Webinar

FEG-SEM as a Flexible and Smart Tool for R&D Nanolithography

JUN 19, 2020 · 42 watch
  • Materials Sciences
  • Manufacturing and Assembly
  • Industrial R&D
  • Scanning Electron Microscopy
Author

Pasqualantonio Pingue, Ph.D.

Chief Operating Officer (COO) at NEST Laboratory of Scuola Normale Superiore, Italy

Abstract

FEG-SEM as a Flexible and Smart Tool for R&D Nanolithography

Creation of nanostructures and nanodevices using a focused ion beam is widely used in materials research and electronics. It allows the creation of new functional materials or surfaces with superior optical, mechanical, electronic or magnetic properties. In this session we will explore these applications to highlight the future development and the constraints encountered in this field.


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