ZEISS Xradia Context microCT for materials research
High Resolution 3D Imaging for Demanding Materials R&D Applications
ZEISS Xradia Context is a high resolution microCT for demanding 3D X-ray tomography applications. Built with a priority on spatial resolution and image quality, ZEISS Xradia Context is an ideal instrument for demanding research environments. Moreover, the flexibility regarding sample sizes, densities, and dimensions as well as variable source and detector positions empower you to address diverse research applications, typical of a shared instrument facility or central R&D laboratory.
High Resolution in 3D – Interrogate a 3D world with microCT that is truly micron scale
4D and Correlative Imaging – Perform in situ thermo-mechanical loading or multi-instrument workflows
Optimized for Quantification – Reliable data analysis starts with excellent high-contrast images
2D virtual cross section of a porous ceramic
3D rendering with labeling of local thickness of cell walls
Distribution of 3D shape of pores
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