ZEISS Crossbeam 550 FIB-SEM

ZEISS Crossbeam 550 is commonly selected by advanced research labs and facilities that run frequent analytical workflows and need higher throughput and repeatability than an entry-level system provides.

Crossbeam 550 with Gemini 2 electron optics is designed for more demanding analytical workflows, offering higher throughput, improved imaging stability, and better suitability for large datasets, 3D tomography, and advanced SEM analytics.

The Gemini 2 optics with a double-condenser design enable efficient signal generation and stable imaging conditions, supporting faster acquisition for SEM analytics, large-area imaging, and FIB-SEM tomography.

Yes. Crossbeam 550 allows live, synchronized imaging during milling, enabling users to monitor structures as material is removed and improve endpoint control without interrupting the workflow, but the high dynamic range (HDR) Mill + SEM is optional.

Crossbeam 550 supports all steps of lamella creation — chunking, thinning, lift-out, and on-grid attachment, guided by ZEN core EM workflows, it delivers live SEM monitoring and low-energy FIB finishing for accurate endpointing and reduced ion damage.

Yes, Crossbeam 550 can handle beam-sensitive materials like thin films, polymers, and biological specimens. Low-kV imaging and low-energy FIB milling minimize damage and preserve fine structural details.

Crossbeam 550 is ideal for advanced workflows with high demand of analytics combined with daily flexibility in materials science, electronics, semiconductors such as advanced packaging, and life sciences. Applications include TEM lamella preparation, 3D tomography, nanofabrication, and structural analysis of delicate samples.

ZEISS software integrates acquisition, control, and analysis for efficient workflows. ZEN core EM enables automated recipes, batch processing, and synchronized SEM/FIB operation, while ZEISS arivis supports scalable image analysis for large datasets, ensuring consistent, high-quality results.

The femtosecond laser is an optional feature for ZEISS Crossbeam systems that enables rapid material removal through ultrafast laser ablation. It is particularly useful when rapid access to large, deeply buried areas is required. The ZEISS Crossbeam laser provides with very high milling rates in the order of 10^6 µm³/s for rapid and precise ablation, significantly reducing preparation time compared to traditional FIB milling. The laser preserves fine structural details by minimizing thermal and mechanical damage, ensuring high-quality surfaces for subsequent SEM imaging and analysis.

The femtosecond laser is ideal for workflows requiring fast access to buried features, such as advanced semiconductor analysis or materials research involving large, complex samples. It is especially beneficial for applications where traditional FIB milling would be too slow or inefficient.

While FIB milling offers precise control for small-scale material removal, the femtosecond laser excels at high-speed ablation of larger volumes. The laser complements FIB workflows by enabling faster initial material removal, followed by fine milling and finishing with the Ion-sculptor FIB column.

No. The femtosecond laser minimizes thermal and mechanical damage by using ultrafast pulses that vaporize material without introducing heat-affected zones (a-thermal ablation). This ensures that delicate features and interfaces remain intact for high-quality imaging and analysis.

The femtosecond laser is compatible with a wide range of materials, including metals, ceramics, polymers, and semiconductor samples. However, its suitability depends on the specific application and sample composition. ZEISS experts can help determine the best configuration and parameters for your workflows.

The femtosecond laser seamlessly integrates with Crossbeam 550 workflows, working alongside the Gemini 2 optics and Ion-sculptor FIB column. It accelerates material removal during the initial stages of preparation in a separate chamber with automated sample transfer, while recipe-driven automation ensures consistent results across samples and operators.