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ZEISS Xradia 510 Versa

ZEISS Xradia 510 Versa

Your 3D Submicron Imaging System with Breakthrough Flexibility

Break the one micron resolution barrier with this X-ray microscope for 3D imaging and in situ / 4D investigations.

Use the combination of resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab.

Benefit from its architecture that uses a two-stage magnification technique to achieve submicron resolution at a distance (RaaD). Reducing dependence upon geometric magnification maintains submicron resolution even at large working distances.

Highlights

Enjoy versatility even at large working distances from the source - from millimeters to centimeters.

Perform 3D Imaging for soft or low-Z materials with advanced absorption and innovative phase contrast

Achieve world-leading resolution at flexible working distances beyond the limits of projection-based micro-CT

Resolve submicrometer-scaled features for diverse sample sizes

Extend non-destructive imaging in your lab with an in situ / 4D solution

Investigate materials in native-like environments over time
Throughput with image quality

Polymer with urethane backbone. Imaging after in situ experiments. Simulation of fluid flow demonstrates permeability.

Application Examples

ZEISS Xradia 510 Versa

Materials Research

Typical tasks and applications

Visualizing cracks in soft composite materials or measuring porosity in steel
Perform in situ studies by imaging under varying conditions such as tensile, compression, gas, oxidation, wetting and temperature variations
Image materials that are incompatible with vacuum and charged particle beams
View into deeply buried microstructures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM
Maintain resolution at a distance for in situ imaging experiments, allowing you to study a wide variety of sample sizes and shapes using various in situ apparatus
Understand the impact of these varying conditions over time with the non-destructive nature of X-rays

Very soft porous polymer with urethane backbone. High contrast imaging of low Z materials in situ with varying temperatures and compression. Simulation of fluid flow demonstrates absolutely the permeability of the sample.

Application Video

Sintered Powder Steel

Non-destructive 3D imaging is crucial for additive manufacturing development. A powder stainless steel sample was laser-sintered and imaged by ZEISS Xradia 520 Versa. From the 3D dataset, the non-sintered solid phase was virtually segmented and volume quantified. XRM also provides ability to do interior tomography and look at virtual cross-sections without damage to the sample. Sample courtesy of NIST.

Life Sciences

Typical tasks and applications

Perform histologies virtually and visualize cellular and subcellular features

Expand your views in developmental biology with high resolution, high contrast images of cellular and subcellular structures

Image large intact samples such as brains or large bones

Achieve high resolution and high contrast for unstained and stained tissue

Investigate hard and soft tissues and biological microstructures

Mite on Spider in Amber

Raw Materials

Typical tasks and applications

Characterize heterogeneity at core plug scale and quantify pore structures

Measure fluid flow, analyze texture, and understand dimensional classification

Study carbon sequestration efforts

Advance mining processes: analyze tailings to maximize mining efforts; conduct thermodynamic leaching studies; perform QA/QC analysis of mining products such as iron ore pellets

Benefit from getting the most accurate 3D submicron support for digital rock simulations, in situ multiphase fluid flow studies, 3D mineralogy, and laboratory-based diffraction contrast tomography (LabDCT)

Perform multi-scale imaging, characterization and modeling of large (4" core) samples at high throughput

Shale with Pore Connectivity

Electronics

Typical tasks and applications

Optimize your process development and analyze failures by using non-destructive submicron imaging of intact packages for defect localization and characterization

Measure buried features in three dimensions or study package reliability

Benefit from high resolution and non-destructive imaging for 3D submicron imaging that complements or replaces physical cross sectioning methods

Work efficiently in a single tool workflow with high throughput macro-scanning of an intact device

Non-destructively scout-and-zoom from module to package to interconnect for submicron imaging of defect re-localization and characterization with a fast time to results that complements or replaces physical cross-sectioning

Package-on-Package Assembly

Accessories

Upgrade your microscope with additional accessories to enhance your microscope's capability

ZEISS Advanced Reconstruction Toolbox

Better image quality, higher throughput

For more information click to enlarge the graphic

Advanced Reconstruction Toolbox (ART) introduces Artificial Intelligence (AI)-driven reconstruction technologies on your ZEISS Xradia 3D X-ray microscope (XRM) or microCT. A deep understanding of both X-ray physics and applications enable you to solve some of the hardest imaging challenges in new and innovative ways.

Discover how speed of data acquisition and reconstruction as well as image quality are enhanced without sacrificing resolution by using OptiRecon, two variants of DeepRecon and PhaseEvolve, the unique modules of ART.

With the Advanced Reconstruction Toolbox, you are able to:

Improve data collection and analysis for accurate and faster decision-making
Greatly enhance image quality
Achieve superior interior tomography or throughput on a broad class of samples
Reveal subtle difference through improved contrast-to-noise
Increase speed at an order of magnitude for sample classes requiring repetitive workflow

3D X-ray dataset of a camera lens acquired using ZEISS Xradia 620 Versa and DeepRecon Pro.

The optional modules are workstation-based solutions for easy access and usability:

DeepRecon Pro & Custom for Deep learning-based reconstruction
PhaseEvolve for contrast enhancement
OptiRecon for iterative reconstruction

More about reconstruction toolbox

ZEISS DeepRecon Pro provides a straightforward, uncomplicated, and powerful application of AI and deep neural network technology for enhancing X-ray tomography results without prior knowledge on deep learning technology. [...] It helps us to reduce the scan time required for in situ fluid-rock interaction experiments when we need to work with long exposure times.
Dr. Markus Ohl | X-Ray microscopy | EPOS-NL MINT | Utrecht University, NL

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Software

Create Efficient Workflows by Using The Simple Control System

Easily scout a region of interest and specify scanning parameters within the Scout-and-Scan Control System. Take advantage of the easy-to-use system in your central lab where users may have a variety of experience levels.

Benefit from:

Internal camera for sample viewing
Recipe control (set, save, recall)
Multiple energies
Multiple samples with Autoloader option
Micropositioning capability with a simple mouse click

Scout-and-Scan Control System

ZEISS Mineralogic - Automated Mineralogy

Phase identification and textural analysis in 2D and 3D using ZEISS SEM, XRM, and microCT systems.

Visualization and Analysis Software

ZEISS recommends Dragonfly Pro from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.