Webinar
The LaserFIB - Introduction to a new Class of Instruments
Learn all about the technical details and capabilities of the LaserFIB
8 April 2020
· 20 min watch
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Author
Tobias Volkenandt
Apps Development Specialist
ZEISS Microscopy
ZEISS Microscopy
Abstract
The LaserFIB - Introduction to a new Class of Instruments – Learn all about the technical details and capabilities of the LaserFIB
FIB-SEMs are well established as sample preparation tools. However, when it comes to large-scale sample preparation FIB milling is simply too slow. With the LaserFIB we introduce a new class of instruments to overcome this limitation. A LaserFIB enables sample preparation with material removal rates up to 15 Mio µm³/s.
In this webinar you will learn all about the technology and capabilities of the LaserFIB and understand the site-specific preparation workflow in detail.
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/crossbeam-laserfib.png/_jcr_content/renditions/original.image_file.100.56.0,3,700,397.file/crossbeam-laserfib.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/crossbeam-laserfib.png/_jcr_content/renditions/original.image_file.360.203.0,3,700,397.file/crossbeam-laserfib.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/crossbeam-laserfib.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/crossbeam-laserfib.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/crossbeam-laserfib.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/crossbeam-laserfib.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/crossbeam-laserfib.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/crossbeam-laserfib.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/crossbeam-laserfib.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/crossbeam-laserfib.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/crossbeam-laserfib.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/crossbeam-laserfib.png"})
![Finalists of the ZEISS Microscopy Young Researcher Award | Germany]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original.image_file.100.56.file/young-researcher-award-2023-clean.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original.image_file.360.203.file/young-researcher-award-2023-clean.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original.image_file.768.432.file/young-researcher-award-2023-clean.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original.image_file.1024.576.file/young-researcher-award-2023-clean.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original./young-researcher-award-2023-clean.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original./young-researcher-award-2023-clean.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original./young-researcher-award-2023-clean.png"} "Finalists of the ZEISS Microscopy Young Researcher Award | Germany")
![NiMH Cylindrical Cell under the X-ray Microscope]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.100.56.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.360.203.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.768.432.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.1024.576.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.1280.720.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.1280.720.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.1280.720.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png"} "NiMH Cylindrical Cell under the X-ray Microscope")
![Paul Shearing, University of Oxford]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.100.56.0,0,1080,608.file/paul_shearing.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.360.203.0,0,1080,608.file/paul_shearing.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.768.432.0,0,1080,608.file/paul_shearing.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.1024.576.0,0,1080,608.file/paul_shearing.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.1080.608.0,0,1080,608.file/paul_shearing.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.1080.608.0,0,1080,608.file/paul_shearing.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.1080.608.0,0,1080,608.file/paul_shearing.png"} "Paul Shearing, University of Oxford")
![ZEISS Crossbeam - FIB-SEM for High Throughput 3D Analysis and Sample Preparation]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original./crossbeam-550-system.jpg"} "ZEISS Crossbeam")