ZEISS LSM 900 for Materials
Product

ZEISS LSM 900 for Materials

Versatile Confocal Microscope for Advanced Imaging and Surface Topography

ZEISS LSM 900, the confocal laser scanning microscope (CLSM) from ZEISS, is the one instrument you will need for materials analysis. Characterize 3D microstructures surfaces topography in your lab or multi-user facility. Combine all essential light microscopy contrasting techniques for materials with high precision topography. Save time on set-up as there is no need to change microscopes. Execute non-contact confocal imaging when evaluating surface roughness. LSM 900 is the ideal tool for a multi-user facility. Extend your upright light microscope, ZEISS Axio Imager.Z2m or your inverted light microscope ZEISS Axio Observer 7, with a confocal scanning module.

  • Combine light microscopical and confocal imaging
  • Investigate your sample efficiently
  • Expand your imaging range
Failure analysis on mobile phone, texture image, overlay, color-coded height map (from left to right)

Combine Light Microscopical and Confocal Imaging

LSM 900, your high-end confocal platform, is made for demanding materials applications, both in 2D and 3D.

  • Characterize topographic structures and evaluate surface roughness with non-contact confocal imaging​
  • Determine the thickness of coatings and thin films non-destructively​
  • Use a range of imaging techniques including polarization and fluorescence in optical contrast or in confocal mode​
  • Characterize metallographic specimens in reflected light or thin section of rock or polymer in transmitted light
Imaging Made Easy With Guided Workflows

Investigate Your Sample Efficiently

Reduce set-up times and speed up your time-to-result by performing analyses and imaging without having to change microscopes.

  • Optimize your processes with automated data acquisition at multiple positions on your sample​
  • Simply define a region of interest (ROI) on your overview image and acquire only the area you need​
  • You have the advantage of full flexibility in size and orientation of the ROI with a scanning field of 6144 x 6144 pixels​
  • Take full control of your data and their post-processing
LSM 900 Mat. Confocal Setup

Expand Your Imaging Range​

A confocal unit extends your widefield investigations capacity:

  • Upgrade your Axio Imager.Z2m or your Axio Observer 7 with LSM 900 and take advantage of its versatility in hardware, e.g. objectives, stages and illumination as well as software and interfaces​
  • Add ZEISS ZEN Intellesis, a machine learning-based solution for image segmentation and identify phases​
  • Or add ZEISS ZEN Connect to overlay and organize images from any source when performing multi-modal experiments​
  • Or perform smart data management with ZEISS ZEN Data Storage
Ultra-fine optical sections in the micrometer range
Ultra-fine optical sections in the micrometer range

The Confocal Principle

Image Your Entire Sample in 3D

Learn how LSM 900, your confocal laser scanning microscope works: It uses laser light in a confocal beam path to capture defined optical sections of your sample. The sections are combined in a three-dimensional image stack. Its aperture (usually called a pinhole) is arranged in such a way that out-of-focus information will be blocked and only in-focus information can be detected.

Caption: Ultra-fine optical sections in the micrometer range

The Confocal Principle
Schematic of confocal principle. In-focus information (yellow). Out-of-focus information (red and blue dotted lines).
Schematic of confocal principle. In-focus information (yellow). Out-of-focus information (red and blue dotted lines).

Schematic of confocal principle. In-focus information (yellow). Out-of-focus information (red and blue dotted lines).

Image Your Entire Sample in 3D

LSM 900 is a confocal laser scanning microscope that uses laser light in a confocal beam path to capture defined optical sections of your sample and combine them in a three-dimensional image stack. Its aperture (usually called a pinhole) is arranged in such a way that out-of-focus information will be blocked and only in-focus information can be detected.

  • An image is generated by scanning in x,y-direction. In-focus information appears bright while out-of-focus information is dark.
  • By changing the distance between sample and objective lens, the sample is optically sectioned and an image stack is generated.
  • By analyzing the intensity distribution of a single pixel through the image stack you can calculate the corresponding height. The height information over the whole field of view can then be combined to form a height map.

Software

Screengrab, software, ConfoMap GUI, focus on 3D view
 Screengrab, software, ConfoMap GUI, focus on 3D view

Inspect Surfaces in 3D with ConfoMap​

ConfoMap is ideal to visualize and inspect surface topography in 3D. Evaluate the quality and functional performance of surfaces in accordance with the latest metrology standards, e.g. ISO 25178. Include comprehensive geometric, functional and roughness studies. Create detailed surface analysis reports. Add optional modules for advanced surface texture analysis, contour analysis, grains and particle analysis, 3D Fourier analysis, analysis of surface evolution, and statistics.

