SEEING THE INVISIBLE Identifying buried particles using a correlated 3D X-ray and LaserFIB workflow
Analyzing Sparse and Small Buried Particles
Hitting defects accurately
How can you accurately identify and analyze micron-sized defects buried within millimeter volumes of material?
Discover a game-changing correlative workflow combining submicron-resolution 3D X-ray microscopy and FIB-SEM with an integrated femtosecond laser (LaserFIB) for streamlined, precise analysis and results available the same day.
Download this case study to learn how we characterized two isolated particles buried within a small iron plate and understand how you can apply this workflow to a variety of applications from life science to semiconductors.