode.

          Aerospace composite material imaged with the C2D detector at 10 kV in Variable Pressure mode.

          Aerospace composite material imaged with the C2D detector at 10 kV in Variable Pressure mode.

        Materials Science Research

        • Characterization of both conductive and non-conductive material samples for research purposes
        • False-colored image of mildew on the surface of a leaf. Imaged with C2DX detector at 570 Pa water vapor at 1°C, 20 kV.
        • Detail of a pseudoscorpion, imaged with BSE detector under high vacuum at 20 kV.
        • Tree pollen imaged with extended pressure and C2DX detector at near to 100% relative humidity.
        • False-colored image of mildew on the surface of a leaf. Imaged with C2DX detector at 570 Pa water vapor at 1°C, 20 kV.
          False-colored image of mildew on the surface of a leaf. Imaged with C2DX detector at 570 Pa water vapor at 1°C, 20 kV.

          False-colored image of mildew on the surface of a leaf. Imaged with C2DX detector at 570 Pa water vapor at 1°C, 20 kV.

          False-colored image of mildew on the surface of a leaf. Imaged with C2DX detector at 570 Pa water vapor at 1°C, 20 kV.
        • Detail of a pseudoscorpion, imaged with BSE detector under high vacuum at 20 kV.
          Detail of a pseudoscorpion, imaged with BSE detector under high vacuum at 20 kV.

          Detail of a pseudoscorpion, imaged with BSE detector under high vacuum at 20 kV.

          Detail of a pseudoscorpion, imaged with BSE detector under high vacuum at 20 kV.
        • Tree pollen imaged with extended pressure and C2DX detector at near to 100% relative humidity.
          Tree pollen imaged with extended pressure and C2DX detector at near to 100% relative humidity.

          Tree pollen imaged with extended pressure and C2DX detector at near to 100% relative humidity.

          Tree pollen imaged with extended pressure and C2DX detector at near to 100% relative humidity.

        Life Sciences

        • Research into plants, animals and micro-organisms
        • Molten glass solidified on a tungsten fragment indicate the bulb was active at the time of the incident.
        • The C2D detector produces excellent images of uncoated samples in variable pressure mode, perfectly suited to forensic fiber comparisons.
        • The mark from a firing pin on a gun casing can be used to help identify the weapon used.
        • Molten glass solidified on a tungsten fragment indicate the bulb was active at the time of the incident.
          Molten glass solidified on a tungsten fragment indicate the bulb was active at the time of the incident.

          Molten glass solidified on a tungsten fragment indicate the bulb was active at the time of the incident.

          Molten glass solidified on a tungsten fragment indicate the bulb was active at the time of the incident.
        • The C2D detector produces excellent images of uncoated samples in variable pressure mode, perfectly suited to forensic fiber comparisons.
          The C2D detector produces excellent images of uncoated samples in variable pressure mode, perfectly suited to forensic fiber comparisons.

          The C2D detector produces excellent images of uncoated samples in variable pressure mode, perfectly suited to forensic fiber comparisons.

          The C2D detector produces excellent images of uncoated samples in variable pressure mode, perfectly suited to forensic fiber comparisons.
        • The mark from a firing pin on a gun casing can be used to help identify the weapon used.
          The mark from a firing pin on a gun casing can be used to help identify the weapon used.

          The mark from a firing pin on a gun casing can be used to help identify the weapon used.

          The mark from a firing pin on a gun casing can be used to help identify the weapon used.

        Forensics

        • Gunshot residue (GSR)
        • Paint and glass analysis
        • Bank note and coin forgery
        • Hair and fiber comparisons
        • Forensic toxicology

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