ZEISS at Microscopy & Microanalysis (M&M) 2024

Booth #1310

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We invite you to visit our booth #1310 where we will be showcasing our cutting-edge technology and innovations. Our team of experts will be available to provide you with an in-depth look at our latest advancements. You will also have the opportunity to interact with our various experiences including our interactive wall, VR, virtual workflow demos live from our customer center and a new way of accessing our line of products.

Connect with ZEISS for In-Booth Educational Presentations

Each day has a chance to connect, be sure to add it into your schedule.

  • Abstract

    Correlative microscopy is a workflow that utilizes multiple techniques to characterize the same specimen location at different length scales, resolutions and for different attributes of a material (microstructure, chemistry, bonding). At the nexus of this characterization is the need for sample preparation, which, in recent years, has been the domain of focused ion beam microscopy (FIB), which bridges many of these length scales and acts as an analysis tool in its own right, when coupled with scanning electron microscopy.

    The incorporation of a femtosecond machinig laser into the FIB, a technique known as LaserFIB, can be utilized to provide solutions to a variety of sample-holding and targeting challenges, such as those arising from a correlative microscopy approach. The LaserFIB increases local milling rates to bridge macro to micro length scales.

    In this talk, we will introduce laser FIB, its advantages and challenges, and present several case studies for correlative microscopy that deploys LaserFIB to solve materials challenges. These include mineralized biological materials, co-location of fatigue crack nucleation in martenstic stainless steels, preparation of site-specific micromechanical samples, and preparation of customized sample preparation holders to enable correlative workflows, linking other techniques such as transmission electron microscopy, atom-probe tomography, 3D-FIB, and X-ray microscopy.

    Nabil Bassim, PhD

    Nabil Bassim is a Professor in the Department of Materials Science and Engineering at McMaster University and the Scientific Director of the Canadian Centre for Electron Microscopy (CCEM – ccem.mcmaster.ca).

    His research focuses on the development of novel electron microscopy, ion microscopy, and lithography techniques, including understanding the role of damage and doping in the manufacturing of novel nanostructured materials. He also serves as the Scientific Director of the CCEM, a CFI-funded Major Science Initiatives National User Facility that is home to the most advanced, cutting edge analytical characterization tools in Canada. Besides studying ion-sample interactions, beam scanning strategies, machine learning-based optimization strategies, and material deposition for microscale additive processes, he also applies these techniques to a diverse set of materials, ranging from structural materials such as cement, concrete, and steel to nanomaterials and two-dimensional materials. He is the author of two major review articles on focused ion beam (FIB) and is the co-founder and co-organizer of the FIB-SEM User Meeting (www.fibsem.net), which is the largest FIB conference in North America. He also serves as the Faculty lead for McMaster Engineering’s Aerospace and Defense Initiative.

  • Abstract

    Recent advances in spatial resolution and measurement sensitivity for high-resolution digital image correlation (HR-DIC) enable precise measurement of nanometer scale deformation events in metals. However, the time-consuming nature of scanning electron image acquisition limits HR-DIC's widespread use in material characterization. By applying novel multi-beam SEM technology, we enhance HR-DIC for high throughput applications, imaging mm2 to cm2 at high resolution nearly a hundred times faster than typical methods. These images can be processed with discontinuity-tolerant HR-DIC approaches to analyze plastic deformation processes associated with the microstructure of metallic materials. Over 210,000 nanoscale deformation events were investigated, revealing statistically and rapidly how microstructure controls deformation in a metallic material.

    Jean-Charles Stinville, PhD

    Dr. Jean-Charles Stinville holds a Ph.D. in Solid Mechanics, Materials Science, and Mechanical Engineering and an aerospace engineering degree from French Grande Ecoles. In 2012, he joined the Materials Department at the University of California Santa Barbara and became a Research Specialist in 2015. As a research specialist, he has led efforts around the experimental development of in-situ characterization techniques for metallic materials' deformation identification. He holds appointments in the Materials Science and Engineering Department and the Materials Research Laboratory as an assistant professor at the University of Illinois at Urbana-Champaign. His group designs sustainable and high-performance alloys for applications in extreme environments. In addition, they develop advanced experimental and numerical tools to tailor materials at the nano- to micrometer scales to improve their performances.

  • Abstract

    Understanding structure-property relationships is at the core of materials research. Today’s structural materials possess remarkable properties which are achieved through meticulously tailored microstructure, which can range from a relatively homogeneous structure to more complex, intricately linked multiscale hierarchical microstructures. Correspondingly, new and enhanced capabilities to better characterize the microstructure have a direct impact on how well these materials can be designed and utilized.

    As many of these materials structures are inherently 3D in nature, this presentation will delve into tremendous recent developments in 3D X-ray microscopy, with an emphasis on advancing engineering materials applications. The presentation will take a holistic look at challenges and opportunities across the 3D X-ray workflow including instrument operation, throughput, and ultimate performance capabilities. Innovations transforming the user experience, improved sub-micron optics, novel analytical modalities, and deep-learning enhanced reconstruction will be shared and presented by means of multiple application examples.

