ZEISS Axio Imager 2 for Materials Research
Product

ZEISS Axio Imager 2 for Materials Research

Open Microscope System for Automated Material Analysis​

When you perform advanced materials research introduce ease of use into your light microscopy workflow. Benefit from accurate and reproducible results using ZEISS Axio Imager 2 for materials. Choose the system tailored to your applications. Expand your instrument with dedicated solutions for e.g., particle analysis, confocal or correlative microscopy.

  • Reproducible results
  • Modular design​
  • High optical performance
Reproducible Results​ - Enjoy Vibration-Free Working Conditions​

Reproducible Results​

Enjoy Vibration-Free Working Conditions​

Stability is essential if you want to obtain good results. Appreciate the stable imaging conditions of Axio Imager 2, especially when working with high magnifications or performing time dependent studies. Due to the motorization of Axio Imager 2 achieve quick and reproducible results while always working under constant conditions.

Modular Design​ - Gain Enhanced Flexibility​

Modular Design​

Gain Enhanced Flexibility​

Whether in academic or industrial research, materials microscopy faces various challenges. With Axio Imager 2 you will be able to meet and win these challenges. Attach application-specific components and perform e.g. particle analysis. Investigate non-metallic inclusions (NMI), liquid crystals, or semiconductor-based MEMs. Expand your instrument with dedicated solutions for confocal or correlative microscopy.

High Optical Performance - Achieve Superb Contrast and Resolution

High Optical Performance

Achieve Superb Contrast and Resolution

  • Examine a range of materials e.g., metals, composites, or liquid crystals with different contrasting techniques. ​
  • Use reflected light and observe your samples in brightfield, darkfield, differential interference contrast (DIC), circular differential interference contrast (C-DIC), polarization or fluorescence. ​
  • Use transmitted light and examine your samples in brightfield, darkfield, differential interference contrast (DIC), polarization or circular polarization. The contrast manager ensures reproducible illumination settings.
  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Brightfield
  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Darfield​
  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Polarization (crossed polars)​
  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Polarization with additional lambda compensator
  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Circular Differential Interference Contrast (C-DIC)​
  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Brightfield

    Brightfield​

    Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Brightfield

    Brightfield

    Brightfield

  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Darfield​

    Darfield

    Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Darfield​

    Darfield​

    Darfield​

  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Polarization (crossed polars)​

    Polarization (crossed polars)​

    Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Polarization (crossed polars)​

    Polarization (crossed polars)​

    Polarization (crossed polars)​

  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Polarization with additional lambda compensator

    Polarization with additional lambda compensator

    Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Polarization with additional lambda compensator

    Polarization with additional lambda compensator

    Polarization with additional lambda compensator

  • Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Circular Differential Interference Contrast (C-DIC)​

    Circular Differential Interference Contrast (C-DIC)​

    Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Circular Differential Interference Contrast (C-DIC)​

    Circular Differential Interference Contrast (C-DIC)​

    Circular Differential Interference Contrast (C-DIC)​

A Choice of Contrasting Techniques​

Cast iron with spherulitic graphite, polished sample, identical same site imaged with different contrasting techniques (field of view 265 µm). Images: courtesy of Dr. H.-L. Steyer, Kesselsdorf, Germany.​

Ergonomics: As Multifaceted as Your Surfaces​

Ergonomics

As Multifaceted as Your Surfaces​

Axio Imager.Z2m or Axio Imager.M2m display key operating functions on a touch screen, giving you fingertip control of all motorized components. Additional control buttons are positioned ergonomically around the focus drive, with tactile surfaces that make them easy to distinguish. Axio Imager.D2m has five pre-programmed buttons while Axio Imager.Z2m has ten user-definable buttons. Axio Imager.A2m is encoded.

Thermomicroscopy: Flexible Documentation of Temperature Changes

Thermomicroscopy

Flexible Documentation of Temperature Changes

Do you want to examine how temperature influences the behavior of metals, crystals, ceramics or plastics?​

With ZEN core and Linkam heating stages you define heating or cooling experiments. Document the temperature pattern in a time lapse series. The result you obtain is a log of the temperature and vacuum data in each time lapse image. Observe sample changes during the heating or cooling process for example in the field of quality control.

