ZEISS Xradia Crystal CT
Product

ZEISS Xradia CrystalCT

The First Commercial MicroCT Crystallographic Imaging System

ZEISS Xradia CrystalCT uniquely augments the powerful technique of computed tomography with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.

  • Advance materials characterization and discovery through groundbreaking diffraction scanning modes
  • Perform non-destructive mapping of grain morphology in 3D
  • Characterize materials such as metals, alloys, and ceramics
  • Map larger volumes and a wider array of sample geometries at higher throughput
  • Achieve superior sample representivity

Ground-Breaking Diffraction Contrast Tomography (DCT) On a MicroCT

Unlock the crystallographic secrets of your sample in your lab

Al-4wt%Cu sample with gauge section dimension of (length) 1.25 mm, (width) 1.0 mm and (thickness) 0.5 mm Sample scanned using helical phyllotaxis HART

An Expanded Range of Research Possibilities

DCT on a microCT brings the ability to image single-phase polycrystalline materials within reach of technical and industrial research labs, covering a wide range of metal, mineral, ceramic, semiconductor, and pharmaceutical samples in 3D. The purpose-built ZEISS Xradia CrystalCT incorporates precisely designed aperture and beam stop assemblies to harness divergent, polychromatic X-ray beams to illuminate a region of interest and increase sensitivity to weaker diffraction signals of polycrystalline samples.

Al-4wt%Cu sample with gauge section dimension of (length) 1.25 mm, (width) 1.0 mm and (thickness) 0.5 mm. Sample scanned using helical phyllotaxis HART

Achieve superior sample representivity to create high fidelity computational models

Achieve Superior Contrast and Image Quality

ZEISS Xradia CrystalCT advances materials characterization, modeling, and discovery through ground-breaking diffraction scanning modes. Innovative DCT acquisition modes remove the limitations for larger sample sizes, providing you with the ability to research more sample types. Seamless large volume grain mapping enables scanning samples faster and with more accurate representation of data.

Achieve superior sample representivity to create high fidelity computational models

Schematic illustration of CrystalCT projection geometry. CrystalCT delivers dual modalities: absorption contrast tomography and diffraction contrast tomography

A Powerful MicroCT Platform

ZEISS leverages its powerful Xradia technology to deliver world-leading performance on a microCT. With a robust stage, flexible software-controlled source/sample/detector positioning, and a large array detector, you will obtain high-quality, high-resolution scans with best-in-class contrast. ZEISS Xradia CT imaging systems consistently surpass expectations of what a microCT can achieve.

Schematic illustration of CrystalCT projection geometry. CrystalCT delivers dual modalities: absorption contrast tomography and diffraction contrast tomography

Fields of Application

  • 3D grain map of aluminum copper alloy imaged in absorption and diffraction contrast tomography.

    3D grain map of aluminum copper alloy imaged in absorption and diffraction contrast tomography.

    Materials Science

    ✓ Complementary information from high resolution absorption contrast tomography and non-destructive 3D grain mapping delivering size, shape, orientation, and grain boundary information
    ✓ Non-destructive insights into interior microstructures and overlaid grain maps not visible by surface imaging methods such as optical or scanning electron microscopy
    ✓ Ability to segment and analyze data to obtain quantitative, 3D descriptions of structures and particles
    ✓ 4D imaging through ex situ or in situ experiments to see how materials evolve, evolve, through mechanical load or corrosion

  • 3D grain map of an ultra-thin oriented electrical steel sample with dimension of (RD) 4 mm, (TD) 2 mm and (ND) 0.08 mm.

    3D grain map of an ultra-thin oriented electrical steel sample with dimension of (RD) 4 mm, (TD) 2 mm and (ND) 0.08 mm.

    Metals & Minerals

    ✓ Understand grain size and phase evolution in 3D for insight into alloy performance and its dependence on thermal and mechanical processes.
    ✓ Export real 3D structures for physics simulations: predict materials properties (mechanical, thermal, etc.) or digital rock simulations using non-destructive 3D tomography data imaging, characterization, and modeling of rock cores (up to 4”) with high throughput.
    ✓ High contrast 3D imaging for in situ flow studies or 3D mineralogy.

  • 3D grain map of polysilicon materials from a solar panel with height of 30 mm.

    3D grain map of polysilicon materials from a solar panel with height of 30 mm.

    Manufacturing

    ✓ Accommodate a range of sample sizes including large objects in their full 3D context, complementing with 3D grain maps in specific applications.
    ✓ Perform crystallography-based print quality assessment in 3D printed metal parts.
    ✓ High throughput scanning of intact devices with fast time to results.
    ✓ Complement or replace physical cross sectioning and eliminate the need to sacrifice your sample.

