Scanning Electron Microscopes (SEM)

Experience effortless imaging. With this scanning electron microscope you benefit from sub-nanometer resolution and high detection efficiency. Its variable pressure mode makes you feel like you’re working in a high vacuum environment.

Combine field emission SEM (FE-SEM) technology with advanced analytics. Image particles, surfaces, and nanostructures. Save time with the semi-automated 4-step workflow of Sigma.

With MultiSEM you unleash the acquisition speed of up to 91 parallel electron beams. Now, you can image samples in the centimeter – scale at nanometer resolution

MERLIN is the ideal solution for complete image analysis and characterization of biological samples. With the highest beam current in a nanometer size spot, MERLIN provides the fastest imaging of large fields of view at FE-SEM resolution

MERLIN with the GEMINI II column combines ultra fast analytics, high resolution imaging using advanced detection modes, and future assured configuration flexibility on one single system

Capture outstanding topographical details at low voltages with beam deceleration and high definition backscattered electron – BSE – imaging. Put EVO to work on a wide range of life science samples.

Capture outstanding topographical details at low voltages with beam deceleration and high definition backscattered electron imaging. Put your EVO to work on a wide range of material samples.

Mineralogic is a dedicated automated mineralogy engine designed to run on any ZEISS SEM with multiple integrated EDX detectors.

Find out from which upgrades your instrument performance and life time can benefit

Fully reconditioned electron microscopes with guaranteed performance at exceptional value

ParticleSCAN VP is an exciting addition to the ZEISS portfolio of scanning electron microscopes – developed for a range of industrial environments either in the field or in a production environment