Shuttle & Find from Carl Zeiss is a correlative microscopy interface for light- and electron microscopes, designed specifically for use in materials analysis.
A combined hardware and software solution, it allows you to transfer your specimen from one microscope system to another in just minutes — a process that has until now taken hours, or even days.
Shuttle & Find is an extremely flexible two-way system that allows you to combine any number of Carl Zeiss systems for correlative microscopy. It also supports intermediate preparation steps, ensuring your sample is optimally prepared for use when you switch from one system to the other.
Importantly for materials analysis, Shuttle & Find speeds up your workflow by automating the process of searching the same region of interest. This reduces cycle times, allowing you to process a considerable larger number of samples in a shorter period.
Ask your ZEISS contact about Shuttle & Find now!
Characterize process-critical particles. Correlative Particle Analyzer combines your data from both light and electron microscopes. After you have detected particles with your light microscope, you can fully automate their relocation and EDX analysis with correlative particle analysis from Carl Zeiss. It is the best way to enhance the characterization of residual particles.
Correlative Particle Analyzer automatically supplies you with a report that integrates your results from both light and electron microscopic analysis. Correlative Particle Analyzer achieves results up to ten times faster than consecutive individual analysis on light and electron microscopes.
Bridging the Micro and Nano World in Materials Analysis
Filesize: 3,174 kB
Quickly Characterize and Classify Particles Supporting ISO 16232 by Light and Electron Microscopy
Filesize: 3,060 kB
Caracterize rapidamente e classifique partículas de acordo com ISO 16232 por meio de Microscopia Eletrônica e de Luz
Filesize: 3,052 kB
Caracterice y clasifique partículas rápidamente de conformidad con la norma ISO 16232 mediante microscopía óptica y electrónica
Filesize: 3,115 kB
Correlative Microscopy allows a high productivity in structural analysis of Li-ion batteries due to a fast, reliable and precise workflow between light microscopy and SEM. This enables new possibilities especially for quantitative image data analysis of the same region of interest.
Filesize: 1,177 kB
We present the cross–section sample analysis of an oil painting on canvas. Correlative Light and Electron Microscopy (CLEM) is used for analyzing the cross–section samples, combining the optical properties of light microscopy (LM) with the detailed structural and chemical analysis of the scanning electron microscope (SEM), along with energy dispersive X–ray spectrometer (EDS).
Filesize: 1,605 kB
Interface for Correlative Microscopy in Materials Analysis
Filesize: 2,766 kB
of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscop
Filesize: 1,755 kB