![鋼と合金の微細構造解析に革命をもたらす]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg"} "鋼と合金の微細構造解析に革命をもたらす")
鋼と合金の微細構造解析に革命をもたらす
金属産業の研究と特性評価のルーチンワークにおける課題を解決鋼は、世界のインフラ、輸送、コネクティビティ開発において、これからも重要な役割を果たしていきます。鋼については、特にハイエンド自動車アプリケーション向けの先進高強度鋼（AHSS）、建設用新合金、およびより強く弾性の高い合金などのイノベーションが常に起こっています。そのプロセスでは、微細構造のすべての面の多次元データを得るために、評価のルーチンワークから研究・開発まで、あらゆる段階で顕微鏡が必要になります。
ZEISSのソリューションは、これまで知られていなかった鋼に関する情報を解明します。
![深部にある特徴を対象としたナノスケールの3Dイメージング]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.100.75.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.360.270.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.768.576.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg"} "深部にある特徴を対象としたナノスケールの3Dイメージング")
深部にある特徴を対象としたナノスケールの3Dイメージング
金属および合金は3次元の物体のため、微細構造を特性評価するには3次元のアプローチが必要です。 ごく小さな特徴がマクロ構造の性能に大きな影響を及ぼす場合もあります。
ZEISS Crossbeamの集束イオンビーム搭載SEM（FIB-SEM）をフェムト秒レーザーと合わせて使用することで、新たな解析の可能性が広がり、試料を3次元で詳細に観察できるようになります。
- 高分解能のZEISS X線顕微鏡でROIを特定し、正確な位置を把握して深部の特徴を解析
- ZEISS Crossbeamで特徴を再度特定し、ROI全体に高度に研磨した断面を作成
- ZEISS Crossbeam Laserを使用した超高速ミリングで試料の領域を除去し、深部にある特徴に素早くアクセス
- 高速かつ信頼性のある方法で透過電子顕微鏡用のラメラを調製
- 関心のある特徴をスライスおよびイメージングし、スライス1枚1枚の画像、EDSマップ、又はEBSDマップを取得して、完全な3D画像を構築
- 先進鋼、異種接合部、介在物、析出物、二相合金、その他の複雑な微細構造を評価
鋼および合金における非金属介在物の影響
非金属介在物は、あらゆるグレードの鋼や関連する合金に含まれています。非金属介在物は、使用中の鋼の挙動に影響（通常は悪影響）を与えます。その例としては、動的破壊靱性の低下、衝撃エネルギー吸収率の低下、耐食性の局部的な低下などが挙げられます。大型の介在物（通常、不純物により生じる）は、鋼の致命的な不良につながる場合もあります。ルーチンの品質保証において、および鋼の特性を理解する上で、介在物の大きさ、種類、分布を測定することは重要です。
ZEISS ZEN Non-metallic Inclusions（NMI）モジュールを使用すれば、シンプルなワークフローや介在物の使いやすいギャラリービューに加えて、個別のフィールドや介在物の検査により、解析が高速かつ簡単にできるようになります。完全に自動化された色しきい値の設定、アーチファクトの除去、鋼材圧延方向の自動検出によって、介在物の検出とマッピングの信頼性が高まり、試料調製の問題が軽減されます。ハードウェアの極めて高い精度と再現性により、広範囲で信頼性の高いマッピングが可能になると同時に、より詳しい解析や再分類を行うために、関心のあるフィールドや介在物に自動で戻ることができます。
さらに、走査電子顕微鏡でNMIを使用して研究を加速させ、個々の介在物を高分解能と柔軟な解析でイメージングし、特性評価することが可能です。
![鉱石および焼結物の解析]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,1278,959.file/met67-10x-bf--03.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,1278,959.file/met67-10x-bf--03.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.768.576.0,0,1278,959.file/met67-10x-bf--03.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1024.768.0,0,1278,959.file/met67-10x-bf--03.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg"} "鉱石および焼結物の解析")
![鉱石および焼結物の解析]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.100.75.file/met67-10x-bf--03.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.360.270.file/met67-10x-bf--03.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.768.575.file/met67-10x-bf--03.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1024.767.file/met67-10x-bf--03.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg"} "鉱石および焼結物の解析")
鉱石および焼結物の解析
鉄鋼需要の増大は、高度な鉄および非鉄合金の市場を圧迫し、金属生産における技術的、環境的、社会的課題につながります。鉱物学的により複雑で低グレードの鉱石を使って目的の成分を濃縮すると、多くのエネルギーと時間を要します。鉄鉱石の焼結に使用される鉱物の相対的な割合と、鉄の生産・製錬に使用されるコークス／石炭の質はすべて、プロセス効率だけでなく、スラグの量や種類、廃棄物にも影響します。
これらのプロセスを改善し、エネルギー消費を低減し、鉱物をより深く理解するには、鉱石および焼結物試料を詳しく調査する必要があります。
ZEISSの鉱物学・焼結物向けソリューションでは、以下を組み合わせることができます。
- 画像処理
- 3Dマッピング
- コアサンプリング
- 標準ベースの定量的EDS
- 画像解析
- 最も困難な試料を調査するためのレポート作成ツールキット
![ZEISS Crossbeam 750 FIB-SEMの写真]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.1024.1024.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.1280.1280.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-750_front-without-detector.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/crossbeam-750_front-without-detector.jpg"})
![ZEISS EVO - 直感的操作、ルーチン検査および研究アプリケーション向けのモジュラーSEMプラットフォーム]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/evo_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original./evo_stage.jpg"} "ZEISS EVO")
![ZEISS Phase Identifier]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/phase-identifier/fmg_segmented.jpg/_jcr_content/renditions/original.image_file.100.100.541,0,1379,838.file/fmg_segmented.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/phase-identifier/fmg_segmented.jpg/_jcr_content/renditions/original.image_file.360.360.541,0,1379,838.file/fmg_segmented.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/phase-identifier/fmg_segmented.jpg/_jcr_content/renditions/original.image_file.768.768.541,0,1379,838.file/fmg_segmented.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/phase-identifier/fmg_segmented.jpg/_jcr_content/renditions/original.image_file.838.838.541,0,1379,838.file/fmg_segmented.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/phase-identifier/fmg_segmented.jpg/_jcr_content/renditions/original.image_file.838.838.541,0,1379,838.file/fmg_segmented.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/phase-identifier/fmg_segmented.jpg/_jcr_content/renditions/original.image_file.838.838.541,0,1379,838.file/fmg_segmented.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/phase-identifier/fmg_segmented.jpg/_jcr_content/renditions/original.image_file.838.838.541,0,1379,838.file/fmg_segmented.jpg"} "ZEISS Phase Identifier")
![ZEISS Sigma]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/sigma360-stage.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/sigma360-stage.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/sigma360-stage.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/sigma360-stage.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png"} "ZEISS Sigma")
![ZEISS Xradia Context microCT]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/context_product.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/context_product.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/context_product.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/context_product.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg"} "ZEISS Xradia Context microCT")
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