Software

ZEISS Solutions Lab

Rapid Application Development

ZEISS Solutions Lab

You have just purchased a new microscopy system from ZEISS, or perhaps multiple systems to deliver a suite of correlated data across length scales. The possibilities are endless and you are anxious to get to work. So where do you begin? Let us help by taking you through a couple of simple questions.

Where do I start if I am looking for a specific solution to my challenge?
You can ask your ZEISS salesperson, or you can skim this site to see what is already available, or you can tell us what you are looking for and we can help you develop it.

What do I look for? First visit our Solutions Lab page.
Skim the page of existing tiles first, or look under your area of research. Skim applications. If you do not find a suitable solution, something close to it may have been created for a similar application in another field. We can get you the rest of the way to your needs. If you still do not find what you are looking for, reach out to us, we may have a solution in development or may be able to easily overcome your challenge with our creative solutions team.

Industrial R&D

  •  ZEISS Phase Contrast Enhancer for XRM

    ZEISS Phase Contrast Enhancer for XRM

    From the Solutions Lab for Metals Part Production

    Remove phase artifacts by explicit modeling of the artifact, then deconvolving it in 3D across an entire volume.

  •  ZEISS Additive Manufacturing Powder Analyzer

    ZEISS Additive Manufacturing Powder Analyzer

    From the Solutions Lab for Metals Part Production

    Entire 3D volumes to be taken from raw data to fully analyzed results in a single click.

  •   ZEISS DeepRecon for X-ray Reconstruction

    ZEISS DeepRecon for X-ray Reconstruction

    From the Solutions Lab for 10X throughput improvement

    For ZEISS Xradia X-ray microscopes for repetitive workflows.

  • ZEISS Calotte Grinding Workflow

    ZEISS Calotte Grinding Workflow

    From the Solutions Lab for Coatings, Films & Surfaces

    Determine the wear resistance of films and surfaces.

  •  ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement

    ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement

    From the Solutions Lab for Coatings, Thin Films and Roughness

    Non-contact height measurement with a light microscope.

Materials Science

  • ZEISS Phase Contrast Enhancer for XRM

    ZEISS Phase Contrast Enhancer for XRM

    From the Solutions Lab for Metals Part Production

    Remove phase artifacts by explicit modeling of the artifact, then deconvolving it in 3D across an entire volume.

  • ZEISS Additive Manufacturing Powder Analyzer

    ZEISS Additive Manufacturing Powder Analyzer

    From the Solutions Lab for Metals Part Production

    Entire 3D volumes to be taken from raw data to fully analyzed results in a single click.

     

  • ZEISS Calotte Grinding Workflow

    ZEISS Calotte Grinding Workflow

    From the Solutions Lab for Coatings, Films & Surfaces

     

    Determine the wear resistance of films and surfaces.

  • ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement

    From the Solutions Lab for Coatings, Thin Films and Roughness

     

    Non-contact height measurement with a light microscope.

Metals

  • ZEISS Dendrite Arm Spacing Workflow

    ZEISS Dendrite Arm Spacing Workflow

    From the Solutions Lab for Measuring Dendrite Arms Using Light Microscopy

    Combined automation through image processing and the ability for manual fine-tuning.

  • ZEISS Point Counting Workflow

    ZEISS Point Counting Workflow

    From the Solutions Lab for light microscopy

    Determine the estimated volume fraction of a certain constituent or phase of interest in a sample.

  • ZEISS Microhardness Workflow

    ZEISS Microhardness Workflow

    From the Solutions Lab for Metals

    The Microhardness Workflow enables metallurgical testing to determine the hardness of a metal.

  • ZEISS Calotte Grinding Workflow

    ZEISS Calotte Grinding Workflow

    From the Solutions Lab for Coatings, Films & Surfaces

    Determine the wear resistance of films and surfaces.

  • ZEISS Pseudo 3D Micrograph Workflow

    ZEISS Pseudo 3D Micrograph Workflow

    From the SolutionsLab to create visualizations of 3D structures from 2D images

    From the SolutionsLab to create visualizations of 3D structures from 2D images

Natural Resources

  • ZEISS Liberation & Surface Exposure Analyzer

    From the Solutions Lab for 3D surface exposure analysis for mining

    Automated particle-by-particle analyses of 3D liberation and surface area for the mining industry.

  • ZEISS Point Counting Workflow

    From the Solutions Lab for light microscopy

    Determine the estimated volume fraction of a certain constituent or phase of interest in a sample.

  • ZEISS Grain Size Color Map Workflow

    From the SolutionsLab for visualizing grain size distribution

    From the SolutionsLab for visualizing grain size distribution.

  • ZEISS Pseudo 3D Micrograph Workflow

    From the SolutionsLab to create visualizations of 3D structures from 2D images

    From the SolutionsLab to create visualizations of 3D structures from 2D images

  • ZEISS DeepRecon for X-ray Reconstruction

    From the Solutions Lab for 10X throughput improvement

    For ZEISS Xradia X-ray microscopes for repetitive workflows.

  • ZEISS Maximum Birefringence Projector

    From the Solutions Lab for mineralogy using light microscopes

    Workflow for mineral classification for automated petrographic light microscopy based on.

Need More Information?

Please contact us using the following form

Problems ​we can help you solve:

  • automation of your imaging process or workflow
  • advanced image analysis and corrections
  • automation of your ROI (region of interest) search
  • tailoring flexible and adaptable workflows for your configuration
  • even, small applications that turn 20 clicks into one

Big problems, little problems. What is your problem? Use the form on this page to tell us more.

You may want to bookmark this site and check back frequently as we are rapidly creating new solutions.

If you want to have more information on data processing at ZEISS please refer to our data privacy notice and legal notice.

Contact ZEISS Microscopy

Contact

/4
Next Step:
  • Step 1
  • Step 2
  • Step 3
Contact us
Required Information
Optional Information

If you want to have more information on data processing at ZEISS please refer to our data privacy notice.