![]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.100.33.file/solution-lab-wallpaper-1.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.360.120.file/solution-lab-wallpaper-1.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.768.256.file/solution-lab-wallpaper-1.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1024.341.file/solution-lab-wallpaper-1.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1280.427.file/solution-lab-wallpaper-1.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1440.480.file/solution-lab-wallpaper-1.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original./solution-lab-wallpaper-1.jpg"})
ZEISS Solutions Lab
Schnelle Applikationsentwicklung
Anwendungsbereich auswählen
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ZEISS Phasenkontrastverstärker für die Röntgenmikroskopie
Aus dem Solutions Lab für die Metallteilefertigung
Phasenartefakte werden durch die explizite Modellierung des Artefakts mit anschließender Dekonvolution in 3D über das Gesamtvolumen entfernt.
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ZEISS Pulveranalyse für die additive Fertigung
Aus dem Solutions Lab für die Metallteilefertigung
Rohdaten von 3D-Gesamtvolumina lassen sich mit nur einem Klick vollumfänglich analysieren.
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ZEISS DeepRecon für die Röntgenrekonstruktion
Aus dem Solutions Lab – für eine 10× Durchsatzsteigerung
Für repetitive Workflows mit ZEISS Xradia Röntgenmikroskopen.
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ZEISS Kalottenschliff-Workflow
Aus dem Solutions Lab für Beschichtungen, Filme und Oberflächen
Für die Bestimmung der Verschleißbeständigkeit von Beschichtungen und Oberflächen.
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Totalinterferenzkontrast (TIC) von ZEISS für Dünnschichtmessungen
Aus dem Solutions Lab für Beschichtungen, Dünnfilme und Rauheit
Berührungslose Höhenmessungen mit dem Lichtmikroskop vornehmen.
![ZEISS Phasenkontrastverstärker für die Röntgenmikroskopie]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.100.56.0,139,662,511.file/ppcf_rawdata.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.360.203.0,139,662,511.file/ppcf_rawdata.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg"} "ZEISS Phasenkontrastverstärker für die Röntgenmikroskopie")
![ZEISS Pulveranalyse für die additive Fertigung]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.100.56.36,0,1885,1040.file/ampa_1.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.360.203.36,0,1885,1040.file/ampa_1.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.768.432.36,0,1885,1040.file/ampa_1.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1024.576.36,0,1885,1040.file/ampa_1.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1280.720.36,0,1885,1040.file/ampa_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1440.810.36,0,1885,1040.file/ampa_1.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1849.1040.36,0,1885,1040.file/ampa_1.jpg"} "ZEISS Pulveranalyse für die additive Fertigung")
![ZEISS DeepRecon für die Röntgenrekonstruktion]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.100.56.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.360.203.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.768.432.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1024.576.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png"} "ZEISS DeepRecon für die Röntgenrekonstruktion")
![ZEISS Kalottenschliff-Workflow]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.100.56.32,0,1396,767.file/calotte_grinding.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.360.203.32,0,1396,767.file/calotte_grinding.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.768.432.32,0,1396,767.file/calotte_grinding.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1024.576.32,0,1396,767.file/calotte_grinding.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1280.720.32,0,1396,767.file/calotte_grinding.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1364.767.32,0,1396,767.file/calotte_grinding.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1364.767.32,0,1396,767.file/calotte_grinding.png"} "ZEISS Kalottenschliff-Workflow")
![Totalinterferenzkontrast (TIC) von ZEISS für Dünnschichtmessungen]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.100.56.0,3,2456,1385.file/tic-crosssection.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.360.203.0,3,2456,1385.file/tic-crosssection.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.768.432.0,3,2456,1385.file/tic-crosssection.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1024.576.0,3,2456,1385.file/tic-crosssection.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1280.720.0,3,2456,1385.file/tic-crosssection.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1440.810.0,3,2456,1385.file/tic-crosssection.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,3,2456,1385.file/tic-crosssection.jpg"} "Totalinterferenzkontrast (TIC) von ZEISS für Dünnschichtmessungen")
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ZEISS Phasenkontrastverstärker für die Röntgenmikroskopie
Aus dem Solutions Lab für die Metallteilefertigung
Phasenartefakte werden durch die explizite Modellierung des Artefakts mit anschließender Dekonvolution in 3D über das Gesamtvolumen entfernt.
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ZEISS Pulveranalyse für die additive Fertigung
Aus dem Solutions Lab für die Metallteilefertigung
Rohdaten von 3D-Gesamtvolumina lassen sich mit nur einem Klick vollumfänglich analysieren.
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ZEISS Kalottenschliff-Workflow
Aus dem Solutions Lab für Beschichtungen, Filme und Oberflächen
Für die Bestimmung der Verschleißbeständigkeit von Beschichtungen und Oberflächen.
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Totalinterferenzkontrast (TIC) von ZEISS für Dünnschichtmessungen
Aus dem Solutions Lab für Beschichtungen, Dünnfilme und Rauheit
Berührungslose Höhenmessungen mit dem Lichtmikroskop vornehmen.
