3D X-Ray Measurements for Quality Assurance ZEISS METROTOM
NEW: High Resolution available

Industrial Computed Tomography with ZEISS METROTOM

With a industrial computed tomography system from ZEISS, you can successfully perform measuring and inspection jobs yourself with only one X-ray scan. The standard acceptance test, the precision engineering and the sophisticated calibration process ensure the traceability of the system. Linear guideways and a rotary table meet customers' highest demands for precision.

Now available: See more, measure more - thanks to greater resolution

  • Very high resolution for measuring components with narrow tolerances or small defects
  • High-performance system for irradiating thicker and multi-material parts
  • Faster scanning thanks to the shorter working distance and outstanding performance

Perform easy measurements with ZEISS METROTOM

Measurement of a light metal component
Metrology inspection of a light metal component

Measuring and inspecting complete components

The ZEISS METROTOM is an industrial computed tomography system for measuring and inspecting complete components made of plastic or light metal. With traditional measuring technology, hidden structures can only be inspected after the time- and cost-consuming process of destroying the component layer-by-layer.

Measure a lot of characteristics easily and precisely

With ZEISS METROTOM computed tomography system, numerous component characteristics are scanned in one run. The resulting measurements are precise and traceable. Unlike contact measuring methods, ZEISS METROTOM is significantly faster when capturing numerous measuring points.

Measurement of a base plug.
Measurement of a base plug.

Intuitive handling with easy machine software

Following a short training course on how to use the ZEISS METROTOM OS machine software, the operator is able to tomograph components and look into the interior of the component. With ZEISS CALYPSO and NEO insights you can evaluate the CT data and with ZEISS PiWeb, they can be merged quickly in a single measurement report.

Using ZEISS METROTOM in the Industrial Process

Application

Measuring and evaluating entire components

Particular strengths

Standard-compliant and traceable precision
Testing according to VDI/VDE 2630
Evaluation with ZEISS CALYPSO & NEO insights

Place of use

Measuring lab

Resolution

3.5–6 μm

Speed

Minutes

More about ZEISS Computed Tomography on YouTube

How ZEISS CT systems work

ZEISS CT user meeting 2017

Automatic Loading of Workpieces with ZEISS METROTOM

ZEISS CT solutions in the plastics industry

ZEISS CT solutions used at starlim//sterner