  • Materials Science – Liquid Crystalline​

    Materials Science – Liquid Crystalline​

    Materials Science – Liquid Crystalline​A. Getsis and A. Mudring, Ruhr University, Bochum, DE​
    A. Getsis and A. Mudring, Ruhr University, Bochum, DE​

    Liquid-crystalline phase of [C14mim]Br at 100ºC in a THMS 600 Linkam heating stage, polarization contrast, objective: EC EPIPLAN 10x/0.20. Image: courtesy of​

     

    Materials Science – Liquid Crystalline​

  • Materials Science - Metals​

    Materials Science - Metals​

    Materials Science - Metals​

    AlNi3,5 anodized according to Barker Polarization contrast, objective: EC EPIPLAN NEOFLUAR 20x/0.50. Image: courtesy of ACCESS e.V. Aachen and Foundry Institute of RWTH Aachen University, DE​

    Materials Science - Metals​

  • Industrial Microscopy​

    Industrial Microscopy​

    Industrial Microscopy​

    Structure of the surface of a furniture wood, darkfield, objective: EC Epiplan APOCHROMAT 10x/0.30​

    Industrial Microscopy​

  • Materials Science - Magnetic Materials

    Materials Science – Magnetic materials​

    Materials Science - Magnetic Materials

    Kerr-effect of Nd2Fe14B magnetic domain.

    Materials Science - Magnetic Materials

  • Materials Science – Carbon Fibre​

    Materials Science – Carbon Fibre​

    Materials Science – Carbon Fibre​

    Fluorescence image of a carbon fiber cross section taken on an Axio Imager​

    Materials Science – Carbon Fibre​

  • Solar Cell​

    Solar Cell​

    Solar Cell​

    Surface of a mono-crystalline silicon solar cell, Axio Imager, EC Epiplan-APOCHROMAT 100x/0.95

    Solar Cell​

  • Geoscience
    Geoscience

    Complex multiphase mixture of sandstones by crossed polar light microscopy

    Geoscience​

Applications

Discover more on metallographic applications.

Downloads

    • ZEISS Axio Imager 2

      Your Open Microscope System for Automated Material Analysis

      Pages: 23
      File size: 9 MB
    • ZEISS Microscopy Solutions for Steel and Other Metals

      Multi-modal characterization and advanced analysis options for industry and research

      Pages: 11
      File size: 14 MB
    • Microscope and Measurement Systems for Quality Assurance and Quality Control

      Capture the essentials of your component. Quickly. Simply. Comprehensively.

      Pages: 41
      File size: 4 MB
    • Analysis and Quantification of Non-metallic Inclusions in Steel

      Shuttle & Find

      Pages: 6
      File size: 1 MB
    • Applications of Microscopy in Additive Manufacturing

      Utilizing ZEISS Light and Electron Microscope Systems

      Pages: 7
      File size: 2 MB
    • Light Microscopic Analysis of the Intrinsic Properties of Magnetically Hard Phases from the Domain Structure

      Pages: 7
      File size: 2 MB
    • Optical Analysis of Shape and Roughness of a Gear Wheel

      Pages: 6
      File size: 1 MB
    • Topography and Refractive Index Measurement

      of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscopy

      Pages: 6
      File size: 1 MB
    • Auto Focus equipment

      Instruction Manual (English)

      Pages: 38
      File size: 779 KB
    • Converter CAN/USB

      Supplement to Instruction Manual (English)

      Pages: 2
      File size: 110 KB
    • VisLED

      Instruction Manual (English, German)

      Pages: 20
      File size: 461 KB
    • ZEISS Duolink

      Instruction Manual (English)

      Pages: 38
      File size: 1 MB
    • ZEISS Light Manager

      Quick Guide (English)

      Pages: 4
      File size: 38 KB
    • Kính hiển vi ZEISS Axio Imager 2 (Vietnamese Version)

      Hệ thống kính hiển vi thiết kế mở dành cho Phân tích vật liệu tự động

      Pages: 23
      File size: 8 MB

Contact ZEISS Microscopy

Contact

/4
Next Step:
  • Step 1
  • Step 2
  • Step 3
Contact us
Required Information
Optional Information

If you want to have more information on data processing at ZEISS please refer to our data privacy notice.