Rely on C Epiplan-APOCHROMAT Objectives

Use the apochromatically- and flat-field-corrected C Epiplan-APOCHROMAT objective series for reflected light applications.

  • Benefit from imaging with enhanced contrast and high transmission in the visible spectral range.
  • Get optimum results in conventional widefield microscopy, differential interference contrast (DIC) and fluorescence.
  • C Epiplan-APOCHROMAT objectives are specially designed for confocal microscopy, achieving minimum aberrations at 405 nm over the full field of view. That produces accurate topography data with less distraction noise and artifacts, thus revealing more details of your surface.

See the effect of objectives for confocal microscopy:

Artifacts at edges and noise on plane surface are not shown in this image.
Sample imaged with C Epiplan-APOCHROMAT objective, 3D-view with extracted profile line
Artifacts at edges and noise on plane surface are clearly visible in this image.
Sample imaged with an objective without correction for 405 nm
Identify color pigments with different excitation wavelengths.
Identify color pigments with different excitation wavelengths.

Identify color pigments with different excitation wavelengths. Image width 1.47 mm.

Identify color pigments with different excitation wavelengths. Image width 1.47 mm.

Laser Configuration

Choose a Laser Tailored for Your Applications​

Extend the application range of your confocal microscope and select between two options:

  • Imaging with high lateral resolution up to 120 nm is possible with the single-channel system with an ultraviolet laser module (405 nm wavelength), which corresponds to a laser class 2 product
  • When performing applications like imaging cell growth on biomaterials, configure the LSM 900 with the four laser wavelengths – laser module URGB (with 405, 488, 561, 640 nm). This multi-excitation wavelength allows for detecting the distribution of fluorescent components

Applications

  • Laser polished surface of additive manufactured alloy.​
  • Varying sizes of austenite and ferrite grains in the vicinity of a weld in duplex stainless steel.
  • Multi-layered system, two-layers of a compound polymer.​
  • Ceramic Surface​. Color-coded height map.​
  • Volumetric measurement of a hole. 3D view of color-coded height map.
  • Investigation of the porosity of sandstone. 3D representation of fluorescent dye, non-contact surface measurement, 4x4 tiles image.
  • Color-coded 3D view of a diffractive optical element in a document, typically used for security features.
  • Failure analysis on mobile phone, texture image, overlay, color-coded height map (from left to right).​
  • Laser polished surface of additive manufactured alloy.​

    Metals & Alloys

    Laser polished surface of additive manufactured alloy.​

    Metals & Alloys​. Laser polished surface of additive manufactured alloy.​

    Metals & Alloys​. Laser polished surface of additive manufactured alloy.​

  • Varying sizes of austenite and ferrite grains in the vicinity of a weld in duplex stainless steel.

    Steel

    Varying sizes of austenite and ferrite grains in the vicinity of a weld in duplex stainless steel.

    Steel. Varying sizes of austenite and ferrite grains in the vicinity of a weld in duplex stainless steel. Image width 445 µm.

    Steel. Varying sizes of austenite and ferrite grains in the vicinity of a weld in duplex stainless steel. Image width 445 µm.

  • Multi-layered system, two-layers of a compound polymer.​

    Polymers & Compounds

    Multi-layered system, two-layers of a compound polymer.​

    Polymers & Compounds​. Multi-layered system, two-layers of a compound polymer.​

    Polymers & Compounds​. Multi-layered system, two-layers of a compound polymer.​

  • Ceramic Surface​. Color-coded height map.​

    Ceramic Surface

    Ceramic Surface​. Color-coded height map.​

    Ceramic Surface​. Color-coded height map.​

    Ceramic Surface​. Color-coded height map.​

  • Volumetric measurement of a hole. 3D view of color-coded height map.

    Metal Testing for Material Wear​

    Volumetric measurement of a hole. 3D view of color-coded height map.

    Metal Testing for Material Wear​. Volumetric measurement of a hole. 3D view of color-coded height map. Parameters such as volume, surface, depth, perimeter and complexity can be derived in a report.

