Smart Particle Investigator
Your Automated SEM Particle Analysis and Classification Solution
Detect, Analyze and Classify Particles
Smart Particle Investigator (SmartPI), your advanced particle analysis and classification solution, turns scanning electron microscopes into turnkey solutions for industrial cleanliness or metal and steel applications. SmartPI incorporates all aspects of SEM control, image processing and elemental analysis (EDS) within a single application.
- Control both SEM imaging and EDS analysis with one software program.
- Run automated, unattended particle analyses.
- Generate repeatable data and industry-standard compliant reports.
- Combine SmartPI with ZEISS light microscope particle analysis solutions to configure a correlative workflow.
- Benefit from the global ZEISS service and support for the entire system.
- SmartPI is compliant with ISO 16232 and VDA 19 cleanliness standards.
SmartPI at Work
SmartPI performs self-diagnostic and auto-calibration routines before each auto-run and periodically during the run. This ensures system stability, and accurate, repeatable results. Should an interruption occur during the auto-run, for example when a filament replacement is required, an auto-recovery process is initiated.
Morphological and Chemical Classification
SmartPI employs advanced image processing and analysis techniques to measure a variety of morphological characteristics for each particle detected. Subsequently, EDS analysis is used to determine the chemical composition of each particle. Analyze particles rapidly with either Spot Mode or in more detail using the advanced ZEISS Feature Scan Mode. This scans the complete particle shape to provide a more accurate classification.
In order to keep your particle dataset coherent and minimize runtime, SmartPI enables you to exclude particles that are not deemed of interest, from subsequent image and elemental analysis. This could, for instance, be the case for elongated fibers on the filter that may originate from dust in the environment, and hence are unrelated to particles originating from the manufacturing process.
Advanced Stop Criteria
A range of advanced stop criteria allow the auto-run to end the analysis when it reaches a predefined threshold. Stop criteria can include analysis time, number of particles or fields counted, particle size, a specific classification, or other criteria that you can specify. This feature can be applied to single or multiple samples, thereby significantly reducing the overall run-time. A live results window also allows the operator to monitor the progress and decide whether any intervention is required.
Interactive and Retrospective Particle Classification
Use the Review Output mode to refine and improve the classification recipes by making a detailed examination of the results. You can also re-examine any particle by returning the stage to the appropriate particle coordinates. The Retrospective Analysis mode lets you re-evaluate existing results by using new classification criteria – without the need to re-analyze the sample.
This standalone application lets you browse or search the results for individual spectra, particle images, field images, border particles, or other filters you select. In addition, SmartPI Explorer includes options for archiving, as well as an image montage feature for creating a stitched image from the fields analyzed. Explorer also may be used offline to free up system time for analysis.
This standalone application has a number of built-in tools which allow you to construct dedicated reports. You can use drag-and-drop controls, modify an existing report template, or select an ISO or VDA standard report. Once you've defined your report, you can save it as a template for future reports. Use SmartPI Reporter online for immediate report generation or offline when you will be analyzing results at a later time.
Recommended SEM Platforms
EVO Scanning Electron Microscope
EVO is the conventional SEM of choice for use in routine materials analysis or industrial quality assurance and failure analysis. With a large motorized 5 axis stage, and easy-to-use SmartSEM software, EVO offers a highly configurable imaging platform for particle analysis applications. EVO is available with variable pressure (VP), enabling the imaging and analysis of non-conductive samples, such as filters, without the necessity to apply a conductive coating, and thus leaving the filter intact for subsequent analysis using e.g. Raman or FTIR.
Sigma Field Emission Scanning Electron Microscope
Sigma is the SEM of choice for users which require enhanced resolution for particle analysis in the nanometer scale range. Sigma featuring Gemini column technology, provides outstanding imaging and analytical results from a field emission scanning electron microscope (FE-SEM). The Gemini optics provides the highest resolution imaging on a platform very well suited for elemental analysis, particularly on magnetic samples.