ZEISS Xradia 510 Versa

Your 3D Submicron Imaging System with Breakthrough Flexibility

ZEISS Xradia 510 Versa

Break the one micron resolution barrier with this X-ray microscope for 3D imaging and in situ / 4D investigations.

Use the combination of resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab.

Benefit from its architecture that uses a two-stage magnification technique to achieve submicron resolution at a distance (RaaD). Reducing dependence upon geometric magnification maintains submicron resolution even at large working distances.


Enjoy versatility even at large working distances from the source - from millimeters m to centimeters.
  • Perform 3D Imaging for soft or low-Z materials with advanced absorption and innovative phase contrast
  • Achieve world-leading resolution at flexible working distances beyond the limits of projection-based micro-CT
  • Resolve submicrometer-scaled features for diverse sample sizes
  • Extend non-destructive imaging in your lab with an in situ / 4D solution
  • Investigate materials in native-like environments over time

Application Examples

ZEISS Xradia 510 Versa

Materials Research

Typical tasks and applications
  • Visualizing cracks in soft composite materials or measuring porosity in steel
  • Perform in situ studies by imaging under varying conditions such as tensile, compression, gas, oxidation, wetting and temperature variations
  • Image materials that are incompatible with vacuum and charged particle beams
  • View into deeply buried microstructures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM
  • Maintain resolution at a distance for in situ imaging experiments, allowing you to study a wide variety of sample sizes and shapes using various in situ apparatus
  • Understand the impact of these varying conditions over time with the non-destructive nature of X-rays
Porous Polymer with Fluid Flow
Very soft porous polymer with urethane backbone. High contrast imaging of low Z materials in situ with varying temperatures and compression. Simulation of fluid flow demonstrates absolutely the permeability of the sample.

Application Video

Sintered Powder Steel

Non-destructive 3D imaging is crucial for additive manufacturing development. A powder stainless steel sample was laser-sintered and imaged by ZEISS Xradia 520 Versa. From the 3D dataset, the non-sintered solid phase was virtually segmented and volume quantified. XRM also provides ability to do interior tomography and look at virtual cross-sections without damage to the sample. Sample courtesy of NIST.

Life Sciences

Typical tasks and applications
  • Perform histologies virtually and visualize cellular and subcellular features
  • Expand your views in developmental biology with high resolution, high contrast images of cellular and subcellular structures
  • Image large intact samples such as brains or large bones
  • Achieve high resolution and high contrast for unstained and stained tissue
  • Investigate hard and soft tissues and biological microstructures
Mite on Spider in Amber
Mite on Spider in Amber

Raw Materials

Typical tasks and applications
  • Characterize heterogeneity at core plug scale and quantify pore structures
  • Measure fluid flow, analyze texture, and understand dimensional classification
  • Study carbon sequestration efforts
  • Advance mining processes: analyze tailings to maximize mining efforts; conduct thermodynamic leaching studies; perform QA/QC analysis of mining products such as iron ore pellets
  • Benefit from getting the most accurate 3D submicron support for digital rock simulations, in situ multiphase fluid flow studies, 3D mineralogy, and laboratory-based diffraction contrast tomography (LabDCT)
  • Perform multi-scale imaging, characterization and modeling of large (4" core) samples at high throughput
Shale with Pore Connectivity
Shale with Pore Connectivity


Typical tasks and applications
  • Optimize your process development and analyze failures by using non-destructive submicron imaging of intact packages for defect localization and characterization
  • Measure buried features in three dimensions or study package reliability
  • Benefit from high resolution and non-destructive imaging for 3D submicron imaging that complements or replaces physical cross sectioning methods
  • Work efficiently in a single tool workflow with high throughput macro-scanning of an intact device
  • Non-destructively scout-and-zoom from module to package to interconnect for submicron imaging of defect re-localization and characterization with a fast time to results that complements or replaces physical cross-sectioning
Package-on-Package Assembly
Package-on-Package Assembly



Results 4X faster in 4 easy steps

ZEISS OptiRecon is an implementation of iterative reconstruction, allowing the user the optimal selection of speed or image quality, for the Versa X-ray microscope (XRM). It allows you to achieve the same image quality with about one quarter of the data acquisition time for many samples typically found in the oil and gas, mining and metals industries. Similarly, for many applications where it is currently difficult to achieve good image quality in a familiar data acquisition time, ZEISS OptiRecon can greatly improve results.

