ZEISS Xradia Versa X-ray Microscopes
Discover More with Non-destructive 3D X-Ray Imaging at Submicron Resolution
Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.
Xradia Versa 510
Xradia 510 Versa breaks the one-micron resolution barrier for 3D imaging and in situ / 4D investigations. ZEISS Xradia 510 Versa makes synchrotron-caliber research even more practical for mid-sized imaging centers and industrial laboratories.
Xradia Versa 610
Xradia 610 Versa extends the limits of your exploration with breakthrough innovation in source and optics technology. Higher X-ray flux delivers faster tomography scans with industry-leading resolution and contrast.
Xradia Versa 620
Xradia 620 Versa unlocks new degrees of versatility for your research with non-destructive imaging at maximum flexibility to accelerate your research. Move from exploration to discovery in a seamless workflow. 600-family technical specs with a wider range of imaging options.
Xradia 510 Versa
Benefit from the two-stage magnification technique offered by ZEISS Xradia Versa to uniquely achieve RaaD, which enables you to effectively study the widest range of sample sizes. Intuitive Scout-and-Scan control software enables a broad range of user skillsets in your busy lab.
Polymer with urethane backbone. Imaging after in situ experiments. Simulation of fluid flow demonstrates permeability. Courtesy National Chemical Laboratory, India
Xradia 610 Versa
By leveraging RaaD capability, Xradia Versa 600-series maintain the highest resolution across large working distances, accommodating samples contained within environmental chambers and high precision in situ load rigs. 600-series XRM offer even higher resolution and throughput over previous generations. Xradia Versa seamlessly integrate with other ZEISS microscopes to solve your multi-scale correlative challenges.
Cement paste sample blended with resin, enabling the paste to acquire higher porosity resulting in better freeze-thaw behavior. Courtesy Nanjing University of Science and Technology, China
Xradia 620 Versa
Boost the performance of your Xradia Versa and explore more with its advanced capabilities. Enhance absorption contrast for low-Z or similar-Z materials with the Dual Scan Contrast Visualizer (DSCoVer). Unlock 3D crystallographic information with laboratory-based Diffraction Contrast Tomography (LabDCT). Improve scan speed and accuracy of large or irregular samples with advanced acquisition techniques such as High Aspect Ratio Tomography (HART).
A reconstruction of the grain microstructure of Armco Iron, acquired with LabDCT. The grains are colored by crystallographic orientation, and reconstruction reveals the true grain shape. The background shows an example of a diffraction pattern that is collected during the LabDCT acquisition.
Breakthrough Imaging with ZEISS Xradia Versa XRM
View highlights of ZEISS Xradia Versa 3D X-ray microscopes: non-destructive imaging, higher resolution with higher throughput.
The Technology Behind Xradia Versa X-ray Microscopes
The Versatile Advantage of RaaD
The two-stage magnification technique offered by ZEISS Xradia Versa uniquely achieves Resolution at a Distance, or RaaD, which enables you to effectively study the widest range of sample sizes, including those within in situ chambers.
Images are initially magnified via geometric projection as with conventional microCT. The projected image is cast onto a scintillator, converting X-rays to a visible light image which is then optically magnified by microscope optics before acquisition by a CCD detector.
Reducing dependence on geometric magnification enables ZEISS Xradia Versa solutions to maintain submicron spatial resolution down to 500 nm at large working distances.
Push the Limits of Scientific Advancement
ZEISS Xradia X-ray systems provide the industry's premier 3D imaging solution for the widest variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments.
These studies require samples to be further away from the X-ray source to accommodate various types of in situ rigs. On traditional microCT systems, this significantly limits the resolution achievable for your samples. ZEISS XRM are uniquely equipped with dual-stage magnification architecture with RaaD technology that enable the highest resolution for in situ imaging.
ZEISS Xradia XRM platforms can accommodate a variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages, to user-customized designs. You can add the optional in situ Interface Kit to your ZEISS Xradia XRM, which includes a mechanical integration kit, a robust cabling guide, and other facilities (feed-throughs) along with recipe-based software that simplifies your control from within the Versa Scout-and-Scan user interface. When your needs require pushing the resolution limits of your in situ experiments, convert your ZEISS Xradia microCT or XRM to an Xradia 620 Versa X-ray microscope and leverage RaaD technology for the maximum performance tomographic imaging of samples within in situ chambers or rigs.
Begin Your Multi-Scale, Multi-Modal, Multi-Dimensional Microscopy
with Non-destructive 3D Imaging
Because of the non-destructive nature of X-rays and the versatile array of sample types and sizes they are able to image, correlative microscopy often begins with, or is enabled by, ZEISS Xradia Versa XRM.
Using the Scout-and-Zoom capability of Versa, you are able to clearly define your region of interest (ROI) before sacrificing your sample to premature cutting or other sample prep. Rapidly scout at low resolution with a large field of view, and then zoom to the ROI at higher resolution, whether using the range of Versa objectives (up to 40X), nanoscale Xradia Ultra XRM, or ZEISS light, electron, or FIB-SEM microscopes. This prevents premature sample destruction and allows for maximum workflow efficiency while combining full sample context with key sample information.
Additionally, the ability to perform interior tomography, or to clearly see inside your sample in 3D, further reduces the risk of losing sight of your ROI. Achieve greater efficiency by pinpointing a specific “address” to which to navigate for accurate and efficient next steps for interrogating your sample.
