Microscopes for Electron Microscopy Sciences
SEM

Scanning Electron Microscopes

Scanning Electron Microscopes (SEM)

Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and deliver images with information about the samples’ topography and composition. CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from Zeiss deliver high resolution surface information and superior materials contrast. Select your SEM out of a comprehensive portfolio of systems.

GeminiSEM

Experience effortless imaging. With this scanning electron microscope you benefit from sub-nanometer resolution and high detection efficiency. Its variable pressure mode makes you feel like you’re working in a high vacuum environment.

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Sigma Family

Combine field emission SEM (FE-SEM) technology with advanced analytics. Image particles, surfaces, and nanostructures. Save time with the semi-automated 4-step workflow of Sigma.

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EVO Family

The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience. EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis.

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MultiSEM 505/506

With MultiSEM you unleash the acquisition speed of up to 91 parallel electron beams. Now, you can image samples in the centimeter – scale at nanometer resolution

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MERLIN for Life Science

MERLIN is the ideal solution for complete image analysis and characterization of biological samples. With the highest beam current in a nanometer size spot, MERLIN provides the fastest imaging of large fields of view at FE-SEM resolution

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MERLIN for Materials

MERLIN with the GEMINI II column combines ultra fast analytics, high resolution imaging using advanced detection modes, and future assured configuration flexibility on one single system

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Mineralogic Systems

Mineralogic is a dedicated automated mineralogy engine designed to run on any ZEISS SEM with multiple integrated EDX detectors.

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Upgrades

Find out from which upgrades your instrument performance and life time can benefit

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Pre-Owned Instruments

Fully reconditioned electron microscopes with guaranteed performance at exceptional value

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Particle SCAN VP

ParticleSCAN VP is an exciting addition to the ZEISS portfolio of scanning electron microscopes – developed for a range of industrial environments either in the field or in a production environment

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3View® for Your ZEISS FE-SEMs

Block face imaging is a fast and convenient method to perform 3D imaging with nanometer resolution. With 3View® you use an ultramicrotome inside the SEM chamber to repeatedly cut and image your resin embedded cell and tissue samples.

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