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Scanning Electron & Ion Microscopes

For Scientific and Routine Research

Scanning Electron Microscopes
FIB-SEM
Multiple Ion Beam Microscopy
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Uncoated anti-inflammatory drug shows surface detail at 10 kV and 35 Pa chamber pressure with C2D.

Scanning Electron Microscopes

(SEM)

Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and get images with information about the samples’ topography and composition.
CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.

  • High resolution surface sensitive information and materials contrast.
  • Widely used in nanotechnology, materials research, life sciences, semiconductor, raw materials and industry.

Systems

GeminiSEM Family – FE-SEM

For Highest Demands in Sub-nanometer Imaging, Analytics and Sample Flexibility​

Sub-nanometer resolution below 1 kV – benefit from high detection efficiency and excellent analytical performance.​

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Sigma Family - FE-SEM

High Quality Imaging and Advanced Analytical Microscopy

Combine field emission SEM (FE-SEM) technology with advanced analytics and profit from the Gemini electron optics.

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EVO Family

Conventional SEM – CSEM

Modular SEM Platform for Intuitive Operation, Routine Investigations and Research Applications.

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MultiSEM 505/506

The World’s Fastest Scanning Electron Microscopes

Acquisition speed of up to 91 parallel electron beams. Samples in the centimeter – scale at nanometer resolution.

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SmartSEM

Your software solution for SEM, FE-SEM and FIB-SEM

Use SmartSEM to fully control all operational parameters.

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Atlas 5

Master your multi-scale challenge

Large area imaging and sample-centric correlative workflows for ZEISS SEM and FIB-SEM microscopes.

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Solutions

3View® – an Ultramicrotome Inside the SEM Chamber

Perform Block Face 3D Imaging of Your Biological Samples with Nanometer Resolution

Repeatedly cut and image your resin embedded cell and tissue samples.

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© E-beam induced platinum needles

Focused Ion Beam Scanning Electron Microscopes

(FIB-SEM)

Speed up nanotomography and nanofabrication applications.
ZEISS FIB-SEMs let you benefit for processing and sample preparation on a nanoscopic scale for materials in life sciences as well as in industry.

  • Combine 3D imaging, analysis and material processing
  • Profit from a next-generation FIB when preparing your sample
  • Enjoy real-time interaction and perform imaging and milling simultaneously

Crossbeam Family

High Throughput 3D Analysis and Sample Preparation

Speed up ion beam milling or material removal for tomography and experience best 3D resolution in your FIB-SEM analysis.

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Customized Tools

Individual Products & Solutions

Let our example customized solutions based on Crossbeam and Merlin platforms inspire you.

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Tectorial membrane

Multiple Ion Beam Microscopy

Your 3-in-1 Ion Microscope for Sub-10nm Nanostructuring

ORION NanoFab Helium Ion Microscope
The only system in the world that uses gallium, neon and helium ion beams integrated in a single instrument.

  • Image with sub-nm resolution, high surface sensitivity and depth of field
  • Fabricate sub-10nm nanostructures with speed and precision
  • Seamlessly switch between gallium, neon and helium beams  

ORION NanoFab

Your Instrument for High Resolution Imaging and Sub-10nm Fabrication

Move beyond sub-10nanometer imaging of charged specimens and nanofabrication applications.

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Upgrades

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