
ZEISS @ Semicon Europa
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💡 Meet us at our booth to experience

Microscopy Systems
Automated workflow for site-specific preparation ideally suited for high resolution TEM and STEM imaging and analysis at atomic resolution. Navigate specimen’s ROI, extract TEM lamella including ROI from bulk sample, perform the bulk milling or trenching step, finalize the workflow with lift-out and thinning where appropriate.

Axio Imager Vario
Analyze smallest MEMS sensors or an entire flat panel. Investigate extremely large specimens simultaneously offering high stability.

Individual software solutions
Optimized and modern infrastructures and environmental architectures in the cleanroom. Connected entire production chains, eliminated ineffective isolated solutions and anchored possibilities for cross-location platform architectures on a cloud basis. Benefit from higher quality, production reliability and more efficient use of resources.