Press Release

ZEISS enhances its field emission SEMs for highest demands in sub-nanometer imaging, analytics and sample flexibility

ZEISS presents three new models of field emission scanning electron microscopes and new ZEISS Gemini 3 column

23 November 2020 · 3 min read
  • Core Imaging Systems - Highres-Structure Imaging
Press Contact for ZEISS Microscopy Vybhav Sinha

Jena, Germany | 23 November 2020 | ZEISS Research Microscopy Solutions

ZEISS presents a new generation of its field emission scanning electron microscope (FESEM) family ZEISS GeminiSEM. The new models ZEISS GeminiSEM 360, 460 and 560 are tailored for sub-nanometer imaging and effortless analytics. Users benefit from innovations in the electron optics and a new chamber design offering better image quality, usability and flexibility. ZEISS GeminiSEM 560 now being introduced brings the ZEISS Gemini 3 column to the market for the first time.

The new ZEISS GeminiSEM family delivers more information from any sample, minimizes sample damage and prevents sample artifacts. All three models come with a completely new chamber design which allows researchers to bring in larger and more samples than before enabling core facilities to now serve many more analytical applications in a single instrument. The unique designs for the ZEISS Gemini electron optical column and a large, flexible new chamber cover all imaging and analytical needs. The larger chamber enables configurability and flexibility to adapt to upcoming research tasks and optimizes analytical workflows.

  • ZEISS GeminiSEM Family, field emission SEMs for highest demands in sub-nanometer imaging, analytics and sample flexibility.

    ZEISS GeminiSEM Family, field emission SEMs for highest demands in sub-nanometer imaging, analytics and sample flexibility.

New electron optical column and smart autopilot

ZEISS GeminiSEM 560 sets a new standard for surface imaging. Introducing the new ZEISS Gemini 3 electron optics with Nano-twin lens and its new electron optical engine Smart Autopilot, it is customized for ease-of-use when imaging the most sensitive samples at the highest resolutions. In the ZEISS GeminiSEM family, the model 560 delivers the highest resolution at all working conditions and pushes the limits of immersion and monochromation-free-surface imaging at landing energies below 1 kV.

  • Nanometer-scaled features on the fractured surface of a non-conductive mineral, montmorillonite, visualized at low landing energy, ZEISS GeminiSEM 560, Inlens SE image, 800 V, scale bar 200 nm.
    Nanometer-scaled features on the fractured surface of a non-conductive mineral, montmorillonite, visualized at low landing energy, ZEISS GeminiSEM 560, Inlens SE image, 800 V, scale bar 200 nm.

    Nanometer-scaled features on the fractured surface of a non-conductive mineral, montmorillonite, visualized at low landing energy, ZEISS GeminiSEM 560, Inlens SE image, 800 V, scale bar 200 nm.

    Nanometer-scaled features on the fractured surface of a non-conductive mineral, montmorillonite, visualized at low landing energy, ZEISS GeminiSEM 560, Inlens SE image, 800 V, scale bar 200 nm.

The new optical engine combined with new autofunctions and the autofocus significantly enhance the performance and efficiency of the system. In a core facility even novice users can achieve the best possible results without the support of the chief technician or facility manager.

More efficiency and ease-of-use in imaging and analytics

The system enables the effortless transition from standard settings to advanced settings. A new overview mode simplifies orientation on the sample. Users can easily navigate from low to high magnification without having to adjust the column alignment. The system enables the largest distortion-free field of view in its class. This allows imaging of large, challenging samples such as magnetic specimens in materials research. The improved autofunctions are currently the fastest in the world with the autofocus delivering a focused image in less than one second.

  • Magnetic, iron manganese nanoparticles where one cuboid particle has an edge length of approximately 25 nm, imaged at low acceleration voltage, ZEISS GeminiSEM 560, Inlens SE image, 1 kV, scale bar 60 nm.
    Magnetic, iron manganese nanoparticles where one cuboid particle has an edge length of approximately 25 nm, imaged at low acceleration voltage, ZEISS GeminiSEM 560, Inlens SE image, 1 kV, scale bar 60 nm.

