
Unlocking the Power of Electron Microscopy
Smart Workflows. Better Results.- 00 years
- 00 months
- 00 days
- 00 hours
- 00 minutes
- 00 seconds
What You Find At The Booth
Get a close-up look at a selection of our systems for life science and materials science — in our focused, expert-led sessions designed to fit your workflow.
Technology That Transforms Microscopy
|
Join Us — Onsite or Online
|
|
---|---|---|
ZEISS Crossbeam Samplefab |
Achieve fully-automated and unattended TEM sample preparation in your semiconductor lab with ZEISS Crossbeam 550 Samplefab, a robust pre-configured high-end FIB-SEM. |
Test system at the booth |
ZEISS GeminiSEM |
ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. |
Test system at the booth |
X-ray Microscopy solutions |
Experience the power of ZEISS X-ray microscopes, the proven choice for researchers and scientists worldwide. XRM feature intuitive user interfaces, ensuring that every user can maximize their productivity and achieve exceptional results |
See workflow solutions at the booth |
ZEISS LSM Lightfield 4D |
Lightfield 4D is instant volumetric imaging at high speed. Acquire comprehensive 3D information with a single snap and say goodbye to any time delay within an imaged volume. For the first time, capture the fastest movements within whole organisms at up to 80 volumes per second – with all spatiotemporal information intact. |
Test system at the booth |
ZEISS Axio Imager Vario |
Analyze smallest MEMS sensors or an entire flat panel with ZEISS Axio Imager Vario. Its column design allows you to investigate extremely large specimens simultaneously offering high stability. Moreover, Axio Imager Vario is certified for use in clean rooms. |
Test the system at the booth |
Lunchtime Talks
September 1, 2025 | 12.34 - 13.45 PM |
Beyond Electron Microscopy – Workflows to and Beyond FESEM/FIB-SEM |
---|---|
September 2, 2025 | 12.45 - 13.45 PM |
Automation and AI for Advanced Electron Microscopy |
September 3, 2025 | 12.45 - 13.45 PM |
One snap, one volume: instant high-speed imaging with ZEISS Lightfield 4D |