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ZEISS X-ray Tomography Solutions

High Resolution 3D X-ray Microscopy and Computed Tomography

  • Characterize the properties and behaviors of your materials non-destructively.
  • Reveal details of microstructures in three dimensions (3D).
  • Develop and confirm models or visualize structural details.
  • Achieve high contrast and submicron resolution imaging even for relatively large samples.

Xradia Versa
Xradia Ultra
Xradia Context microCT
Xradia CrystalCT
Industrial Computed Tomography
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Xradia Versa

The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope objective turret to enable increased magnification on various sample types and sizes, and push spatial resolution down to 500 nm with minimum achievable voxels of <40 nm.

Xradia 610 & 620 Versa

3D X-ray Microscopy for Faster Sub-Micron Imaging of Intact Samples

Expand the boundaries of your non-destructive sub-micron scale imaging built on industry-best resolution and contrast.

Xradia 510 Versa

Your 3D Submicron Imaging System with Breakthrough Flexibility

Combine high resolution and contrast with flexible working distances to extend the power of non-destructive imaging.

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Xradia 410 Versa

Your Workhorse Solution for 3D Submicron Imaging

Bridge the gap between high-performing 3D X-ray microscopy and less capable projection-based computed tomography.

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Xradia Ultra

The Xradia Ultra family of nanoscale X-ray microscopes is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50 nm and minimum achievable voxels of 16nm.

Xradia 810 Ultra

Synchrotron-quality Nanoscale 3D X-ray Imaging

Achieve spatial resolution down to 50 nm and experience unparalleled performance with non-destructive 3D imaging.

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Xradia 800 Ultra

Non-destructive 3D Imaging System with Ultra-high Resolution

Bridge the gap between high resolution imaging modalities such as SEM, TEM or AFM, and traditional micro-CT.

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Xradia Synchrotron Family

Nanoscale X-ray Microscopy for Synchrotrons

Bring nanoscale X-ray imaging to your synchrotron facility, and forgo costly and time consuming in-house development.

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Xradia Context microCT

ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system with a robust stage and flexible software-controlled source/detector positioning.

Xradia Context microCT

Your X-ray System for Today with Assurance for Tomorrow

Image large, heavy (25 kg), and tall samples in their full 3D context, as well as small samples with high resolution.

Xradia CrystalCT

Uniquely augments the powerful technique of computed tomography with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials can be studied.

Xradia CrystalCT

The World’s First Commercially Built Laboratory Diffraction Contrast Tomography (DCT) on a MicroCT

Reveal crystallographic grain microstructure to study polycrystallines. Powerful Xradia microCT platform.

Industrial Computed Tomography

Industrial computed tomography (CT) gives you entirely new insights by making it possible to capture the volume of all internal structures in next to no time. ZEISS is a pioneer in fast CT and enables the complete volume-based inspection of components during the production cycle.

Industrial Computed Tomography Solutions

The ZEISS CT Solutions Portfolio for Quality Assurance in Manufacturing Industries

Capture the volume of internal structures of larger parts and components in next to no time during the production cycle.

Not all products are available in every country. Use of products for medical diagnostic, therapeutic or treatment purposes may be limited by local regulations. Contact your local ZEISS provider for more information.

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