Webinar

Focused Ion Beam (FIB) and Focused Electron Beam Induced Deposition (FEBID)

For Advanced Nanocharacterization and Nanofabrication
JUN 19, 2020 · 33 watch
  • Materials Sciences
  • Manufacturing and Assembly
  • Industrial R&D
  • FIB-SEM Crossbeam
Author

Giancarlo Gazzadi Ph.D.

Senior Technologist at the Nanoscience Institute of CNR in Modena, Italy

Abstract

Focused Ion Beam (FIB) and Focused Electron Beam Induced Deposition (FEBID) - For Advanced Nanocharacterization and Nanofabrication

Creation of nanostructures and nanodevices using a focused ion beam is widely used in materials research and electronics. It allows the creation of new functional materials or surfaces with superior optical, mechanical, electronic or magnetic properties. In this session we will explore these applications to highlight the future development and the constraints encountered in this field.


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