Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and deliver images with information about the samples’ topography and composition. CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from Zeiss deliver high resolution surface information and superior materials contrast. Select your SEM out of a comprehensive portfolio of systems.
3View® for Your ZEISS FE-SEMs
Block face imaging is a fast and convenient method to perform 3D imaging with nanometer resolution. With 3View® you use an ultramicrotome inside the SEM chamber to repeatedly cut and image your resin embedded cell and tissue samples.
GeminiSEM
Experience effortless imaging. With this scanning electron microscope you benefit from sub-nanometer resolution and high detection efficiency. Its variable pressure mode makes you feel like you’re working in a high vacuum environment.
Sigma Family
Combine field emission SEM (FE-SEM) technology with advanced analytics. Image particles, surfaces, and nanostructures. Save time with the semi-automated 4-step workflow of Sigma.
MultiSEM 505/506
With MultiSEM you unleash the acquisition speed of up to 91 parallel electron beams. Now, you can image samples in the centimeter – scale at nanometer resolution
EVO Family
The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience. EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis.
Mineralogic Systems
Mineralogic is a dedicated automated mineralogy engine designed to run on any ZEISS SEM with multiple integrated EDX detectors.
Pre-Owned Instruments
Fully reconditioned electron microscopes with guaranteed performance at exceptional value
Particle SCAN VP
ParticleSCAN VP is an exciting addition to the ZEISS portfolio of scanning electron microscopes – developed for a range of industrial environments either in the field or in a production environment