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ZEISS Workflow zur Bestimmung des Dendritenarmabstands
Aus dem Solutions Lab für die Messung von Dendritenarmen per Lichtmikroskopie
Kombinierte Automatisierung durch Bildverarbeitung und Möglichkeit zur manuellen Feinjustierung.
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ZEISS Workflow für die Punktzählung
Aus dem Solutions Lab für die Lichtmikroskopie
Bestimmung des Volumenanteils eines bestimmten Bestandteils oder einer Phase von Interesse in einer Probe.
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ZEISS Workflow zur Bestimmung der Mikrohärte
Aus dem Solutions Lab für Metallurgie und Metalltechnik
Mit dem Workflow zur Bestimmung der Mikrohärte kann durch metallurgische Tests die Härte eines Metalls ermittelt werden.
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ZEISS Kalottenschliff-Workflow
Aus dem Solutions Lab für Beschichtungen, Filme und Oberflächen
Für die Bestimmung der Verschleißbeständigkeit von Beschichtungen und Oberflächen.
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ZEISS Workflow für Pseudo-3D-Gefügebilder
Aus dem Solutions Lab für die Erzeugung von 3D-Strukturen aus 2D-Bildern
Aus dem Solutions Lab für die Erzeugung von 3D-Strukturen aus 2D-Bildern
![ZEISS Workflow zur Bestimmung des Dendritenarmabstands]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.100.56.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.360.203.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.768.432.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1024.576.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1280.720.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1388.781.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1388.781.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg"} "ZEISS Workflow zur Bestimmung des Dendritenarmabstands")
![ZEISS Workflow für die Punktzählung]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.100.56.30,0,1402,772.file/point-counting.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.360.203.30,0,1402,772.file/point-counting.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.768.432.30,0,1402,772.file/point-counting.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1024.576.30,0,1402,772.file/point-counting.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1280.720.30,0,1402,772.file/point-counting.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1372.772.30,0,1402,772.file/point-counting.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1372.772.30,0,1402,772.file/point-counting.png"} "ZEISS Workflow für die Punktzählung")
![ZEISS Workflow zur Bestimmung der Mikrohärte]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.100.56.0,31,1428,834.file/microhardness.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.360.203.0,31,1428,834.file/microhardness.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.768.432.0,31,1428,834.file/microhardness.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1024.576.0,31,1428,834.file/microhardness.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1280.720.0,31,1428,834.file/microhardness.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1428.803.0,31,1428,834.file/microhardness.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1428.803.0,31,1428,834.file/microhardness.png"} "ZEISS Workflow zur Bestimmung der Mikrohärte")
![ZEISS Workflow für Pseudo-3D-Gefügebilder]({"xsmall":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.100.56.0,60,640,420.file/pseudo-3d_micrograph-1.png","small":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.360.203.0,60,640,420.file/pseudo-3d_micrograph-1.png","medium":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","large":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","xlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","xxlarge":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","max":"https://www.zeiss.com/content/dam/z/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png"} "ZEISS Workflow für Pseudo-3D-Gefügebilder")
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ZEISS Herauslösungs- und Oberflächenexpositionsanalyse
Aus dem Solutions Lab für 3D-Oberflächenexpositionsanalyse für den Bergbau
Automatisierte und partikelweise Analyse von Herauslösung und Oberflächenbereichen in 3D für die Bergbauindustrie.
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ZEISS Workflow für die Punktzählung
Aus dem Solutions Lab für die Lichtmikroskopie
Bestimmung des Volumenanteils eines bestimmten Bestandteils oder einer Phase von Interesse in einer Probe.
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ZEISS Workflow für Korngrößen-Farbmappings
Aus dem Solutions Lab für die Visualisierung der Korngrößenverteilung
Aus dem Solutions Lab für die Visualisierung der Korngrößenverteilung
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ZEISS Workflow für Pseudo-3D-Gefügebilder
Aus dem Solutions Lab für die Erzeugung von 3D-Strukturen aus 2D-Bildern
Aus dem Solutions Lab für die Erzeugung von 3D-Strukturen aus 2D-Bildern
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ZEISS DeepRecon für die Röntgenrekonstruktion
Aus dem Solutions Lab – für eine 10× Durchsatzsteigerung
Für repetitive Workflows mit ZEISS Xradia Röntgenmikroskopen.
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ZEISS Projektor für maximale Doppelbrechung
Aus dem Solutions Lab für die lichtmikroskopische Mineralogie
Workflow für die Klassifizierung von Mineralen per automatisierter petrografischer Lichtmikroskopie.
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Dann nehmen Sie über das folgende Formular Kontakt mit uns auf
Probleme, für die wir gemeinsam an Lösungen arbeiten können:
- Automatisierung Ihres Imaging-Verfahrens bzw. -Workflows
- Erweiterte Bildanalysen und -korrekturen
- Automatisierte Suche nach Interessensbereichen
- Einrichtung flexibler, anpassbarer Workflows für Ihre Konfiguration
- Kleine, aber praktische Tools, die Ihnen die Arbeit erleichtern
Ob groß oder klein – wir unterstützen Sie bei jedem Problem. Lassen Sie uns über das nachfolgende Formular wissen, worum es geht.
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