  • 2D virtual cross-section and a cutaway view of 3D rendering of a mouse embryo embedded in paraffin.

    2D virtual cross-section and a cutaway view of 3D rendering of a mouse embryo embedded in paraffin.

    Life Sciences

    ✓ Image either stained or unstained hard and soft tissues and biological microstructures with high contrast.
    ✓ Quick, non-destructive verification of sample staining and location of features for subsequent imaging using 3D electron microscopy.

Technology Insights

Super Sample Representivity

Sample representivity – obtaining large volumes of real data to create high fidelity computational models – has been a challenge for crystallographic imaging.

ZEISS Xradia CrystalCT offers advanced DCT modes that overcome some of the previous challenges of conventional DCT data collection that assumes the ROI in the sample is fully illuminated by the aperture field of view (FOV) for all rotational angles of the sample.

ZEISS Xradia CrystalCT advanced diffraction scanning modes include

● Helical Phyllotaxis
   Helical phyllotaxis rotation is used for long aspect ratio cylindrical samples.
● Helical Phyllotaxis Raster
   Helical phyllotaxis raster is used for samples that are typically wider than the field of view.
● Helical Phyllotaxis HART
   Phyllotaxis with high aspect ratio tomography, or HART, solves the problem of flat or plate-like sample imaging.

  • 3D Grain Reconstruction
    3D Grain Reconstruction

    3D Grain Reconstruction

    Fast, Precise, Automated Grain Data Indexing

    After the first step in your workflow of initial acquisition you can then begin to reconstruct. Load your absorption tomography and your diffraction data into GrainMapper3D. Let it identify potential candidates for grain orientations of a given polycrystal by using back and forward projections.

    An automated, iterative search for grains in the sample volume is your next step. Grain reconstruction results are stored as stacks of slices or volume datasets that contain the full description of the indexed grains. Eventually, share 3D CrystalCT results with your collaborators or customers using the standalone GrainMapper3D Viewer application.

  • 3D Grain Mapping
    3D Grain Mapping

    3D Grain Mapping

    All Your Information in One File

    Your final step is to get out all the information you need in one single file. Shape, orientation and spatial locations of all grains in the sample volume are exported into an open data format.

    Finish your experiment with subsequent analyses using customized software or simulation tools. The advanced indexing routines now support the more complex lower symmetry crystal systems.

  • Scout-and-Scan Control System
    Scout-and-Scan Control System

    Scout-and-Scan Control System

    Scout-and-Scan Control System

    Easily scout a region of interest and specify scanning parameters within the Scout-and-Scan Control System. Take advantage of the easy-to-use system in your central lab where users may have a variety of experience levels.

    Benefit from:

    ● Internal camera for sample viewing
    ● Recipe control (set, save, recall)
    ● Multiple energies
    ● Multiple samples with Autoloader option
    ● Micropositioning capability with a simple mouse click

Accessories

Upgrade your microscope with additional accessories to enhance its capabilities

3D X-ray dataset of a camera lens acquired using ZEISS Xradia 620 Versa and DeepRecon Pro.
3D X-ray dataset of a camera lens acquired using ZEISS Xradia 620 Versa and DeepRecon Pro.

Advanced Reconstruction Toolbox

Higher Throughput with Image Quality

Artificial intelligence (AI)-driven reconstruction technologies for your ZEISS Xradia systems. A deep understanding of both X-ray physics and applications enable you to solve some of the hardest imaging challenges in new and innovative ways.

Autoloader option enables you to program up to 70 samples at a time to run sequentially.
Autoloader option enables you to program up to 70 samples at a time to run sequentially.

Autoloader

Maximize Your Instrument’s Utilization

Maximize use and minimize user intervention with the optional ZEISS Autoloader. Reduce the frequency of user interaction and increase productivity by enabling multiple jobs to run. Load up to 14 sample stations, which can support up to 70 samples, queue, and allow to run all day, or off-shift.

In Situ Interface Kit
In Situ Interface Kit

In Situ Interface Kit

Push the Limits of Scientific

ZEISS Xradia platforms can accommodate a variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages, to user-customized designs. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments.

Lithium ion battery
Lithium ion battery

Lithium ion battery

Visualization and Analysis

ZEISS Recommends Dragonfly Pro

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.​ Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.

Downloads

    • ZEISS Xradia CrystalCT

      Unlock the crystallographicand microstructural secretsof your samples.

      Pages: 32
      File size: 10 MB
    • Flyer: ZEISS Xradia CrystalCT

      World’s first crystallographic imaging microCT for academic and industrial applications.

      Pages: 2
      File size: 1 MB

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