    Magnetic, iron manganese nanoparticles where one cuboid particle has an edge length of approximately 25 nm, imaged at low acceleration voltage, ZEISS GeminiSEM 560, Inlens SE image, 1 kV, scale bar 60 nm.

    Magnetic, iron manganese nanoparticles where one cuboid particle has an edge length of approximately 25 nm, imaged at low acceleration voltage, ZEISS GeminiSEM 560, Inlens SE image, 1 kV, scale bar 60 nm.

„This product launch redefines high end FESEM imaging, advancing the evolution of the industry leading Gemini optics and puts the capability in the customers’ hands to enable scientific breakthroughs”, comments Dr. Michael Albiez, Head of ZEISS Research Microscopy Solutions.

Launch webinar: Sign in

To introduce the system there will be a webinar for free on December, 15 and the product can be virtually visited at the digital Materials Research Society Fall Meeting. Everybody can join the launch presentation via internet.

About ZEISS

ZEISS is an internationally leading technology enterprise operating in the fields of optics and optoelectronics. In the previous fiscal year, the ZEISS Group generated annual revenue totaling more than 6.4 billion euros in its four segments Semiconductor Manufacturing Technology, Industrial Quality & Research, Medical Technology and Consumer Markets (status: 30 September 2019).

For its customers, ZEISS develops, produces and distributes highly innovative solutions for industrial metrology and quality assurance, microscopy solutions for the life sciences and materials research, and medical technology solutions for diagnostics and treatment in ophthalmology and microsurgery. The name ZEISS is also synonymous with the world's leading lithography optics, which are used by the chip industry to manufacture semiconductor components. There is global demand for trendsetting ZEISS brand products such as eyeglass lenses, camera lenses and binoculars.

With a portfolio aligned with future growth areas like digitalization, healthcare and Smart Production and a strong brand, ZEISS is shaping the future of technology and constantly advancing the world of optics and related fields with its solutions. The company's significant, sustainable investments in research and development lay the foundation for the success and continued expansion of ZEISS' technology and market leadership.

With over 31,000 employees, ZEISS is active globally in almost 50 countries with around 60 sales and service companies, 30 production sites and 25 development sites. Founded in 1846 in Jena, the company is headquartered in Oberkochen, Germany. The Carl Zeiss Foundation, one of the largest foundations in Germany committed to the promotion of science, is the sole owner of the holding company, Carl Zeiss AG.

Further information at www.zeiss.com

  

ZEISS Research Microscopy Solutions

ZEISS Research Microscopy Solutions is the world's only one-stop manufacturer of light, electron, X-ray and ion microscope systems and offers solutions for correlative microscopy. The portfolio comprises of products and services for life sciences, materials and industrial research, as well as education and clinical practice. The unit is headquartered in Jena. Additional production and development sites are located in Oberkochen and Munich, as well as in Cambourne (UK) and Dublin (USA). ZEISS Research Microscopy Solutions is part of the Industrial Quality & Research segment.

Press photo download

  • ZEISS GeminiSEM Family

    Field emission SEMs for highest demands in sub-nanometer imaging, analytics and sample flexibility., ZEISS GeminiSEM Family, field emission SEMs for highest demands in sub-nanometer imaging, analytics and sample flexibility.

    File size: 657 KB
  • ZEISS GeminiSEM 560

    Nanometer-scaled features on the fractured surface of a non-conductive mineral, montmorillonite, visualized at low landing energy, ZEISS GeminiSEM 560, Inlens SE image, 800 V, scale bar 200 nm.

    File size: 987 KB
  • ZEISS GeminiSEM 560

    Magnetic, iron manganese nanoparticles where one cuboid particle has an edge length of approximately 25 nm, imaged at low acceleration voltage, ZEISS GeminiSEM 560, Inlens SE image, 1 kV, scale bar 60 nm., Magnetic, iron manganese nanoparticles where one cuboid particle has an edge length of approximately 25 nm, imaged at low acceleration voltage, ZEISS GeminiSEM 560, Inlens SE image, 1 kV, scale bar 50 nm.

    File size: 836 KB

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