    Metal Testing for Material Wear​. Volumetric measurement of a hole. 3D view of color-coded height map. Parameters such as volume, surface, depth, perimeter and complexity can be derived in a report.

  • Investigation of the porosity of sandstone. 3D representation of fluorescent dye, non-contact surface measurement, 4x4 tiles image.

    Sandstone Porosity

    Investigation of the porosity of sandstone. 3D representation of fluorescent dye, non-contact surface measurement, 4x4 tiles image.

    Sandstone Porosity​. Investigation of the porosity of sandstone. 3D representation of fluorescent dye, non-contact surface measurement, 4x4 tiles image.

    Sandstone Porosity​. Investigation of the porosity of sandstone. 3D representation of fluorescent dye, non-contact surface measurement, 4x4 tiles image.

  • Color-coded 3D view of a diffractive optical element in a document, typically used for security features.

    Documents

    Color-coded 3D view of a diffractive optical element in a document, typically used for security features.

    Documents​. Color-coded 3D view of a diffractive optical element in a document, typically used for security features.

    Documents​. Color-coded 3D view of a diffractive optical element in a document, typically used for security features.

  • Failure analysis on mobile phone, texture image, overlay, color-coded height map (from left to right).​

    Failure Analysis

    Failure analysis on mobile phone, texture image, overlay, color-coded height map (from left to right).​

    Failure Analysis. Failure analysis on mobile phone, texture image, overlay, color-coded height map (from left to right).​ Image width 1.1 mm.

    Failure Analysis. Failure analysis on mobile phone, texture image, overlay, color-coded height map (from left to right).​ Image width 1.1 mm.

Downloads

    • ZEISS LSM 900 for Materials

      Your Versatile Confocal Microscope for Advanced Imaging and Surface Topography

      Pages: 28
      File size: 10 MB
    • ZEISS Microscopy Solutions for Steel and Other Metals

      Multi-modal characterization and advanced analysis options for industry and research

      Pages: 11
      File size: 14 MB
    • Microscopic Methods in Metallography

      Using ZEISS Axio Observer and ZEISS Axio Imager

      Pages: 8
      File size: 5 MB
    • Light Microscopic Analysis of the Intrinsic Properties of Magnetically Hard Phases from the Domain Structure

      Pages: 7
      File size: 2 MB
    • Metallic Grain Structures and Their Microscopic Analysis

      Pages: 11
      File size: 4 MB
    • Microscopy in Metal Failure Investigations

      Determine the root cause of metal failure and learn about microscopy tool set for any metal failure investigation

      Pages: 8
      File size: 4 MB
    • Beam Path of ZEISS LSM 900

      Pages: 1
      File size: 912 KB
    • Poster: Light Microscopy Contrast Methods for Materials Research

      Brightfield, Darkfield, Fluorescence, Polarization, Differential Interference Contrast (DIC), Circular Differential Interference Contrast (C-DIC)

      Pages: 1
      File size: 1 MB
    • ZEISS LSM 900

      Installation Requirements (English)

      Pages: 22
      File size: 2 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual (Swedish)

      Pages: 48
      File size: 2 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual (Potuguese)

      Pages: 48
      File size: 2 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual (Czech)

      Pages: 48
      File size: 2 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual (Spanish)

      Pages: 48
      File size: 1 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual

      Pages: 48
      File size: 2 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual (Dutch)

      Pages: 48
      File size: 1 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual (Italian)

      Pages: 48
      File size: 1 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual (English)

      Pages: 50
      File size: 2 MB
    • ZEISS LSM 900 (Laser class 2)

      Instruction Manual

      Pages: 50
      File size: 1 MB
    • ZEISS LSM 900 (Laser class 3B)

      Instruction Manual (English)

      Pages: 48
      File size: 4 MB
    • ZEISS LSM 900 do zastosowań materiałowych (Polish Version)

      Wszechstronny mikroskop konfokalny do zaawansowanego obrazowania i analizy topografii powierzchni

      Pages: 28
      File size: 5 MB
    • ZEISS LSM 900 para materiales (Spanish Version)

      Versátil microscopio confocal para captura de imágenes avanzada y topografía de superficies

      Pages: 28
      File size: 5 MB
    • ZEISS LSM 900 per l'analisi di materiali (Italian Version)

      Il microscopio confocale versatile per prestazioni avanzate di imaging e topografia superficiale

      Pages: 28
      File size: 10 MB

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