ZEISS Xradia 800 Ultra
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ZEISS Xradia 800 Ultra

Your Ultra-high Resolution, Non-destructive 3D Imaging System

Synchrotron-like performance in the lab

With the ZEISS Xradia 800 Ultra X-ray microscope, achieve spatial resolution down to 50 nm, the highest among lab-based X-ray imaging systems. With non-destructive 3D imaging playing a vital role in today’s breakthrough research, you will experience unparalleled performance in an ultra-high resolution lab-based system. The innovative Xradia Ultra architecture features absorption and phase contrast imaging modes and X-ray energy of 8 keV, using unique optics adapted from the synchrotron. With Xradia 800 Ultra, expect to accomplish unrivaled in situ and 4D capabilities for studying material evolution over time and extend the limits of X-ray imaging used in materials science, life sciences, natural resources, and diverse industrial applications.

Highlights

With resolution as fine as 50 nm, Xradia 800 Ultra provides you with insight into microscopic structures and processes previously not accessible with conventional lab-based X-ray technology. Operating with 8 keV X-rays provides excellent penetration and contrast for a wide range of materials, enabling you to observe structures and materials in their natural state.

ZEISS integrated phase contrast technology employing the Zernike method allows enhanced visibility of grain boundaries and material interfaces when absorption contrast is low, providing you with visibility of ultra- and nano-structures without staining.

ZEISS Xradia 800 Ultra delivers reliable internal 3D information otherwise only accessible with destructive methods like cross-sectioning. The large working distance and atmospheric sample environment allow you to perform in situ studies with ease.

 

Benefits

  • Non-destructive 3D X-ray imaging allows repeated imaging of the same sample allowing direct observation of microstructural evolution
  • High resolution down to 50 nm is maintained for imaging of samples within in situ devices
  • Automated image alignment for tomographic reconstruction
  • Switchable field-of-view ranging from 15 to 60 µm
  • Absorption and Zernike phase contrast imaging modes
  • Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient
  • Now with Scout-and-Scan Control System with an easy workflow-based user interface, ideal for the central imaging lab where users may have a wide variety of experience levels 

Applications

Materials Research
For advanced materials development: study and predict material properties and evolution. Characterize 3D structures of composite materials, such as fuel cells, polymers and composites. Measure and identify porosity, cracks, phase distribution etc. Material of different densities may be segmented through the use of absorption-contrast imaging.

Raw Materials
Oil & gas drilling feasibility studies: perform virtual core analysis to reduce time to results. Nanoscale pore structure measurements for geological samples can now be conducted in a few hours compared to traditional core analysis. Perform flow modeling on the nanoscale to complement submicron imaging with the Versa microscope. Understand geomechanics under load, study the effects of tensile pressure on metals, or analyze ceramics under pressure. 
 

Life Sciences
Xradia 800 Ultra offers the ability to visualize the internal structure of biological specimens, such as bone and soft tissue, with resolution down to 50 nm. It offers superior contrast, nanoscale 3D X-ray imaging for a variety of materials such as polymers for drug delivery, tissue samples, and scaffolds for tissue engineering.

Electronics
Xradia 800 Ultra offers visualization of semiconductor samples for electronics packaging research and development.

Ultra Load Stage

Xradia Ultra Load Stage: An Optional Accessory

In situ Nanomechanical Test Stage for 3D X-ray Imaging

Understand nanostructural changes in 3D under load

ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales. 

Highlights

  • Add in situ nanomechanical testing capabilities to your Xradia Ultra nanoscale 3D X-ray microscope (XRM)
  • Acquire 3D tomograms of your sample under load with resolution down to 50 nm
  • Perform a variety of nanomechanical tests such as compression, tension, and indentation
  • Study a wide range of materials including metals, ceramics, composites, polymers and biomaterials
  • Complement your mechanical test results from electron microscopy, microCT and stand-alone test set-ups to understand behavior across multiple length scales: from the atomic level and the nanoscale to the micro and macro scale.
  • Available in two models with different force measurement:
    • LS108: 0.8 N maximum force
    • LS190: 9 N maximum force
  • Compatible with:
    • ZEISS Xradia 800 Ultra
    • ZEISS Xradia 810 Ultra
    • Xradia UltraXRM-L200
    • Xradia nanoXCT-200

How it works:

ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.

Modes

Compression
Observe deformation and failure of materials under uniaxial compressive load. Study elastic and plastic deformation and determine if the effects are uniform, anisotropic or localized relative to nanostructural features such as voids, struts or interfaces.

Tension
Observe deformation and failure of materials under uniaxial tensile load. Understand critical properties like elastic modulus and tensile yield strength and how they relate to the specific nanostructural features of the specimen. 

Indentation
Study isolated deformation and failure events surrounding the indentation site. Understand crack generation and propagation, or delamination of coatings and layered structures. 

Key applications

In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials.
Examples include:

  • High strength alloys
  • Biomaterials / biomechanics
  • Coatings
  • Building materials
  • Fibers / composites
  • Foams

Software

New! Scout-and-Scan Control System on every system

The innovative ZEISS Scout-and-ScanTM Control System represents a significant usability and productivity improvement for Xradia Ultra. Scout-and-Scan streamlines sample and scan set-up to boost your productivity with Xradia Ultra.

The workflow-based user interface guides you through the process of aligning the sample, scouting for regions of interest, and setting up 3D scans. Recipes allow you to set up multiple scans of the same sample to image various regions of interest, or to combine different imaging modes. The easy-to-use system is ideal for a central lab-type setting where users may have a wide variety of experience levels.

Visualization and Analysis Software

Visualization and Analysis Software

ZEISS recommends Dragonfly Pro from Object Research Systems (ORS)

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.

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Downloads

Please fill out the form to receive information on Xradia products. The documentation will be emailed to the address you provide. Please make sure that you enter a valid email address. 

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