ZEISS OptiRecon features a proprietary, efficient implementation that allows you to reconstruct a standard dataset of 1024 x 1024 x 1024 voxels in about three minutes, substantially faster than typical. Normally, iterative reconstruction requires a skilled user and the expertise to fine-tune processing parameters for each dataset. ZEISS OptiRecon has a workflow-based user interface with easy to use parameter tuning that does not require specific expertise in tomographic reconstruction.

Typical new users find they are able to set-up full reconstructions of a standard dataset in fewer than 10 minutes.

Use ZEISS OptiRecon for your digital rock or mineral liberation analyses based on your priority of speed or image quality. ZEISS OptiRecon opens new opportunities for dynamic in situ experimentation at a previously inaccessible temporal resolution.

In Situ experiments

Push the limits for scientific advancement

Tensile testing of laser welded steel under increasing load.
Tensile testing of laser welded steel under increasing load.

ZEISS Xradia Versa provides the industry’s premier 3D imaging solution for the widest variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages.

To accommodate various types of in situ apparatus, such experiments require samples to be mounted further away from the X-ray source. With traditional microCT systems, this significantly limits the resolution achievable during such measurements. ZEISS X-ray microscopes are uniquely capable of Resolution at a Distance (RaaD) technology, which give the highest fidelity of 3D structural information during in situ imaging.


Increase your sample handling efficiency

Autoloader option enables you to program up to 70 samples at a time to run sequentially.
Autoloader option enables you to program up to 70 samples at a time to run sequentially.

Maximize your instrument's utilization with the optional Autoloader, available for all instruments in the ZEISS Xradia Versa series. Reduce the frequency of user interaction and increase productivity by queueing multiple jobs. Load up to 14 sample stations, which can support up to 70 samples, and set to run overnight, or across multiple days. Unprecedented mechanical stability enables high volume quantitative repetitive scanning of like samples.

Wide Field Mode

Flexibly image larger samples

Image large samples with Wide Field Mode such as this 6” stereo speaker.
Image large samples with Wide Field Mode such as this 6” stereo speaker.

Wide Field Mode (WFM) can be used to image across an extended lateral field of view. The wide lateral field of view can provide 3x larger 3D volume for large samples, or give a higher voxel density for a standard field of view. All Xradia Versa systems are capable of WFM with the 0.4x objective. The Xradia 620 Versa system also features WFM with the 4x objective. In combination with Vertical Stitching, WFM enables you to image larger samples at exceptional resolution.


Create Efficient Workflows by Using The Simple Control System

Easily scout a region of interest and specify scanning parameters within the Scout-and-Scan Control System. Take advantage of the easy-to-use system in your central lab where users may have a variety of experience levels.

Benefit from:

  • Internal camera for sample viewing
  • Recipe control (set, save, recall)
  • Multiple energies
  • Multiple samples with Autoloader option
  • Micropositioning capability with a simple mouse click
Scout-and-Scan Control System
Scout-and-Scan Control System
Spotted skimmer dragonfly
Spotted skimmer dragonfly

Visualization and Analysis Software ZEISS recommends Dragonfly Pro from Object Research Systems (ORS)

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.


ZEISS Xradia 510 Versa

Submicron X-ray Imaging: Maintain High Resolution Even at Large Working Distances

pages: 14
file size: 1725 kB

ZEISS Xradia Versa Family

Your 3D X-ray Microscope for Advanced Discovery

pages: 2
file size: 807 kB

ZEISS Xradia Versa with FPX

Larger samples, higher throughput

pages: 2
file size: 1729 kB

Iterative Reconstruction

for Optimized Tomographic Imaging

pages: 7
file size: 1525 kB

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