SEEING THE INVISIBLE Identifying buried particles using a correlated 3D X-ray and LaserFIB workflow

Analyzing Sparse and Small Buried Particles

Hitting defects accurately

How can you accurately identify and analyze micron-sized defects buried within millimeter volumes of material?

Discover a game-changing correlative workflow combining submicron-resolution 3D X-ray microscopy and FIB-SEM with an integrated femtosecond laser (LaserFIB) for streamlined, precise analysis and results available the same day.

Download this case study to learn how we characterized two isolated particles buried within a small iron plate and understand how you can apply this workflow to a variety of applications from life science to semiconductors.

Explore Related Applications

  • Targeted Sample Preparation and Analysis of Advanced Packaging using Correlated X-ray Microscopy and Laser FIB

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  • Rapid Sample Preparation for EBSD-analysis

    Enabled by the LaserFIB

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  • Ceramics Pre-preparation for FIB-investigation

    Using ZEISS Crossbeam laser

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  • Combined light-microscope

    FIB/SEM failure analysis on automotive body parts

    File size: 5 MB
  • Resolution of a 3D X-ray Microscope

    Defining Meaningful Resolution Parameters

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