ZEISS X-ray Tomography Solutions
High Resolution 3D X-ray Microscopy and Computed Tomography
The progress of scientific research and technology development greatly depends upon effective imaging solutions for characterizing the properties and behaviors of your materials. Revealing details of microstructure, ideally in three dimensions (3D), is a critical part of your understanding, whether your goal is to develop and confirm models that describe material properties and behaviors or simply to visualize structural details. ZEISS offers 3D X-ray microscopes (XRM): advanced imaging solutions that have removed major hurdles for three-dimensional imaging by achieving high contrast and submicron resolution imaging even for your relatively large samples. These groundbreaking advances in non-destructive, 3D imaging empower a broad range of technical disciplines.
The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope turret of objectives for easy zooming down past 700nm spatial resolution with minimum achievable voxels of 70nm. The Xradia Ultra family of nanoscale X-ray microscopes is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50nm and minimum achievable voxels of 16nm.
ZEISS Xradia 520 Versa
The flagship product of the award-winning Xradia Versa family provides the most advanced and highest performing non-destructive, 3D imaging and analysis capabilities. Xradia 520 Versa extends the boundaries of non-destructive 3D imaging with advanced contrast tuning capabilities, extensive filtering options, and enhancements delivering greater accuracy and workflow Now with FPX flat panel extension!
ZEISS Xradia 510 Versa
Based on the award-winning design of its predecessor, Xradia 510 Versa is the foundation of the Xradia Versa family for those who need the highest 3D imaging capability without the advanced features and performance of the flagship product Now with FPX flat panel extension!
ZEISS Xradia 410 Versa
Xradia 410 Versa bridges the gap between high-performing 3D X-ray microscopy solutions and traditionally lower-cost, less capable projection-based computed tomography (CT) systems. Multiple source options provide flexibility for imaging a wide range of sample sizes and types
ZEISS Xradia 810 Ultra
Xradia 810 Ultra increases the throughput of nanoscale, three-dimensional X-ray imaging by up to a factor of 10. This innovative X-ray microscope (XRM) operates at 5.4 keV, a lower energy that delivers better contrast and image quality for medium to low Z samples and other materials used throughout science and industry.
ZEISS Xradia 800 Ultra
The revolutionary Xradia 800 Ultra combines a high-flux laboratory X-ray source with highly specialized and proprietary X-ray optics to create a standalone ultra-high resolution X-ray microscope for CT scanning, bridging the gap between existing high resolution imaging modalities such as SEM, TEM or AFM, and optical microscopy or traditional micro-CT
ZEISS Xradia Synchrotron Family
Xradia Synchrotron solutions bring nanoscale X-ray imaging to your synchrotron facility, enabling you to forgo costly and time consuming in-house development. Proprietary X-ray optics and a proven 3D X-ray microscopy platform leverage the ultra-bright, tunable X-ray beams available at modern synchrotron facilities
ZEISS Xradia Context microCT
ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system. With a robust stage and flexible software-controlled source/detector positioning, you can image large, heavy (25 kg), and tall samples in their full 3D context, as well as small samples with high resolution and detail.
Industrial Computed Tomography Solutions
Industrial computed tomography (CT) gives you entirely new insights by making it possible to capture the volume of all internal structures in next to no time. ZEISS is a pioneer in fast CT and enables the complete volume-based inspection of components during the production cycle.