XRM University: XRM 302 Phase Contrast Imaging with Versa

A ZMCC SkillBuilder Workshop

10am - 1pm PST | Virtual

Workshop Overview & Agenda

Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM features dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.
Xradia Versa family of 3D X-ray microscopes (XRM) are designed to increase material imaging flexibility by employing several contrast-enhancing techniques. These unique techniques enable ZEISS X-ray microscopes to provide superior contrast for a range of difficult-to-image materials even the most challenging materials – low atomic number (low Z) materials, soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast.
This workshop is an introduction to the phase contrast imaging techniques of ZEISS Xradia Versa systems. A foundational understanding of setting up both Full Field of View (FFOV) and high-resolution internal tomography using Scout and Scan software, along with basic proficiency in navigating a 3D dataset, is necessary.

This is a 3-hour virtual workshop with a short break.

Topics that will be covered in this workshop include:

  • Reviewing how to set up both full field-of-view and high-resolution interior tomography with a Versa. It is expected for the attendees to know how to find the right scan parameters such as kV, filter, exposure time, etc (as covered in ‘XRM University XRM 101 Versa Operation’ and ‘XRM 201 Scout-and-Zoom with Versa’)
  • Phase Contrast Imaging for Low Z material samples, such as biological specimens and polymer materials
  • Compton Scattering imaging consideration

Who should attend?

  • Versa users in need of learning phase contrast imaging
  • Lab managers or technicians looking to improve their skill level to better support and/or train other users of the instrument

Learning objectives after completion of this workshop, attendees should:

After completion of this workshop, attendees will be able to

  • Choose the best parameters for achieving high-quality full field-of-view and interior tomography
  • Select the most suitable method for phase contrast enhancement when imaging different kinds of samples

This is a paid workshop with limited availability.

It is highly recommended to have access to a Versa system to apply the lessons learned and share results with the applications team for further support, either during or shortly after the training.

Haolin Qu, PhD Applications Engineer

Haolin joined ZEISS XRM Applications team in 2022 and is responsible for both Versa and Context systems at Zeiss Microscopy Customer Center in California.   He has a background in petroleum engineering and has years of experience in computed tomography, X-ray microscopy, and image analysis in petrographic characterization and multiphase flow in porous media.

Register for the workshop

This workshop costs $400 per attendee. Please fill out the form below to initiate your registration, and be sure to submit your payment at the link in the automated follow-up email to finalize your registration.

To secure your seat, please submit your payment by June 26th, 2024.

Form is loading...

If you want to have more information on data processing at ZEISS, please refer to our data privacy and legal notice.