The progress of scientific research and technology development greatly depends upon effective imaging solutions for characterizing the properties and behaviors of materials. Revealing details of microstructure, ideally in 3D, is a critical part of this understanding, whether the goal is to develop and confirm models that describe material properties and behaviors or simply to visualize structural details. ZEISS offers 3D X-ray microscopes (XRM): advanced imaging solutions that have removed major hurdles for three-dimensional imaging by achieving high contrast and submicron resolution imaging even for relatively large samples. These groundbreaking advances in non-destructive, three-dimensional (3D) imaging empower a broad range of technical disciplines.
The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope turret of objectives for easy zooming down past 700nm spatial resolution with minimum achievable voxels of 70nm. The Xradia Ultra family of nanoscale X-ray microscopes is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50nm and minimum achievable voxels of 16nm.
The flagship product of the award-winning Xradia Versa family provides the most advanced and highest performing non-destructive, 3D imaging and analysis capabilities. Xradia 520 Versa extends the boundaries of non-destructive 3D imaging with advanced contrast tuning capabilities, extensive filtering options, and enhancements delivering greater accuracy and workflow.
Based on the award-winning design of its predecessor, Xradia 510 Versa is the foundation of the Xradia Versa family for those who need the highest 3D imaging capability without the advanced features and performance of the flagship product.
Xradia 410 Versa bridges the gap between high-performing 3D X-ray microscopy solutions and traditionally lower-cost, less capable projection-based computed tomography (CT) systems. Multiple source options provide flexibility for imaging a wide range of sample sizes and types.
Xradia 810 Ultra increases the throughput of nanoscale, three-dimensional X-ray imaging by up to a factor of 10. This innovative X-ray microscope (XRM) operates at 5.4 keV, a lower energy that delivers better contrast and image quality for medium to low Z samples and other materials used throughout science and industry.
The revolutionary Xradia 800 Ultra combines a high-flux laboratory X-ray source with highly specialized and proprietary X-ray optics to create a standalone ultra-high resolution X-ray microscope for CT scanning, bridging the gap between existing high resolution imaging modalities such as SEM, TEM or AFM, and optical microscopy or traditional micro-CT.
Powering the world’s leading research facilities, ZEISS has the largest installed base of X-ray microscopes at synchrotrons. Bringing ZEISS X-ray imaging for X-ray nanotomography and fluorescence into your facility enables you to forgo costly and time consuming in-house development.