    Kaushik  Yanamandra

    Dr. Kaushik Yanamandra is an Applications Development Engineer at Zeiss Microscopy. He earned his Ph.D. in Mechanical Engineering from New York University and later worked as a Postdoctoral Research Associate in the Materials Science Department at Purdue University. His expertise lies in the materials characterization of metals and composite materials.
    Kaushik’s research has focused on developing lightweight advanced materials for dynamic loading conditions. He has extensively utilized microscopy techniques, such as Scanning Electron Microscopy and X-ray Microscopy, to investigate the mechanical behavior of materials through their microstructure. Additionally, he has developed machine learning algorithms to enhance the speed and efficiency of materials characterization. His work also includes implementing machine learning models for defect detection in 3D-printed products, addressing the security challenges posed by additively manufactured materials.


  • Abstract

    Electron channelling contrast imaging (ECCI) is an SEM based technique for observation of extended crystal lattice defects like dislocations and stacking faults. It exploits the dependence of the backscatter electron intensity on crystal orientation and atomic order. Like in transmission electron microscopy, lattice defects, i.e. dislocations, stacking faults, and small precipitates but also elastic strain fields are visible when the crystal of interest is illuminated in Bragg condition for one set of lattice planes. These conditions are determined using a dedicated software which uses the crystal orientation measured by electron backscatter diffraction (EBSD). By tilting the sample to these conditions controlled ECCI is obtained.
    The technique is used very similar to transmission electron microscopy (TEM), however with the serious advantage that a bulk sample is observed and not a thin foil. This enables observation of much larger samples, potentially resulting in much higher statistical significance of the observations. At the same time it simplifies sample preparation and facilitates in-situ experiments like deformation, heating, or gas reaction observations.
    Using cECCI dedicated observations of the evolution of lattice defects during hydrogen embrittlement of steels have been made. Also the technique was used to observe the precipitation process at dislocations during aging of high strength aluminium alloys.

    Stefan Zaefferer, PhD

    Stefan Zaefferer studied physical metallurgy and metal physics at the Technical University Clausthal-Zellerfeld, Germany, in the famous texture lab headed by Prof. H.J. Bunge. He also received his PhD from the same place for a work on transmission electron microscopy on Ti-alloys. He then spend three years as a researcher at the University Paris XII in Paris, France, and two years at Kyoto University, Japan. Since 2000 he leads the group “Microscopy and Diffraction” at the Max-Planck-Institute for Iron Research in Düsseldorf, Germany, and is lecturer for materials characterization at RWTH Aachen University. He also teaches regularly at Vienna University. At all his research positions Dr. Zaefferer was involved with the development and application of techniques for individual orientation determination and lattice defect characterization, first by TEM techniques and then, most prominently, by SEM techniques. Besides development of diffraction techniques his research interests are the mechanisms of microstructure formation in metals and other materials, including deformation, recrystallization and phase transformation. Stefan Zaefferer is author or co-author of about 150 journal papers. He is co-author together with Olaf Engler and Valerie Randle of the 3rd edition of the book “Introduction to Texture Analysis” published in 2024.

  • Abstract

    Mouse models have long been a crucial tool for studying human disease, However, traditional methods of studying mouse embryos and phenotypes have been limited in their resolution and scope. The use of iodine contrast microCT has revolutionized our understanding of early development and embryonic abnormalities in mouse models. MicroCT imaging allows for non-destructive, 3D visualization of tissues and organs at high resolution, enabling researchers to study embryonic development and abnormalities with unprecedented detail. As part of The International Mouse Phenotyping Consortium (IMPC), we have utilized iodine-contrast microCT to analyze mouse embryos and neonates from embryonic day 8.5 to postnatal day 3, while demonstrate that early-stage embryos can also be imaged without disturbance of extra embryonic tissues. This method allows for comprehensive analysis of embryo development, providing valuable insights into embryonic lethality in knockout mouse lines. Additionally, these techniques are cost-effective, easy to learn, and time-efficient, making them ideal for high-throughput analysis.

    Chih-Wei Logan Hsu, PhD

    Dr. Chih-Wei Logan Hsu is an Assistant Professor in the Department of Integrative Physiology and the Academic Director of the Optical Imaging and Vital Microscopy Core at Baylor College of Medicine. With 18 years of experience in biomedical research, Dr. Hsu focuses on advancing high-throughput 3D imaging techniques to address biomedical questions related to mouse embryo development, cardiovascular science, and human diseases. Since 2014, Dr. Hsu has been providing experimental consultation, training, and instruction in tissue clearing, light-sheet microscopy, and X-ray micro-CT imaging to researchers at all levels across the Texas Medical Center.

