- Characterize the properties and behaviors of your materials non-destructively.
- Reveal details of microstructures in three dimensions (3D).
- Develop and confirm models or visualize structural details.
- Achieve high contrast and submicron resolution imaging even for relatively large samples.
The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope objective turret to enable increased magnification on various sample types and sizes, and push spatial resolution down to 500 nm with minimum achievable voxels of <40 nm.
The Xradia Ultra family of nanoscale X-ray microscopes is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50 nm and minimum achievable voxels of 16nm.
ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system with a robust stage and flexible software-controlled source/detector positioning.
Uniquely augments the powerful technique of computed tomography with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials can be studied.
Industrial computed tomography (CT) gives you entirely new insights by making it possible to capture the volume of all internal structures in next to no time. ZEISS is a pioneer in fast CT and enables the complete volume-based inspection of components during the production cycle.
Not all products are available in every country. Use of products for medical diagnostic, therapeutic or treatment purposes may be limited by local regulations. Contact your local ZEISS provider for more information.