Finally, examine your sample under varying conditions and over time with in situ and 4D studies before performing further analysis — chemical, surface, etc.— with other ZEISS modalities.
Leverage the widest array of microscopy solutions available — exclusively from ZEISS — to perform multi-modal, multi-lengthscale, multi-dimensional analyses, by starting with non-destructive 3D X-ray microscopy.
Features That Make Every Versa Platform More Powerful
Create Efficient Workflows Using the Super Simple Control System
All of the features introduced by ZEISS Xradia Versa instruments are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The interface maintains the flexibility for which ZEISS Xradia Versa systems are known, enabling you to set-up scans even more easily.
Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research and enables you to have greater control and efficiency for future work. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels.
● Internal camera for sample viewing
● Recipe control (set, save, recall)
● Multiple energies
● Multiple samples with Autoloader option
● Micropositioning capability with a simple mouse click
Easily Protect Your Sample to Optimize Experiment Setup
SmartShield is a solution that protects your sample and your microscope. This automated collision avoidance system works within the Scout-and-Scan Control System. It enables you to navigate Xradia Versa more confidently than ever. With the click of a button SmartShield creates a digital protective layer based on the dimensions of your sample.
With SmartShield, you benefit from:
● Improved operator efficiency enabled by a streamlined sample setup
● Enhanced user experience for novice and advanced users
● Protection of your valuable samples and your investment
● Uncompromising scan quality
Wide Field Mode
Wide Field Mode (WFM) can be used to image across an extended lateral field of view. The wide lateral field of view can provide 3x larger 3D volume for large samples, or give a higher voxel density for a standard field of view. All Xradia Versa systems are capable of WFM with the 0.4x objective. In combination with Vertical Stitching, WFM enables you to image larger samples at exceptional resolution.
Upgrade your microscope with additional accessories to enhance its capabilities
Advanced Reconstruction Toolbox
Higher Throughput with Image Quality
Artificial intelligence (AI)-driven reconstruction technologies for your ZEISS Xradia systems. A deep understanding of both X-ray physics and applications enable you to solve some of the hardest imaging challenges in new and innovative ways.
Maximize Your Instrument’s Utilization
Maximize use and minimize user intervention with the optional ZEISS Autoloader. Reduce the frequency of user interaction and increase productivity by enabling multiple jobs to run. Load up to 14 sample stations, which can support up to 70 samples, queue, and allow to run all day, or off-shift.
In Situ Interface Kit
Push the Limits of Scientific
ZEISS Xradia platforms can accommodate a variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages, to user-customized designs. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments.
Visualization and Analysis
ZEISS Recommends Dragonfly Pro
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy. Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.
Flat Panel Extension (FPX)
Large Samples with Throughput
Optional Flat Panel Extension (FPX) delivers large-sample, high throughput scanning with ZEISS best-in-class image quality. FPX enhances imaging flexibility and creates workflow efficiencies with an all-in-one system for industrial and academic research.
Scout-and-Zoom is a unique capability of ZEISS X-ray microscopes that leverages FPX to perform exploratory “Scout” scans across a large field of view to identify interior regions of interest for higher resolution “Zoom” scans without complex sample preparation.
FPX also enables high throughput and large area mapping capabilities for LabDCT Pro.
Exclusively Available for ZEISS Xradia 620 Versa XRM
Unlocking Crystallographic Information
LabDCT Pro for diffraction contrast tomography (DCT), available exclusively on Xradia 620 Versa, enables non-destructive mapping of grain orientation and microstructure in 3D. Direct visualization of 3D crystallographic grain orientation opens up a new dimension in the characterization of polycrystalline materials like metal alloys, geomaterials, ceramics, or pharmaceuticals.
✔ LabDCT Pro supports specimens with crystal structures from cubic symmetry to systems with lower symmetry such as monoclinic materials
✔ Acquire high resolution crystallographic information using the dedicated 4X DCT objective. For even larger samples, use large area mapping and increase your throughput with the Flat Panel Extension (FPX).
✔ Obtain comprehensive 3D microstructure analysis from larger representative volumes and wide-ranging sample geometries
✔ Investigate microstructural evolution with 4D imaging experiments.
✔ Combine 3D crystallographic information with 3D microstructural features.
✔ Combine modalities to understand structure-property relationships.
Adding Measurement Accuracy to X-ray Microscopy
With the Metrology Extension (MTX) you turn your Xradia 620 Versa into a verified measurement accuracy system far beyond the limits of conventional CT technology. This is essential for academic and industrial labs where miniaturization and integration of components drive a growing demand for high-resolution metrology. Benefit from high resolution X-ray imaging combined with high-precision metrology.
✔ Leading CT metrology accuracy: Calibrated with MTX, ZEISS Xradia Versa provides a market-leading maximum permissible error value of MPESD = (1.9 + L/100) μm for measurements in small-scale volumes, where L is the measured length in mm.
✔ Small volumes at high resolution: MTX enables measurements with high dimensional accuracy within small reconstructed volumes of 125 mm3.
✔ Simple calibration workflow: The MTX package provides an integrated user-guided calibration workflow.
✔ Once the calibration routine has been executed, you perform precise measurements and make the data available to standard metrology software for further processing.