    Dr. Hsu is actively transforming newly developed sample preparation strategies and imaging techniques, such as contrast-enhanced micro-CT for soft tissue imaging and tissue clearing with organ whole-mount light-sheet imaging, into core training services. Over the past ten years, Dr. Hsu has supervised the NIH-funded Knockout Mouse Project (KOMP2) Embryonic Lethal Micro-CT Phenotyping and Adult SD-OCT Eye Morphology Pipelines at Baylor College of Medicine, as part of the International Mouse Phenotyping Consortium (IMPC). He has streamlined the use of iodine-contrast micro-CT for 3D morphological and anatomical analysis of mouse embryo and neonate development, phenotyping over 4,500 embryos across 320 single-gene knockout lethal or sub-viable mouse lines. This work has contributed to six IMPC consortium publications and five collaborative manuscripts. For the Adult Eye Morphology Pipeline, Dr. Hsu's team has phenotyped an average of 1,500 mice per year across 670+ mouse lines using SD-OCT, identifying genes required for eye development.Additionally, Dr. Hsu collaborates with and supports the Center of Precision Medicine Models (CPMM) for mouse embryo micro-CT phenotyping and the Somatic Cell Genome Editing Consortium (SCGE) in developing tissue clearing and whole-mount imaging protocols to quantify the frequency of CRISPR/Cas9 genome editing in targeted tissues and detect rare off-target editing events in other tissues.

  • Abstract

    Volume electron microscopy techniques have revolutionized the mapping of brain connectivity. These techniques capture the complexity of brain structure in unbiased fashion, while generating very large data sets that must be analyzed and interpreted. These experimental steps constitute a workflow that must be automated as much as possible, then proofread for accuracy. We describe here our techniques and tools to accomplish these goals, applied to a neuron group called the cochlear nucleus. The cochlear nucleus is the front-end processor neural network in the CNS for the mammalian auditory system. Our procedures are designed to output neurons and connections in a format amenable to neuron classification and discovery, and to in silico compartmental modeling as the final step for understanding the functional attributes of neural circuit architectures.

    George A. Spirou, PhD

    Dr. Spirou studied physics and philosophy as an undergraduate student, received his doctoral degree in Neuroscience/ Neurophysiology from the University of Florida, and completed fellowship training in Biomedical Engineering at Johns Hopkins University. He began his tenure-track career at West Virginia University, where he was Director of Research, Otolaryngology. He was then appointed inaugural Director of the Center for Neuroscience, a campus-wide structure to integrate all basic and translational neuroscience research, and was selected to be the John W. and Jeannnette S. Straton Chair of Neuroscience. He later moved to the University of South Florida, joining the newly formed Department of Medical Engineering. Dr. Spirou’s research is funded by the NIH, and is directed at two topics: early brain development and mapping neural circuits. Both research areas utilize modern approaches to large-scale, high-resolution imaging of brain structure and neural dynamics. Dr. Spirou has maintained an interest in 3D visualization of 3D and 4D structures, and is co-founder of a startup company, syGlass, Inc., which makes software for visualization, analysis and communication of big data using virtual reality.

    Steven Hernandez

    Product Applications and Sales Specialist, Life Science Electron and X-ray Microscopy, North America

    Steven began his career at Zeiss in February 2023. His interest in electron microscopy led him to various exciting roles, including the lead SEM microscopist in an academic core facility, in process engineering with photomask repair at Intel’s D1B fab in Hillsboro, and as a senior failure analysis engineer of medical devices with Medtronic in Tempe

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Join our ZEISS Technical Presentations

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  • Presenter: Nathan Johnson, PhD
    July 29, 2:00 PM
    Room 3

  • Format: Poster
    Location: Exhibit Hall

  • Presenter: Kaushik Yanamandra, PhD
    July 29, 2:45 PM
    Room 19

  • Presenter: Hrishikesh Bale, PhD
    July 29, 3:00 – 5:00 PM
    Poster Session


  • Presenter: Hrishikesh Bale, PhD
    July 29, 3:00 – 5:00 PM
    Poster Session

  • Presenter: Prof. Rich Johnston (Swansea University)
    July 30, 3:00 – 5:00 PM
    Poster Session

  • Presenter: Martina Heller, MS
    July 30, 3:00 – 5:00 PM
    Poster Session

  • Presenter: Ria Mitchell, PhD
    July 31, 9:15 AM
    Room 21

  • Presenter: Ria Mitchell, PhD
    July 31, 1:30 PM
    Room 7

  • Presenter: Yulia Trenikhina, PhD
    July 31, 1:45 PM
    Room 3


  • Presenter: Steve Kelly, PhD
    July 31, 2:30 PM
    Room 3


  • Presenter: Ria Mitchell, PhD
    July 31, 2:45 PM
    Room 3


  • Presenter: Sreenivas Bhattiprolu, PhD
    July 31, 3:00 PM – 5:00 PM
    Poster Session


  • Presenter: Heiko Stegmann, PhD
    July 31, 3:00 PM – 5:00 PM
    Poster Session